Agilent Measurement Journal - Issue 3 - 2007 - (Page 13) Traditional optical and electron microscopy techniques are widely used in nanotechnology research. Electron microscopes, used in both scanning and transmission configurations, make it possible to see small details on large surfaces. The scanning electron microscrope (SEM) uses a focused electron beam to see areas as small as 1 nm on the surface of a sample (Figure 3). As the beam is scanned (rastered) across the surface, many types of signals (e.g., secondary electrons, backscattered electrons or Auger electrons) are collected and used to generate an image. Analyzing chemical composition Chemists were among the earliest nanotechnology researchers, building molecules at the nanoscale. Gas and liquid chromatography are the most popular tools for the separation of complex mixtures of molecules by their chemistry. In liquid chromatography, the chemical mixtures of interest are transported by a liquid solvent through a column packed with solid particles (stationary phase), causing the molecules to progress through the column at different rates based on their chemical affinity to the stationary phase. In gas chromatography, the chemical mixture is similarly transported in gas phase by a carrier gas through a column treated to have variable affinity for the constituents of the mixture (Figure 5). Scanning electron microscope Electrons Detector Sample injector Flow controller Material must have a conductive surface Figure 3. An SEM streams electrons at a conductive surface and creates an image based on the reflected information. Waste Another popular imaging tool is the transmission electron microscope (TEM). These expensive machines project high-energy electrons through the sample, making it possible to image at very high resolution because electron wavelengths are much smaller than 1 nm (Figure 4). For the TEM to work properly — and provide atomic resolution — the sample material must be reduced in thickness to a few hundred nanometers. Carrier gas Column Column oven Detector Figure 5. A gas chromatograph ionizes chemical compounds and detects individual molecules of the constituent materials. Tunneling electron microscope Electrons Material must be in a thin slice An MS can measure the mass-to-charge ratio of individual molecules (Figure 6). It is quite often used in conjunction with a gas chromatograph (GC/MS) or liquid chromatograph (LC/MS), either of which can separate a complex mixture for subsequent quantitative identification by the MS. As an example, Yonsei University in Korea uses an LC/MS to examine byproducts from the creation of core-shell nanoparticles, which have a core of one element surrounded by a shell of another element.1 Detector Figure 4. A TEM sends high-powered electrons through the sample to create a 3D view. Agilent Measurement Journal 13
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 3 - 2007 Applying Ingenuity to the Measurement of Emerging Technologies Contents Emerging Innovations Department Delivering Bigger Benefits by Optimizing Customer Workflows Measuring Material Properties at the Nanoscale Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications WiMAX™: Plotting a New Path to Global Mobility Addressing the Triple Complexity of Triple-Play Networks What Next for Mobile Telephony? Exploring the Inner Workings of Tire-Pressure Monitoring Systems Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe Making Accurate Settling-Time Measurements Using a Vector Network Analyzer Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants Measuring Stream Dynamics with Fiber Optics survey Agilent Measurement Journal - Issue 3 - 2007 Agilent Measurement Journal - Issue 3 - 2007 - (Page 1) Agilent Measurement Journal - Issue 3 - 2007 - Applying Ingenuity to the Measurement of Emerging Technologies (Page 2) Agilent Measurement Journal - Issue 3 - 2007 - Applying Ingenuity to the Measurement of Emerging Technologies (Page 3) Agilent Measurement Journal - Issue 3 - 2007 - Contents (Page 4) Agilent Measurement Journal - Issue 3 - 2007 - Contents (Page 5) Agilent Measurement Journal - Issue 3 - 2007 - Emerging Innovations Department (Page 6) Agilent Measurement Journal - Issue 3 - 2007 - Emerging Innovations Department (Page 7) Agilent Measurement Journal - Issue 3 - 2007 - Delivering Bigger Benefits by Optimizing Customer Workflows (Page 8) Agilent Measurement Journal - Issue 3 - 2007 - Delivering Bigger Benefits by Optimizing Customer Workflows (Page 9) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 10) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 11) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 12) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 13) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 14) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 15) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 16) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 17) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 18) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 19) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 20) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 21) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 22) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 23) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 24) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 25) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 26) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 27) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 28) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 29) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 30) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 31) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 32) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 33) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 34) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 35) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 36) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 37) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 38) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 39) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 40) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 41) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 42) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 43) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 44) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 45) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 46) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 47) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 48) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 49) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 50) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 51) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 52) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 53) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 54) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 55) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 56) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 57) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 58) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 59) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 60) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 61) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 62) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 63) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 64) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 65) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 66) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 67) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 68) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 69) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 70) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 71) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 72) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 73) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 74) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 75) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 76) Agilent Measurement Journal - Issue 3 - 2007 - survey (Page survey)
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