Agilent Measurement Journal - Issue 3 - 2007 - (Page 15)

Frequency (Hz) Energy (eV) 105 104 103 102 101 100 10-1 10-2 10-3 10-4 10-5 10-6 1019 1018 1017 1016 1015 1014 1013 1012 1011 1010 Gamma rays Hard X-ray X-rays Soft X-ray Wavelength 0.1 A 1A 0.1 nm 1 nm 10 nm Ultraviolet Visible Near IR Infrared 100 nm 1000 nm 1 µm 10 µm 100 µm 1000 µm 1 mm 1 cm 10 cm X-ray spectroscopy X-ray crystallography UV-Vis spectroscopy NIR spectroscopy Raman spectroscpy IR/FTIR spectroscopy Terahertz spectroscopy Absorption — examines the atoms present based on absorption levels • Infrared (IR light) • NMR (radio waves) Nuclear magnetic resonance Source Spectroscopy Emission — examines photons released as the state of the material is changed • Luminescence/fluorescence • Thermal (infrared) Photons Scattering — examines the wavelengths of light scattered at different angles • Raman spectroscopy • X-ray crystallography Thermal IR Far IR Microwave 109 1m 108 TV, Radio 10 m Figure 8. Spectroscopy uses light energy from across the spectrum to reveal surface details and material structures. Mapping surfaces and structures Spectroscopy instruments are important in nanotechnology because they provide a nondestructive way to look at the chemistry and physics of materials. These measurement tools illuminate the sample with visible, ultraviolet, infrared and X-ray waveforms and measure the resulting waves that reﬂect from or are absorbed by the sample. The chart in Figure 8 maps the various types of spectroscopy tools versus the light spectrum. Characterizing electrical properties and behaviors Electronic measurements serve an important role in nanotechnology. For nanoscale devices used in electronic applications, measurements can characterize the efﬁciency of nanoscale electronics. For non-electronic applications, electronic measurements serve as surrogate measurements for other characteristics. For example, the twist (chirality) of a carbon nanotube can be determined by its current/voltage (IV) curve. If the nanotube is not twisted, it acts as a superconductor with an IV curve that is essentially a straight line (right side of Figure 9). However, if the carbon nanotube is twisted, it acts as a semiconductor with an IV curve much like that of a transistor (left side of Figure 9). Note: The graphs are from measurements of a carbon nanotube ﬁeld effect transistor (CNT FET) performed with an Agilent semiconductor analyzer.4 Agilent Measurement Journal 15

Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 3 - 2007

Applying Ingenuity to the Measurement of Emerging Technologies Contents Emerging Innovations Department Delivering Bigger Benefits by Optimizing Customer Workflows Measuring Material Properties at the Nanoscale Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications WiMAX™: Plotting a New Path to Global Mobility Addressing the Triple Complexity of Triple-Play Networks What Next for Mobile Telephony? Exploring the Inner Workings of Tire-Pressure Monitoring Systems Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe Making Accurate Settling-Time Measurements Using a Vector Network Analyzer Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants Measuring Stream Dynamics with Fiber Optics survey

Agilent Measurement Journal - Issue 3 - 2007

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