Agilent Measurement Journal - Issue 3 - 2007 - (Page 16)

3 3 VG = −5 V VG = 5 V 2 VG = −5 V Drain current (µA) 2 Drain current (µA) 1 1 0 VG = 5 V -1 0 -1 -2 -2 -3 -1.0 -0.5 0.0 Drain voltage (V) 0.5 1.0 -3 -1.0 -0.5 0.0 Drain voltage (V) 0.5 1.0 Figure 9. The IV characteristics of CNT FET vary with the amount of twist applied to a nanotube. Dielectric measurements are important surrogate measurements on materials. Instruments such as an RF impedance/material analyzer can make permittivity and permeability measurements on nanotechnology materials. These measurements can be used to check bulk materials for changes caused by the addition of nanoscale structures. One example comes from Sandia National Labs, which uses an LCR meter to measure the dielectric values of doped ceramics at various temperatures.5 Network analyzers are designed to make S-parameter and reﬂection-coefﬁcient measurements and can be applied to various types of materials engineered with nanoscale structures. Such measurements help determine the effectiveness of a material in electronic applications. In one example, China’s Nanjing University is using a microwave network analyzer to measure the reﬂection coefﬁcients of piezoelectric superlattice.6 Various other instruments such as multimeters, nanovoltmeters, oscilloscopes and microammeters are used to analyze DC and AC currents and voltages. General-purpose instruments are also used as stimulus devices in nanotechnology measurements. One example is power supplies, which are commonly used because they supply very precise low-level voltages or currents to low-power nanoscale devices such as nanotubes and nanowires. Function generators are popular because they supply sine, square, pulse or arbitrary (custom) waveforms. High-precision pulses created with a pulse generator are another popular stimulus. For example, the University of Groningen in the Netherlands uses a pulse generator to drive a ferroelectric polymer transistor and a semiconductor analyzer to measure the resulting IV and CV curves.7 16 Agilent Measurement Journal

Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 3 - 2007

Applying Ingenuity to the Measurement of Emerging Technologies Contents Emerging Innovations Department Delivering Bigger Benefits by Optimizing Customer Workflows Measuring Material Properties at the Nanoscale Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications WiMAX™: Plotting a New Path to Global Mobility Addressing the Triple Complexity of Triple-Play Networks What Next for Mobile Telephony? Exploring the Inner Workings of Tire-Pressure Monitoring Systems Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe Making Accurate Settling-Time Measurements Using a Vector Network Analyzer Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants Measuring Stream Dynamics with Fiber Optics survey

Agilent Measurement Journal - Issue 3 - 2007

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