Agilent Measurement Journal - Issue 3 - 2007 - (Page 17)

Conclusion Because materials exhibit novel properties at the nanoscale, they present many measurement challenges to cross-disciplinary teams of researchers, and there is no single tool that provides all the information researchers seek. Instead, they must rely on a variety of measurement tools to image, manipulate and characterize nanoscale devices. They confront myriad problems that are as diverse as the measurements they need to make: imaging of surfaces; measurement of electrical, mechanical, thermal, physical, chemical or biological properties of surface and bulk; imaging the distribution of components; quantitatively understanding the composition of complex mixtures and composites; and developing highly speciﬁc identiﬁcation and location of species down to the level of individual molecules. To make such measurements, researchers must draw upon a broad range of microscopy, spectroscopy, chemical analysis and physical measurement tools to further their research, development and commercialization activities. References 1. Lee, W-R, Kim, M.G., Choi, J-R, Park, J-I, Ko, S.J and Cheon, J. 2005. Redox-Transmetalation Process as a Generalized Synthetic Strategy for Core-Shell Magnetic Nanoparticles. Journal of the American Chemical Society, 127, June 3, 2005. 2. The full report is available online at www.nano.gov/nni_societal_implications.pdf. 3. Strommenger, B., Kettlitz, C., Werner, G. and Witte, W. 2003. Multiplex PCR Assay for Simultaneous Detection of Nine Clinically Relevant Antibiotic Resistance Genes in Staphylococcus aureus. Journal of Clinical Microbiology, 41, June 2, 2003. 4. Agilent Application Note B1500-1, Measuring CNT FETs and CNT SETs Using the Agilent B1500A. 2005. Publication number 5989-2842EN, available online at www.agilent.com. 5. Grubbs, R. K., Venturini, E. L., Clem, P. G., Richardson, J. J., Tuttle, B. A. and Samara, G. A. 2005. Dielectric and magnetic properties of FE- and Nb-doped CaCu3Ti4O12. Physical Review, B 72, September 23, 2005. 6. Zhang, X-J, Zhu, R-Q, Zhao, J., Chen, Y-F and Zhu, Y-Y. 2004. Phonon-polariton dispersion and the polariton-based photonic band gap in piezoelectric superlattices. Physical Review, B 69, February 27, 2004. 7. Smits, E., Anthopoulos, T., Setayesh, S., Veenendaal, E., Coehoorn, R., Blom, P., Boer, B. and Leeuw, D. 2006. Ambipolar charge transport in organic ﬁeld-effect transistors. Physical Review, B 73, September 6, 2006. Agilent Measurement Journal 17 http://www.nano.gov/nni_societal_implications.pdf http://www.agilent.com

Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 3 - 2007

Applying Ingenuity to the Measurement of Emerging Technologies Contents Emerging Innovations Department Delivering Bigger Benefits by Optimizing Customer Workflows Measuring Material Properties at the Nanoscale Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications WiMAX™: Plotting a New Path to Global Mobility Addressing the Triple Complexity of Triple-Play Networks What Next for Mobile Telephony? Exploring the Inner Workings of Tire-Pressure Monitoring Systems Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe Making Accurate Settling-Time Measurements Using a Vector Network Analyzer Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants Measuring Stream Dynamics with Fiber Optics survey

Agilent Measurement Journal - Issue 3 - 2007

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