Agilent Measurement Journal - Issue 3 - 2007 - (Page 70) pd mirror shutter to/from fiber sensor wf wf mirror wf ld Figure 1. The integrated optical assembly in the Agilent DTS includes a low-power semiconductor laser (ld) and a single-receiver optical detector (pd). The concept uses a series of wavelength filters (wf) and mirrors direct the backscattered Stokes and Anti-Stokes lines from the fiber sensor to the photo diode. (Figure adapted from Reference 1.) Looking inside the Agilent DTS The core of the Agilent DTS is an integrated optical block that contains a laser source, filters and a single optical detector in a bulk optical assembly. The entire assembly is hermetically sealed and filled with an inert gas, isolating the components and preventing condensation from degrading instrument performance over its range of operating temperatures. A schematic of the optical assembly is shown in Figure 1. Two unique aspects of the design are its use of a low-power semiconductor laser and its single-receiver optical detector. The DTS uses a low-power external-cavity diode laser operating at 1064 nm. A semiconductor laser ensures a long operating life, eliminating the need for field-replaceable parts. This is an important requirement for reliable, maintenance-free measurements in remote locations. Additionally, the average optical power from the source is ~17 mW, which classifies the laser as a Class 1M “eye safe” device — unlike other commercial instruments that use solid-state YAG lasers. The optical path for the single-receiver design is also shown in Figure 1. Light from the source is coupled into the sensing fiber and backscattered light is directed toward the detector through a series of filters and reflectors. The Agilent DTS measures both the Anti-Stokes (1018 nm) and Stokes (1112 nm) lines using a single optical receiver. A single receiver improves the instrument’s measurement accuracy over a wide range of operating temperature by eliminating drift, which can occur in dual-receiver designs. The apparent change in temperature reported by the DTS is less than 1º C as the ambient operating temperature of the DTS changes over its entire 70º C range. The choice of a power-efficient semiconductor laser carries a technical challenge: the resulting backscattered light has limited signal strength at the receiver, and this translates into a lower signal-to-noise ratio. Agilent engineers overcame this issue using a code-correlation technique to boost signal level and improve the signal-to-noise ratio, making it comparable to higher-power, single-pulse laser sources.2 This approach was leveraged from Agilent’s 20 years of experience designing and manufacturing rugged, field-reliable optical time-domain reflectometers (OTDRs) and external-cavity diode lasers. Making it field-ready To address rugged, outdoor field applications, the Agilent DTS is designed around an integrated optical block. The instrument also includes an IP66 (NEMA 4) enclosure to prevent moisture from interfering with instrument operation (Figure 2). Additionally, the optical block is temperature stabilized, allowing operation from –10º C to +60º C. Operation at lower temperatures is made possible by adding insulation that traps heat generated by the instrument: With this extra warmth, the DTS will continue to function even if the external temperature drops below –10° C. In a trial, the DTS operated down to –40° C using only external insulation with no internal heating elements. The instrument can be operated with standard telecom fibers for normal temperature ranges or with special fibers that cover a temperature span of –273º C to +700º C, depending on sensor coating. 70 Agilent Measurement Journal
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 3 - 2007 Applying Ingenuity to the Measurement of Emerging Technologies Contents Emerging Innovations Department Delivering Bigger Benefits by Optimizing Customer Workflows Measuring Material Properties at the Nanoscale Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications WiMAX™: Plotting a New Path to Global Mobility Addressing the Triple Complexity of Triple-Play Networks What Next for Mobile Telephony? Exploring the Inner Workings of Tire-Pressure Monitoring Systems Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe Making Accurate Settling-Time Measurements Using a Vector Network Analyzer Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants Measuring Stream Dynamics with Fiber Optics survey Agilent Measurement Journal - Issue 3 - 2007 Agilent Measurement Journal - Issue 3 - 2007 - (Page 1) Agilent Measurement Journal - Issue 3 - 2007 - Applying Ingenuity to the Measurement of Emerging Technologies (Page 2) Agilent Measurement Journal - Issue 3 - 2007 - Applying Ingenuity to the Measurement of Emerging Technologies (Page 3) Agilent Measurement Journal - Issue 3 - 2007 - Contents (Page 4) Agilent Measurement Journal - Issue 3 - 2007 - Contents (Page 5) Agilent Measurement Journal - Issue 3 - 2007 - Emerging Innovations Department (Page 6) Agilent Measurement Journal - Issue 3 - 2007 - Emerging Innovations Department (Page 7) Agilent Measurement Journal - Issue 3 - 2007 - Delivering Bigger Benefits by Optimizing Customer Workflows (Page 8) Agilent Measurement Journal - Issue 3 - 2007 - Delivering Bigger Benefits by Optimizing Customer Workflows (Page 9) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 10) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 11) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 12) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 13) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 14) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 15) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 16) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Material Properties at the Nanoscale (Page 17) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 18) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 19) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 20) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 21) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 22) Agilent Measurement Journal - Issue 3 - 2007 - Utilizing In Situ Atomic Force Microscopy in Life Science, Pharmaceutical and other Bio-Related Applications (Page 23) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 24) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 25) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 26) Agilent Measurement Journal - Issue 3 - 2007 - WiMAX™: Plotting a New Path to Global Mobility (Page 27) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 28) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 29) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 30) Agilent Measurement Journal - Issue 3 - 2007 - Addressing the Triple Complexity of Triple-Play Networks (Page 31) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 32) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 33) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 34) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 35) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 36) Agilent Measurement Journal - Issue 3 - 2007 - What Next for Mobile Telephony? (Page 37) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 38) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 39) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 40) Agilent Measurement Journal - Issue 3 - 2007 - Exploring the Inner Workings of Tire-Pressure Monitoring Systems (Page 41) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 42) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 43) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 44) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 45) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 46) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 47) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 48) Agilent Measurement Journal - Issue 3 - 2007 - Developing, Assessing and Applying a High-Resolution Thin-Film Magnetic Probe (Page 49) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 50) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 51) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 52) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 53) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 54) Agilent Measurement Journal - Issue 3 - 2007 - Making Accurate Settling-Time Measurements Using a Vector Network Analyzer (Page 55) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 56) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 57) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 58) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 59) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 60) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 61) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 62) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 63) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 64) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 65) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 66) Agilent Measurement Journal - Issue 3 - 2007 - Applying Metabolomics Methods to the Study of Bacterial Leaf Blight in Rice Plants (Page 67) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 68) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 69) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 70) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 71) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 72) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 73) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 74) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 75) Agilent Measurement Journal - Issue 3 - 2007 - Measuring Stream Dynamics with Fiber Optics (Page 76) Agilent Measurement Journal - Issue 3 - 2007 - survey (Page survey)
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