Agilent Measurement Journal - Issue 4 - 2008 - (Page 3)

Issue Four Campus Connection Department 2008 AGILENT MEASUREMENT JOURNAL William P. Sullivan | President and Chief Executive Officer Darlene J.S. Solomon | Agilent Chief Technology Officer and Vice President, Agilent Laboratories Heidi Garcia | Editor-in-Chief ADVISORY BOARD David Badtorff | San Diego, California, USA Lee Barford | Santa Clara, California, USA Bert Esser | Amstelveen, Netherlands Pablo Estrada | Santa Rosa, California, USA Mike Griffin | Hong Kong, Hong Kong Johnnie Hancock | Colorado Springs Colorado, USA Theresa Khoo | Singapore, Singapore Jean-Claude Krynicki | Palaiseau, Essonne, France Yat Por Lau | Penang, Malaysia Linda Roettger| Santa Clara, California, USA Craig Schmidt | Loveland, Colorado, USA Roger Stancliff | Santa Rosa, California, USA Kazuyuki Tamaru | Tokyo, Japan Boon-Khim Tan | Penang, Malaysia Giampaolo Tardioli | Santa Rosa, California, USA Dominic Testa| Wilmington, Delaware, USA Daniel Thomasson | Santa Rosa, California, USA Kenn Wildnauer | Santa Rosa, California, USA Martha Zemede | Santa Rosa, California, USA 38 Choosing an Appropriate Calibration Method for Vector Network Analysis Common techniques are compared — and the “best” choice depends on the application, the required accuracy and the care taken during the process itself. 52 Making Traceable 46 EVM Measurements with Digital Oscilloscopes Waveform metrology is a powerful tool that traceably links industrially important W-CDMA test equipment to primary standards. Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier Leeds University performs some of the world’s best research in terahertz — and is a shining example of successful academic collaboration with Agilent. 60 Interpreting Quoted Specifications when Selecting Digitizers “Banner specifications” such as bandwidth, resolution and sampling rate often have little or no impact on measurement fidelity in many applications. EDITORIAL Please e-mail inquiries and requests to journal@agilent.com Subscribe to Agilent Measurement Journal Give yourself an edge in today’s dynamic world of technology: Subscribe to the Journal and receive your own copy of the print edition in the mail. To activate your free subscription, go to www.agilent.com/go/journal and look for the link “Manage your Agilent Measurement Journal subscription”. Agilent Measurement Journal © 2008 Agilent Technologies, Inc. http://www.agilent.com/go/journal

Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 4 - 2008

Agilent Measurement Journal - Issue 4 - 2008 Delivering Confidence through Compliance with Standards Contents Emerging Innovations Trying Early Device Implementations at the IEEE 1588 PlugFest Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services Overcoming the Challenges of RFID Component Testing 3GPP LTE: Introducing Single- Carrier FDMA Ensuring Reliable Operation and Performance in Converged IP Networks Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates Choosing an Appropriate Calibration Method for Vector Network Analysis Making Traceable EVM Measurements with Digital Oscilloscopes Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier Interpreting Quoted Specifications when Selecting Digitizers

Agilent Measurement Journal - Issue 4 - 2008

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