Agilent Measurement Journal - Issue 4 - 2008 - (Page 37)

Easily view the protocol handshake Use contextsensitive columns to see the details Color code by frame type to easily see the conversation Figure 2. Advanced GUI capabilities highlight information ﬂows in multi-node systems and helps the user quickly isolate problems. Figure 3. A large-scale system has a much smaller physical footprint than the numerous real-world server and storage devices it can emulate. they provided. For example, early in development or functional validation, multiple SAN testers may be needed to generate sufﬁcient trafﬁc to understand the behavior of SAN equipment during both positive and negative testing. Later, during the testing of more-mature devices, not as many SAN tester ports are required for stimuli; instead, more analyzers are required for monitoring and troubleshooting of errors. Multifunction test modules can address these issues. For example, the Agilent Fibre Channel SAN test system lets the user switch between two different applications, SAN tester and protocol analyzer (Figure 4). When the organization needs more stimuli, most of the hardware can be used in the SAN-tester mode. When the organization needs more protocol analyzers, most of the hardware can be used in the analysis mode. Having this level of ﬂexibility in one tester helps reduce the total cost of test. Conclusion Storage area networks are growing in size, complexity, features and capabilities. These changes are driving the adoption of dedicated test solutions, which offer many advantages for testing today’s SANs and SAN devices: a single point of control over thousands of emulated devices, repeatable measurements and a lower cost of test. Dedicated testers that include multiple applications in one instrument — a SAN tester and protocol analyzer, for example — give the user greater ﬂexibility and more control across the complete development cycle of new SAN products. Additional reading For more information about test solutions for Fibre Channel, please visit www.agilent.com/ﬁnd/8G. Hardware Virtual edge devices Software SAN tester DUT/SUT Virtual edge devices Active testing Protocol analyzer DUT/SUT DUT/SUT Protocol analysis Figure 4. The Agilent 173x Fibre Channel SAN test system provides the capabilities of a SAN tester and protocol analyzer in one hardware platform. Agilent Measurement Journal 37 http://www.agilent.com/nd/8G

Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 4 - 2008

Agilent Measurement Journal - Issue 4 - 2008 Delivering Confidence through Compliance with Standards Contents Emerging Innovations Trying Early Device Implementations at the IEEE 1588 PlugFest Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services Overcoming the Challenges of RFID Component Testing 3GPP LTE: Introducing Single- Carrier FDMA Ensuring Reliable Operation and Performance in Converged IP Networks Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates Choosing an Appropriate Calibration Method for Vector Network Analysis Making Traceable EVM Measurements with Digital Oscilloscopes Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier Interpreting Quoted Specifications when Selecting Digitizers

Agilent Measurement Journal - Issue 4 - 2008

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