Agilent Measurement Journal - Issue 4 - 2008 - (Page 4) Emerging Innovations • • Researchers find key to greater DNA sequencing throughput Agilent takes oscilloscope probing to the extreme EMERGING INNOVATIONS Adapting Agilent’s in situ oligonucleotide synthesis technology to oligonucleotide library synthesis, a team of researchers from Agilent, Harvard Medical School, Virginia Commonwealth University, Stanford University and Codon Devices believes it has unlocked the door to significantly faster and more cost-effective DNA sequencing. The researchers synthesized complex oligonucleotide probe mixtures, applying the mixtures to simultaneously capture and amplify approximately 10,000 human exons in a single reaction. They also demonstrated how this technique can be integrated with ultra-high-throughput sequencing for economical, high-quality targeted variation discovery. The team published the results of its findings in the online version of Nature Methods, describing how previous-generation DNA sequencing has been constrained by a lack of parallel “front end” methods to replace traditional polymerase chain reactions. Extreme temperatures, both hot and cold, have always posed a challenge to accurate oscilloscope measurements. Agilent’s new N5450A InfiniiMax extension cables for the InfiniiMax Series probing system and Agilent Infiniium oscilloscopes now provide the industry’s widest temperature range coverage: –55º C to +150º C. The solution is ideal for cellular, automotive electronics, storage device and consumer electronics equipment designers who must validate their designs’ functionality under extreme temperatures. The extension cables also provide testers with an extra probing distance of 92 cm and two different operational temperature ranges based on probe-head configurations. • Streamlining test system creation and deployment in aerospace and defense • Agilent introduces first of its kind, single-platform Ethernet OAM test software New capabilities for the Agilent N2X multiservice test solution provide end-to-end Ethernet operations, administration and maintenance (E-OAM), eliminating one of the final barriers to wide-scale adoption of Carrier Ethernet. This single-platform solution for protocol emulation and conformance testing will enable network equipment manufacturers and service providers to ensure their devices meet performance and scalability requirements, conform to new international standards and are capable of interoperating in large, multivendor networks. The solution also enables comprehensive testing of emerging Ethernet infrastructure technologies as well as the application services, such as Internet protocol television (IPTV), that operate over them. Aerospace and defense companies have long been hindered by inefficient test system architectures that require every system connection and protocol conversion to be uniquely programmed. The result is a time-consuming change to every connected system element when only one element requires modification. To solve this problem, the Agilent Virtual Rack platform decouples all system elements within a matrix-based architecture, resulting in an integrated system with components that are independent of specific interfaces or programming languages. System developers only need to define the endpoints — Virtual Rack handles all the required integration through its “storeroom” of thousands of hardware, software and firmware elements from numerous vendors. 4 Agilent Measurement Journal
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 Delivering Confidence through Compliance with Standards Contents Emerging Innovations Trying Early Device Implementations at the IEEE 1588 PlugFest Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services Overcoming the Challenges of RFID Component Testing 3GPP LTE: Introducing Single- Carrier FDMA Ensuring Reliable Operation and Performance in Converged IP Networks Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates Choosing an Appropriate Calibration Method for Vector Network Analysis Making Traceable EVM Measurements with Digital Oscilloscopes Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier Interpreting Quoted Specifications when Selecting Digitizers Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover1) Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover2) Agilent Measurement Journal - Issue 4 - 2008 - Delivering Confidence through Compliance with Standards (Page 1) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 4) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 5) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 6) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 7) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 8) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 9) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 10) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 11) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 12) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 13) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 14) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 15) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 16) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 17) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 18) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 19) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 20) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 21) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 22) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 23) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 24) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 25) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 26) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 27) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 28) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 29) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 30) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 31) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 32) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 33) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 34) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 35) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 36) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 37) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 38) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 39) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 40) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 41) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 42) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 43) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 44) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 45) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 46) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 47) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 48) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 49) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 50) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 51) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 52) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 53) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 54) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 55) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 56) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 57) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 58) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 59) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 60) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 61) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 62) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 63) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 64) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Contact Ag) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Cover4) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page survey)
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