Agilent Measurement Journal - Issue 4 - 2008 - (Page 57) PCF cross section Air hole After experimental determination of the waveguiding properties (phase propagation constant and loss) of the flexible dielectric guide, work will concentrate on whether the guide can be engineered into a practical ruggedized cable with connectors. For connectors, such high frequencies pose severe challenges on fabrication tolerances and planarity of interface. What’s more, it is essential — but difficult — to design a metrologygrade connector with 60-dB repeatability levels. Applications around future products such as security and medical scanners require cables and connectors that can be replaced by nonspecialist field engineers. Connector design issues will be studied in terms of connectability (ease of connect/disconnect, standardization of coupling mechanism, threads/engagement/ latching), repeatability and lifetime, and effect of mechanical tolerances. The longer term goal of the research is to work towards an open standard for terahertz connectors and guiding structures. Diameter Hole pitch Figure 3. Conventional hexagonal photonic crystal fiber (PCF), shown in cross section, can be applied to the design of terahertz dielectric waveguide.2 The effective refractive index of the cladding region n clad is frequency dependent. When the frequency is relatively high, the field becomes more concentrated in the silica region and away from the air holes, which leads to high n clad. Consequently, the gap between n core and n clad becomes small at high frequency and therefore the frequency range for single-mode operation can be extended. The project is developing full-wave modeling techniques for terahertz PCF dielectric waveguide structures. The modeling will then lead to a study of the optimum design of a dielectric guide cross-section for single-mode behavior and low dispersion. The design of transitions from the dielectric guide to conventional sub-millimeterwave rectangular waveguide will be investigated in order to demonstrate practical measurements in the 140-GHz to 325-GHz range using a sub-millimeterwave Agilent 8510XF system. Stepping backward, then forward Joel Dunsmore, Ph.D. Senior R&D Engineer/Scientist, Agilent Technologies joel_dunsmore@agilent.com It started with an observation of unusual time-domain behavior when tuning a multicavity filter: The timeresponse changes corresponded to changes in the tuning screws. From this, I found that these filters could be tuned exactly using only the time-domain response — something that had never before been observed. Taking this beyond mere observation, however, would require a detailed look at the mathematics of filter responses and Fourier transforms. As it happened, Roger Pollard was visiting for the summer and we discussed a Ph.D. topic focused on a theoretical explanation of the observed behavior. I quickly discovered that this was akin to jumping in at the midpoint of a Ph.D. program. I spent the next two years seemingly going backward until a broad study of the area enabled me to confidently describe the research problem. Outside interests fell by the wayside as some aspect of research, experiment or writing absorbed any free time. Three years later I had answered the problem, and also came to understand that learning the process of research is just as important the research itself. Agilent Measurement Journal 57
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 Delivering Confidence through Compliance with Standards Contents Emerging Innovations Trying Early Device Implementations at the IEEE 1588 PlugFest Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services Overcoming the Challenges of RFID Component Testing 3GPP LTE: Introducing Single- Carrier FDMA Ensuring Reliable Operation and Performance in Converged IP Networks Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates Choosing an Appropriate Calibration Method for Vector Network Analysis Making Traceable EVM Measurements with Digital Oscilloscopes Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier Interpreting Quoted Specifications when Selecting Digitizers Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover1) Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover2) Agilent Measurement Journal - Issue 4 - 2008 - Delivering Confidence through Compliance with Standards (Page 1) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 4) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 5) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 6) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 7) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 8) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 9) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 10) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 11) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 12) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 13) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 14) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 15) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 16) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 17) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 18) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 19) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 20) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 21) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 22) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 23) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 24) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 25) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 26) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 27) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 28) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 29) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 30) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 31) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 32) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 33) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 34) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 35) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 36) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 37) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 38) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 39) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 40) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 41) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 42) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 43) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 44) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 45) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 46) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 47) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 48) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 49) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 50) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 51) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 52) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 53) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 54) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 55) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 56) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 57) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 58) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 59) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 60) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 61) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 62) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 63) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 64) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Contact Ag) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Cover4) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page survey)
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