Agilent Measurement Journal - Issue 4 - 2008 - (Page 64) Considering total harmonic distortion Total harmonic distortion (THD) is the ratio in dB of the total level of the first few harmonics to the level of the input signal at the output. THD is usually calculated from an FFT of a test signal where f is the fundamental (input) frequency and f1 through fn are the first n harmonic frequencies: Conclusion The handful of key specifications described here only begins to illustrate the non-trivial task of selecting a product based on published specifications. For example, ENOB (and SINAD) provide some indication of amplitude measurement accuracy. Clock accuracy and sampling jitter provide an indication of the frequency measurement accuracy and the temporal noise introduced in the measurement. There are additional useful specifications, each with individual implications for specific applications. For example, linearity addresses the fact that the discrete measurement levels described by the bit resolution are not necessarily equally spaced, leading to amplitude measurement error. Voltage standing wave ratio (VSWR) describes the reflection of the input signal at the input terminals, an effect that diminishes the signal amplitude before it is measured and also introduces signal echoes into the system. VSWR also is frequency dependent, introducing more complexity to the selection process. Noise ratios have been addressed here, but other specifications such as the Sparkle Code Rate indicate the probability of a sampled point exceeding a specified deviation threshold. In general, spurious noise could have an effect on any peak-detection routine based on the digitization of a signal. In most cases, obtaining the best measurement system for a specific application can be ensured by consulting not only the specification sheets of the various devices but also the manufacturers themselves. THD f12 + f22 + f32 + … + fn2 f2 Tip: Harmonic distortion values are most meaningful when quoted with the number of harmonics used in the calculation; the input frequencies over which the measurement is valid; the sampling rate of the measurement quoted; the full-scale voltage range; and the input voltage level as a percentage of that full-scale range. Examining spurious-free dynamic range Spurious-free dynamic range (SFDR) is the difference, expressed in dB, between the RMS values of the input signal at the output and the peak spurious signal where a spurious signal is any output signal that was not present at the input (Figure 6). dB Signal Spurious signal SFDR Frequency Figure 6. Spurious-free dynamic range affects the usable dynamic range in a measurement. Tip: SFDR values should be quoted with the input frequencies over which the measurement is valid; the sampling rate of the measurement quoted; the full-scale voltage range; and the input voltage as a percentage of that full-scale range. 64 Agilent Measurement Journal
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 Delivering Confidence through Compliance with Standards Contents Emerging Innovations Trying Early Device Implementations at the IEEE 1588 PlugFest Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services Overcoming the Challenges of RFID Component Testing 3GPP LTE: Introducing Single- Carrier FDMA Ensuring Reliable Operation and Performance in Converged IP Networks Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates Choosing an Appropriate Calibration Method for Vector Network Analysis Making Traceable EVM Measurements with Digital Oscilloscopes Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier Interpreting Quoted Specifications when Selecting Digitizers Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover1) Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover2) Agilent Measurement Journal - Issue 4 - 2008 - Delivering Confidence through Compliance with Standards (Page 1) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 4) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 5) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 6) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 7) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 8) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 9) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 10) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 11) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 12) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 13) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 14) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 15) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 16) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 17) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 18) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 19) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 20) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 21) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 22) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 23) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 24) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 25) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 26) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 27) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 28) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 29) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 30) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 31) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 32) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 33) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 34) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 35) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 36) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 37) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 38) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 39) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 40) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 41) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 42) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 43) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 44) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 45) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 46) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 47) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 48) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 49) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 50) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 51) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 52) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 53) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 54) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 55) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 56) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 57) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 58) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 59) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 60) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 61) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 62) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 63) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 64) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Contact Ag) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Cover4) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page survey)
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