Agilent Measurement Journal - Issue 4 - 2008 - (Page 9) O One of the best ways to maintain confidence in the measurements provided by an electronic instrument is to follow its recommended calibration interval. Maintaining calibration — and up-to-date certification — may also be required by internal and external quality auditors. These days, many companies no longer maintain internal calibration labs and instead are subcontracting or outsourcing their calibration work. Unfortunately, there is wide variation in the depth and quality of the calibrations performed by service providers. One way to gauge calibration services is by the quality and metrology standards the provider follows. Since 1987, the common denominator for quality has been the ISO 9001:2000 standard, which is part of the umbrella ISO 9000 standard and is administered by the International Standards Organization (ISO). ISO 9001 applies to products, services and software, and has been extended with several industry-specific standards. To use an analogy, ISO 9001:2000 certification can be viewed as a “passport” required by all businesses. This passport can be endorsed with “technical visas” for specific topics in different countries or regions. For example, ISO 17025:2005 covers the “competence of test and calibration laboratories” globally while ANSI/NCSL Z540.3 is used for Department of Defense (DoD) activities in North America. resources and facilitate the movement of equipment from country to country. For multinational companies such as Agilent, this type of standardization allows consistent delivery of services across a global network of service centers. Within the worldwide deployment of quality and metrology standards, it is expected that requirements are understandable without the support of a specialist, do not conflict with one another, and are not susceptible to multiple interpretations. From a business perspective, the objective is to also see a positive return on investment from benefits such as compliance with requirements through reductions in audits, increases in productivity and gains in competitive advantage. Convergence of standards is expected to also help instrument users such as contract manufacturers who must deal with a wide variety of standards that apply to the countries and industries they supply. Standardizing calibration certificates As a specific example, a calibration certificate is the main tangible proof of calibration usually scrutinized by auditors. As a result, service providers must apply special care to the design and ergonomics of the certificate itself. It is also necessary to find a good compromise between worldwide standardization and specific requirements while ensuring consistency between new and in-service instruments. ISO 17025:2005 is one of a few standards that provide a detailed list of requirements for calibration certificates. Because Agilent participated in the design of ISO 17025, it was possible for the company to create a standard document in 1999. Currently, up to 30 pieces of information are included in the administrative part of an Agilent calibration certificate. One section presents information useful to the end user (e.g., type of service delivered, equipment reference, as-received status) while another section addresses the needs of auditors (e.g., traceability and quality data). From the very beginning, Agilent’s Calibration Certificate Working Group has been monitoring customer inputs on a weekly basis. Along the way, one issue arose concerning the inclusion of a “next calibration due” statement on the document. The Z540 standard seemed to require this usage while ISO 17025 forbade this kind of information because it must be defined by the user’s quality system, not by the laboratory performing the calibration service. To provide appropriate flexibility, Agilent lets the customer choose to include or exclude this sentence. The role of standards and guides The general objective of quality and metrology standards is to provide confidence in measurements and to facilitate product acceptance; they also play a role in reducing technical barriers to trade. As applied to instrument service operations, the end user can expect to see standards requirements reflected within service deliverables, helping them satisfy the needs of internal and external auditors. This is especially important when all or part of the metrology process is subcontracted to a service provider: Essential documents such as calibration certificates, quality system certification, accreditation information or traceability must fully address all relevant audit requirements. Taking a broader view, international acceptance of service deliverables will provide access to the best worldwide metrology Agilent Measurement Journal 9
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 Delivering Confidence through Compliance with Standards Contents Emerging Innovations Trying Early Device Implementations at the IEEE 1588 PlugFest Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services Overcoming the Challenges of RFID Component Testing 3GPP LTE: Introducing Single- Carrier FDMA Ensuring Reliable Operation and Performance in Converged IP Networks Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates Choosing an Appropriate Calibration Method for Vector Network Analysis Making Traceable EVM Measurements with Digital Oscilloscopes Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier Interpreting Quoted Specifications when Selecting Digitizers Agilent Measurement Journal - Issue 4 - 2008 Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover1) Agilent Measurement Journal - Issue 4 - 2008 - Agilent Measurement Journal - Issue 4 - 2008 (Page Cover2) Agilent Measurement Journal - Issue 4 - 2008 - Delivering Confidence through Compliance with Standards (Page 1) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 4 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 4) Agilent Measurement Journal - Issue 4 - 2008 - Emerging Innovations (Page 5) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 6) Agilent Measurement Journal - Issue 4 - 2008 - Trying Early Device Implementations at the IEEE 1588 PlugFest (Page 7) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 8) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 9) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 10) Agilent Measurement Journal - Issue 4 - 2008 - Achieving Greater Confidence in Measurement Accuracy through Consistency in Calibration Services (Page 11) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 12) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 13) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 14) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 15) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 16) Agilent Measurement Journal - Issue 4 - 2008 - Overcoming the Challenges of RFID Component Testing (Page 17) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 18) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 19) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 20) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 21) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 22) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 23) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 24) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 25) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 26) Agilent Measurement Journal - Issue 4 - 2008 - 3GPP LTE: Introducing Single- Carrier FDMA (Page 27) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 28) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 29) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 30) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 31) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 32) Agilent Measurement Journal - Issue 4 - 2008 - Ensuring Reliable Operation and Performance in Converged IP Networks (Page 33) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 34) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 35) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 36) Agilent Measurement Journal - Issue 4 - 2008 - Testing Storage Area Networks and Devices at 8.5-Gb/s Fibre Channel Rates (Page 37) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 38) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 39) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 40) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 41) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 42) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 43) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 44) Agilent Measurement Journal - Issue 4 - 2008 - Choosing an Appropriate Calibration Method for Vector Network Analysis (Page 45) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 46) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 47) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 48) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 49) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 50) Agilent Measurement Journal - Issue 4 - 2008 - Making Traceable EVM Measurements with Digital Oscilloscopes (Page 51) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 52) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 53) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 54) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 55) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 56) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 57) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 58) Agilent Measurement Journal - Issue 4 - 2008 - Exploring Terahertz Measurement, Imaging and Spectroscopy: The Electromagnetic Spectrum’s Final Frontier (Page 59) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 60) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 61) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 62) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 63) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page 64) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Contact Ag) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page Cover4) Agilent Measurement Journal - Issue 4 - 2008 - Interpreting Quoted Specifications when Selecting Digitizers (Page survey)
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