Agilent Measurement Journal - Issue 5 - 2008 - (Page 12) The technique used to obtain an overall view of the digital signal is to display an eye diagram, which is an overlay of the different bit transitions plotted one on top of the other (Figure 2). In the eye diagram, maximum and minimum values of the zero and one levels can be seen along with the extremes of rise and fall times. On a spectrum analyzer, the measured power spectrum shows the absolute value of the sinc2(f) function. If the digital signal is a repeating pulse, the resulting power spectrum will be spectral lines rather than a continuous envelope. The spectral nulls fall at the pulse frequency and its multiples. The spectral lines follow the pulse repetition rate. If the digital signal is more complicated than a repeating pulse such as a data signal, its spectrum is more complex. In this case, the spectral nulls will fall at the data rate and its multiples, similar to the pulse train. For a repeating pattern, such as a PRBS7, the spectral lines fall at the inverse of the pattern length in time. For a 5-Gb/s data rate, PRBS7 data signal, the spectral lines will be spaced at 5e9/127 or 39.4 MHz (Figure 4). The longer the pattern, the closer the spectral lines fall and the more closely the spectrum envelope follows the sinc2(f) function. Figure 2. Data signal eye diagram Viewing data in the frequency domain When digital signals propagate through a bandwidth-limited channel, they are low-pass filtered and the higher frequency content is attenuated. To understand this effect, look at the data signal in the frequency domain (e.g., the signal’s spectrum). In the simplest case of one bit, or impulse, the spectrum takes the form of a sinc function (e.g., sin(x)/x) (Figure 3). Figure 4. Spectral line spacing of the PRBS7 pattern The other significant effect on the spectrum is the transition time of the signal (e.g., its rise and fall times). The faster the transition time, the more energy there is at higher frequencies, which is indicated by increases in the power of the higherfrequency spectral lines. With the channel acting as a lowpass filter, it has a greater effect on these higher-frequency components. Increased data rates translate into a short bit time or period, necessitating faster transition times. The faster transition times mean that more of the signal’s energy is at higher frequencies and therefore, the bandwidth limitation of the channel has a larger effect on the signal spectrum. Figure 3. Spectrum of an impulse, the sinc function 12 Agilent Measurement Journal
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal Issue 5 Finding a New Path when Assumptions Break Down Contents Testing MIPI D-PHY Protocols Oscilloscope Firmware Update DNA Replication Joining the LTE/SAE Trial Initiative Testing Proteins Praise for DC Power Analyzer Scripting Features for AMDS Testing Hybrid PCBA Systems Improving the Gene Expression System Workflow Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals Introducing the 3GPP LTE Downlink Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces Understanding Total Jitter Measurements of Low Probabilities Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance Creating Synchronous High-Frequency Sampling across Multiple Digitizers Overcoming the Challenges of Testing FlexRay Networks Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover1) Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover2) Agilent Measurement Journal - Issue 5 - 2008 - Finding a New Path when Assumptions Break Down (Page 1) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 4) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 5) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 6) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 7) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 8) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 9) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 10) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 11) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 12) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 13) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 14) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 15) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 16) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 17) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 18) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 19) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 20) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 21) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 22) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 23) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 24) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 25) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 26) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 27) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 28) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 29) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 30) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 31) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 32) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 33) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 34) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 35) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 36) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 37) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 38) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 39) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 40) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 41) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 42) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 43) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 44) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 45) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 46) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 47) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 48) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 49) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 50) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 51) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 52) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 53) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 54) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 55) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 56) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 57) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 58) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 59) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 60) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 61) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 62) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 63) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 64) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 65) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 66) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 67) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 68) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 69) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 70) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 71) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 72) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 73) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 74) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 75) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 76) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover3) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover4) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Survey)
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