Agilent Measurement Journal - Issue 5 - 2008 - (Page 14) This change is easier to see when viewing this signal as an eye diagram (Figure 8). The eye, though still open, has been “pinched” and is more closed (lower trace in Figure 8). For some bit transitions, the amplitude does not rise to the “one” level at all. Reducing the channel bandwidth by having a longer trace, or increasing the data rate would potentially cause the eye to completely close. Figure 9. Transition bits showing emphasis Figure 8. Limited channel bandwidth effect displayed as an eye diagram (lower trace) Dealing with the limited-bandwidth effect To achieve higher data rates through existing or low-cost channels, the designer must compensate for the bandwidth limitation. Because the channel attenuates the higher frequency components, they must be amplified. Two common techniques exist for addressing this task. One option is to apply emphasis at the transmitter, increasing the transmitted energy in the higher frequencies. This is done by increasing the amplitude of the data signal on the transition bits relative to the amplitude on the non-transition bits (Figure 9). A transition bit occurs where the data signal transitions from a one to a zero or from a zero to a one. Non-transition bits occur where the signal remains at the same level. Because it is the transitions that contain higher frequency energy, emphasis increases the energy in the higher frequencies that are low-pass filtered by the channel. Emphasis can be created by boosting the transition level above the nominal signal level (pre-emphasis) or by reducing the non-transition level below the nominal signal level (de-emphasis). Since most digital standards constrain the maximum signal level, de-emphasis is the more common implementation. The effect that emphasis can have on a bandwidth-limited signal can be dramatic. As an example, compare the bandwidth-limited eye diagram in the lower trace in Figure 8 with the emphasized bandwidth-limited eye diagram in the lower trace of Figure 10. Figure 10. Eye diagrams with emphasis, before and after the bandwidth limited channel 14 Agilent Measurement Journal
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal Issue 5 Finding a New Path when Assumptions Break Down Contents Testing MIPI D-PHY Protocols Oscilloscope Firmware Update DNA Replication Joining the LTE/SAE Trial Initiative Testing Proteins Praise for DC Power Analyzer Scripting Features for AMDS Testing Hybrid PCBA Systems Improving the Gene Expression System Workflow Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals Introducing the 3GPP LTE Downlink Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces Understanding Total Jitter Measurements of Low Probabilities Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance Creating Synchronous High-Frequency Sampling across Multiple Digitizers Overcoming the Challenges of Testing FlexRay Networks Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover1) Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover2) Agilent Measurement Journal - Issue 5 - 2008 - Finding a New Path when Assumptions Break Down (Page 1) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 4) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 5) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 6) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 7) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 8) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 9) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 10) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 11) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 12) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 13) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 14) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 15) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 16) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 17) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 18) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 19) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 20) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 21) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 22) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 23) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 24) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 25) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 26) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 27) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 28) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 29) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 30) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 31) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 32) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 33) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 34) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 35) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 36) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 37) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 38) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 39) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 40) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 41) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 42) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 43) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 44) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 45) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 46) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 47) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 48) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 49) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 50) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 51) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 52) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 53) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 54) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 55) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 56) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 57) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 58) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 59) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 60) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 61) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 62) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 63) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 64) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 65) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 66) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 67) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 68) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 69) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 70) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 71) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 72) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 73) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 74) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 75) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 76) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover3) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover4) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Survey)
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