Agilent Measurement Journal - Issue 5 - 2008 - (Page 20) Table 2. LTE downlink physical signals and physical channels Downlink signals P-SCH* S-SCH* Full name Primary synchronization signal Secondary synchronization signal RS Reference signal (pilot) Purpose Used for cell search and identification by the UE. Carries part of the cell ID (one of three orthogonal sequences). Used for cell search and identification by the UE. Carries the remainder of the cell ID (one of 168 binary sequences). Used for downlink channel estimation. Exact sequence derived from cell ID (one of 3 x 168 = 504). Purpose Carries cell-specific information Carries the multicast (MCH) transport channel Scheduling, ACK/NACK Payload Defines number of PDCCH OFDMA symbols per sub-frame (one, two or three) Carries HARQ ACK/NACK Downlink channels PBCH PMCH PDCCH PDSCH PCFICH PHICH Full name Physical broadcast channel Physical multicast channel Physical downlink control channel Physical downlink shared channel Physical control format indicator channel Physical hybrid ARQ indicator channel * Note: There are no formal acronyms to describe the primary and secondary synchronization signals. The terms P-SCH and S-SCH come from earlier 3GPP technical reports and are still used informally despite their suggestion of “channel” rather than “signal.” LTE downlink structure The LTE physical layer supports the use of paired and unpaired spectrum with frequency-division duplex (FDD) and time-division duplex (TDD) modes, respectively. Each of these modes has its own frame structure, described shortly. First, however, we will consider the composition of the downlink which comprises physical signals and physical channels as described in the 3GPP specifications.3 Downlink physical signals are generated in Layer 1 and used for system synchronization, cell identification and radio channel estimation. The primary synchronization signal (P-SCH) and secondary synchronization signal (S-SCH) encode the cell identification data, allowing the UE to identify and synchronize with the network. Downlink reference signals (RS), known as pilot signals in other standards, are used by the UE receiver to estimate the phase and flatness of the received signal. Errors in the received signal are the combination of errors in the transmitted signal and further imperfections in the radio channel. Without the use of reference signals spaced across the channel bandwidth, phase and amplitude shifts in the received signal would make demodulation unreliable, particularly at high modulation depths such as 16QAM or 64QAM. With these high modulation depths, even a small error in the received signal amplitude or phase can cause demodulation errors. Alongside the physical signals are physical channels, which carry data such as control, scheduling and user payload to and from the higher layers. Since LTE is a packet-only system there is no need to define dedicated channels since all data is carried on the shared channel. The function of each LTE physical signal and channel is summarized in Table 2. Table 3 shows the modulation schemes allowed for the downlink signals and channels. Table 3. Modulation schemes for the LTE downlink Downlink signals P-SCH S-SCH RS Modulation scheme One of three Zadoff-Chu sequences Two 31-bit BPSK M-sequence Complex I + jQ pseudo random sequence (length-31 gold sequence) derived from cell ID Modulation scheme QPSK QPSK, 16QAM, 64QAM QPSK QPSK, 16QAM, 64QAM QPSK BPSK modulated on I and Q with spreading factor 2 or 4 Walsh codes Downlink channels PBCH PMCH PDCCH PDSCH PCFICH PHICH 20 Agilent Measurement Journal
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal Issue 5 Finding a New Path when Assumptions Break Down Contents Testing MIPI D-PHY Protocols Oscilloscope Firmware Update DNA Replication Joining the LTE/SAE Trial Initiative Testing Proteins Praise for DC Power Analyzer Scripting Features for AMDS Testing Hybrid PCBA Systems Improving the Gene Expression System Workflow Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals Introducing the 3GPP LTE Downlink Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces Understanding Total Jitter Measurements of Low Probabilities Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance Creating Synchronous High-Frequency Sampling across Multiple Digitizers Overcoming the Challenges of Testing FlexRay Networks Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover1) Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover2) Agilent Measurement Journal - Issue 5 - 2008 - Finding a New Path when Assumptions Break Down (Page 1) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 4) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 5) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 6) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 7) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 8) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 9) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 10) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 11) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 12) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 13) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 14) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 15) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 16) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 17) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 18) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 19) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 20) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 21) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 22) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 23) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 24) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 25) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 26) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 27) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 28) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 29) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 30) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 31) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 32) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 33) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 34) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 35) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 36) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 37) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 38) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 39) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 40) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 41) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 42) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 43) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 44) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 45) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 46) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 47) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 48) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 49) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 50) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 51) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 52) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 53) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 54) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 55) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 56) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 57) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 58) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 59) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 60) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 61) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 62) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 63) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 64) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 65) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 66) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 67) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 68) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 69) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 70) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 71) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 72) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 73) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 74) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 75) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 76) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover3) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover4) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Survey)
For optimal viewing of this digital publication, please enable JavaScript and then refresh the page. If you would like to try to load the digital publication without using Flash Player detection, please click here.