Agilent Measurement Journal - Issue 5 - 2008 - (Page 38) Since it is impossible to wait for an infinite number of bits, it is desirable to collect as many samples as possible. If we measure a large number of errors, say 1,000, than the estimate is much more accurate. However, this poses a serious constraint on the required test time. At a 2.5-Gb/s PCI Express data rate, for example, the time required to generate 1,000 errors could easily reach 400,000 seconds, which is over 111 days! Returning to Equation 7, we observe that the value of Pe is much smaller than 1, typically in the range of 10-3 to 10-12. When Pe is small, Equation 7 can be approximated to a Poisson distribution:4 Equation 10a. 1 P(k,3) = k! @3ke-3 can also define another useful quantity, the upper limit of the confidence level which defines the probability that Pe is greater than g (usually referred to as the target BER). Equation 12. CLu = Prob[Pe> g| k, n] Equation 10a gives the probability of finding k errors. Using this expression we can derive the probability of finding at most k errors when we vary the number of errors from zero to k. By summing all the probabilities we obtain the total probability of finding k or fewer errors. Equation 13. k P[errors ≤ k] = 0 P(i,μ) i–0 Equation 10b. where 3 = n@Pe This expression is much more useful for analytical purposes. In order to minimize the measurement time, we only want to measure a minimum number of bits that still guarantees a certain confidence level. If we desire a higher confidence level the measurement time is accordingly higher. This confidence level defines a probability measure for the given estimate. Specifically, the confidence level is the probability that Pe is less than a specified threshold, g, given that k errors are observed when n bits were received. Equation 11. This quantity defines the confidence level for finding no greater than k errors.5 This expression is not very useful because it gives the confidence level if Pe is known. If we replace Pe with g, then the resulting confidence level can be used as a guideline. Equation 14a. P[errors ≤ k | g] = 0 P(i,ν), i–0 k Equation 14b. ν = n@g Let’s say we compute the confidence level for a given g, n and k from Equation 14a to be high. And in the experiment, we measure a higher k. This means one of two things. Either we got lucky in picking a very unlikely event or the error mechanism is worse than anticipated. If we repeat the experiment and consistently measure higher value for g, then we conclude that the latter is indeed true. This implies that the true value, Pe, is greater CL = Prob[Pe< g| k, n] Because this confidence level gives the probability that Pe is less than g, we can define it as the lower limit of confidence, CLl. We 38 Agilent Measurement Journal
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal Issue 5 Finding a New Path when Assumptions Break Down Contents Testing MIPI D-PHY Protocols Oscilloscope Firmware Update DNA Replication Joining the LTE/SAE Trial Initiative Testing Proteins Praise for DC Power Analyzer Scripting Features for AMDS Testing Hybrid PCBA Systems Improving the Gene Expression System Workflow Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals Introducing the 3GPP LTE Downlink Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces Understanding Total Jitter Measurements of Low Probabilities Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance Creating Synchronous High-Frequency Sampling across Multiple Digitizers Overcoming the Challenges of Testing FlexRay Networks Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover1) Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover2) Agilent Measurement Journal - Issue 5 - 2008 - Finding a New Path when Assumptions Break Down (Page 1) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 4) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 5) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 6) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 7) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 8) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 9) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 10) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 11) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 12) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 13) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 14) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 15) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 16) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 17) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 18) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 19) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 20) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 21) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 22) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 23) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 24) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 25) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 26) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 27) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 28) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 29) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 30) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 31) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 32) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 33) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 34) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 35) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 36) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 37) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 38) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 39) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 40) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 41) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 42) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 43) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 44) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 45) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 46) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 47) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 48) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 49) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 50) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 51) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 52) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 53) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 54) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 55) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 56) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 57) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 58) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 59) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 60) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 61) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 62) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 63) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 64) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 65) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 66) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 67) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 68) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 69) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 70) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 71) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 72) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 73) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 74) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 75) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 76) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover3) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover4) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Survey)
For optimal viewing of this digital publication, please enable JavaScript and then refresh the page. If you would like to try to load the digital publication without using Flash Player detection, please click here.