Agilent Measurement Journal - Issue 5 - 2008 - (Page 39) than g with a probability given by Equation 14a. As indicated by Equation 12, this is the confidence level for the upper limit. Equation 15. Equation 17. CLl = 1 – e-ν Rearranging terms, and using Equation 14b, we get: CLu = 0 P(i,ν) =0 i=0 i=0 k k 1 i -ν @ i! ν e Equation 18. As an example, let’s consider a target BER, g, of 10-8. If n is 109 then we expect to see 10 errors for k. But in the actual experiment, we observe 15 errors. CLu then works out to 0.95 or 95 percent from Equation 14a. This is obtained by using 15 for k, 109 for n and 10-8 for g. From this we can infer that Pe is higher than 10-8 with a 95 percent confidence level. Its complement gives the probability that the errors are k or greater. The confidence level, CLl, is then given by, Equation 16. 1 CLl = 1 – CLu = 1 – 0 i! @νie-ν i=0 k n@g = – 1n(1 – CLl ) From Equation 18, the minimum n for a given CLl can be calculated. When the confidence level is specified, a lower limit can be defined on the number of bits for a given target BER, g. For example, if we want to verify that a communication link has a BER of less than 10-9, and the confidence level desired is 95 percent, then a minimum n of approximately 3 x 109 (or (-ln(1-0.95)/ 10-9)) bits are needed. In other words, when we receive 3 x 109 bits and there are no errors observed, then Pe is less than 10-9 with 95 percent confidence. When k is non zero, the solution to Equation 16, as well as Equation 15, is difficult to obtain even with Poisson approximation. Previous work in this area attempts to solve it by further approximating the Poisson distribution to a Gaussian distribution.6 This turns out to be not so efficient, as it requires much higher n than would be required without the approximation. The confidence level here defines the probability that Pe is less than g. From Equation 16 it is possible to find the minimum number of bits that are required for the estimate of the probability of error as a function of the confidence level, CLl. When there are no errors received in an observation window, during which n bits are analyzed or when k =0, Equation 16 reduces to: 30.0E-9 90% Confidence 25.0E-9 95% Confidence Measured bit error rate, k/n 20.0E-9 99% Confidence 15.0E-9 10.0E-9 5.0E-9 0.0E0 0 1G 2G 3G Number of bits, n Figure 6. Upper and lower confidence limits for the probability of error, Pe ; the target BER, g, is 10-8 4G 5G 5.5G Agilent Measurement Journal 39
Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal Issue 5 Finding a New Path when Assumptions Break Down Contents Testing MIPI D-PHY Protocols Oscilloscope Firmware Update DNA Replication Joining the LTE/SAE Trial Initiative Testing Proteins Praise for DC Power Analyzer Scripting Features for AMDS Testing Hybrid PCBA Systems Improving the Gene Expression System Workflow Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals Introducing the 3GPP LTE Downlink Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces Understanding Total Jitter Measurements of Low Probabilities Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance Creating Synchronous High-Frequency Sampling across Multiple Digitizers Overcoming the Challenges of Testing FlexRay Networks Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis Agilent Measurement Journal - Issue 5 - 2008 Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover1) Agilent Measurement Journal - Issue 5 - 2008 - Agilent Measurement Journal Issue 5 (Page Cover2) Agilent Measurement Journal - Issue 5 - 2008 - Finding a New Path when Assumptions Break Down (Page 1) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 2) Agilent Measurement Journal - Issue 5 - 2008 - Contents (Page 3) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 4) Agilent Measurement Journal - Issue 5 - 2008 - Improving the Gene Expression System Workflow (Page 5) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 6) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 7) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 8) Agilent Measurement Journal - Issue 5 - 2008 - Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable (Page 9) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 10) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 11) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 12) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 13) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 14) Agilent Measurement Journal - Issue 5 - 2008 - Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals (Page 15) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 16) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 17) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 18) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 19) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 20) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 21) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 22) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 23) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 24) Agilent Measurement Journal - Issue 5 - 2008 - Introducing the 3GPP LTE Downlink (Page 25) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 26) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 27) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 28) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 29) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 30) Agilent Measurement Journal - Issue 5 - 2008 - Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces (Page 31) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 32) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 33) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 34) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 35) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 36) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 37) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 38) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 39) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 40) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 41) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 42) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Total Jitter Measurements of Low Probabilities (Page 43) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 44) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 45) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 46) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 47) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 48) Agilent Measurement Journal - Issue 5 - 2008 - Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance (Page 49) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 50) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 51) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 52) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 53) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 54) Agilent Measurement Journal - Issue 5 - 2008 - Creating Synchronous High-Frequency Sampling across Multiple Digitizers (Page 55) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 56) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 57) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 58) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 59) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 60) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 61) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 62) Agilent Measurement Journal - Issue 5 - 2008 - Overcoming the Challenges of Testing FlexRay Networks (Page 63) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 64) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 65) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 66) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 67) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 68) Agilent Measurement Journal - Issue 5 - 2008 - Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership (Page 69) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 70) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 71) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 72) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 73) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 74) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 75) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page 76) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover3) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Cover4) Agilent Measurement Journal - Issue 5 - 2008 - Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis (Page Survey)
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