Agilent Measurement Journal - Issue 5 - 2008 - (Page 43)

Taxonomy of Jitter Jitter is dependent on the type of communication system and can be caused by a number of factors such as crosstalk and noise. In system design, it is important to understand what speciﬁc mechanism is causing timing errors. As shown in Figure 1, jitter is classiﬁed according to generic categories, the most common of which are bounded and unbounded, correlated and uncorrelated, and data-dependant and non-data-dependant, random and deterministic, periodic and non-periodic.1 Total jitter is broadly divided into deterministic jitter and random jitter. Random jitter is due to noise effects that alter the bit arrival times. This jitter is unbounded, in the sense that the expected jitter grows with time. Deterministic jitter, on the other hand, is bounded and is produced by datapattern dependencies and crosstalk from other signals. Data-dependent jitter is subdivided into intersymbol interference (ISI) and duty-cycle distortion (DCD). ISI is caused by dispersion, while DCD is generated by the non-uniform response to the rise and fall times of the data signal. Crosstalk and periodic jitter are the result of interference and AM-PM conversion due to nonlinearity at the transmitter, the medium and the receiver. References 1. Stephens, R. 2004. Analyzing Jitter at High Data Rate. IEEE Optical Communications, February 2204. Data correlated Total jitter (TJ) Data uncorrelated Deterministic jitter (DJ, bounded) Random jitter (unbounded) Data dependent jitter (DDJ, bounded) Periodic jitter Inter-symbol interference (ISI, bounded) Duty cycle distortion (DCD, bounded) Cross talk (bounded) Figure 1. Classiﬁcation of jitter components Agilent Measurement Journal 43

Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 5 - 2008

Agilent Measurement Journal Issue 5 Finding a New Path when Assumptions Break Down Contents Testing MIPI D-PHY Protocols Oscilloscope Firmware Update DNA Replication Joining the LTE/SAE Trial Initiative Testing Proteins Praise for DC Power Analyzer Scripting Features for AMDS Testing Hybrid PCBA Systems Improving the Gene Expression System Workflow Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals Introducing the 3GPP LTE Downlink Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces Understanding Total Jitter Measurements of Low Probabilities Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance Creating Synchronous High-Frequency Sampling across Multiple Digitizers Overcoming the Challenges of Testing FlexRay Networks Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis

Agilent Measurement Journal - Issue 5 - 2008

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