Agilent Measurement Journal - Issue 5 - 2008 - (Page 5)

• High-sensitivity protein kit trumps silver-stained gel methods • Hybrid PCBA test system reduces costs and resources Pharmaceutical and life-science researchers now have a more accurate way to analyze proteins with Agilent’s new High Sensitivity Protein 250 Kit for the Agilent 2100 bioanalyzer. The kit delivers greater sensitivity than silver-stained SDS-polyacrylamide gel electrophoresis (SDS-PAGE) by detecting proteins to as little as 1 pg/ul and a 0.05 percent impurity. It also covers a sizing range from 10-250 kDa and boasts a quantitation range of four orders of magnitude. The new kit features a direct labeling reaction that is highly reproducible, and separation, quantitation and purity measurements can be performed in a single step with a 10-sample-per-hour throughput for QA/QC. By combining two different electronics manufacturing test methodologies, Agilent has devised a new hybrid boundary scan and vectorless test extended performance (VTEP) printed circuit board assembly (PCBA) test solution. Based on Agilent’s VTEP in-circuit test (ICT) software and bead probe technology, the system allows users to test PCBAs in a limited-access environment without sacriﬁcing test coverage. As a result, designers can develop circuit boards with less electrical test access, ultimately saving ﬁxture costs and reducing test resources. Fewer probes in the test ﬁxtures also results in reduced PCBA strain. • And the award for best DC power analyzer goes to… • Agilent joins LTE/SAE trial initiative Agilent’s N6705A DC power analyzer has taken home a bevy of awards from industry publications and organizations since its introduction in May 2007. Test & Measurement World named it 2008 Best in Test, while Electronic Products dubbed it 2007 Product of the Year. In addition, the power analyzer was honored with Design News’ 2007 Golden Mousetrap Award and was a ﬁnalist for the International Engineering Consortium’s 2008 Design Vision Award. The N6705A measures a device under test’s power consumption and does not require engineers to write any code for operation. It provides a variety of sourcing and measuring capabilities by combining up to four DC power supplies with digital multimeter (DMM), oscilloscope, arbitrary waveform generator, and data logger functionality. Agilent has joined the 3GPP Long Term Evolution/System Architecture Evolution (LTE/SAE) Trial Initiative for high-speed wireless broadband technology validation. The initiative veriﬁes LTE’s ability to achieve true broadband performance in mobile devices. It is divided into three main phases: proof of concept, interoperability and trial. Agilent will contribute LTE interoperability testing and ﬁeld trials for physical layer air interface testing through protocol layer test and network diagnostics. • Improved workﬂow features added to gene expression system Agilent’s gene expression bioinformatics system now features guided workﬂow features designed to improve the user experience. The GeneSpring GX 9.0 visualization and analysis system provides step-by-step guidance for major microarray platforms, including Agilent SurePrint, Affymetrix GeneChips and Illumina Beadchips. New workﬂow features enable users to ask detailed questions about complex data sets such as t-tests, two-way and three-way ANOVA tests and one-way post-hoc tests, injecting reliability into the gene identiﬁcation process. MATLAB is a U.S. registered trademark of The Math Works, Inc. Agilent Measurement Journal 5

Table of Contents Feed for the Digital Edition of Agilent Measurement Journal - Issue 5 - 2008

Agilent Measurement Journal Issue 5 Finding a New Path when Assumptions Break Down Contents Testing MIPI D-PHY Protocols Oscilloscope Firmware Update DNA Replication Joining the LTE/SAE Trial Initiative Testing Proteins Praise for DC Power Analyzer Scripting Features for AMDS Testing Hybrid PCBA Systems Improving the Gene Expression System Workflow Turning a “Good Enough” Test Strategy into One That’s Reliable, Repeatable and Traceable Understanding the Effects of Limited-Bandwidth Channels on Digital Data Signals Introducing the 3GPP LTE Downlink Validating the 26 Validating the Physical and Protocol Layers in DDR Memory Interfaces Understanding Total Jitter Measurements of Low Probabilities Using Behavioral-Model Simulation to Accurately Predict First-Order PLL Performance Creating Synchronous High-Frequency Sampling across Multiple Digitizers Overcoming the Challenges of Testing FlexRay Networks Understanding Operating Life and Repeatability of Electromechanical Switches and their Effect on Total Cost of Ownership Implementing Micro and Nano LC/MS Techniques for High Sensitivity Lipidomics Analysis

Agilent Measurement Journal - Issue 5 - 2008

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