Microwave Engineering Europe - July/August 2008 - (Page 31)

PRODUCTS 31 EDGE Evolution mobile system supports higher data rates claims to be the first system for measuring the RF Transmitter characteristics of EDGE Evolution base stations Alongside the evolution and spread of W-CDMA 3G mobile phone systems towards HSPA and beyond, the worlds most dominant mobile technology, GSM/EDGE, is also seeing increasing need to support higher data transmission speeds. In 2007, the 3GPP*2 body standardized the new EDGE Evolution (EGPRS2) speciﬁcations for increasing GSM/EDGE data rates, and services are expected to start next year. However, although R&D into EDGE Evolutioncompliant base stations, mobile terminals, devices, and components is well under way, there are still no complete measuring instruments supporting the tests of RF Transmitter characteristics required by the EGPRS2 standard and by related equipment manufacturers. To meet this urgent need for EDGE Evolution support, Anritsu has worked closely with the industry to develop the two new MX269013A and MX269013A-001 software packages for its MS269xA Signal Analyzer series. Installing the MX269013A GSM/EDGE Measurement Software and the MX269013A001 EDGE Evolution Measurement Software in the MS269xA Signal Analyzer series claims to turn it into the ﬁrst system for measuring the RF Transmitter characteristics of EDGE Evolution base stations, mobile terminals and devices and components. Installing these packages in the analyzer main frame eliminates the need for a PC to control measurement and achieves fast, accurate measurements with excellent reproducibility. Three key RF transmitter measurements are supported: modulation analysis; output RF spectrum measurement; power versus time measurement. Measurement of RF Tx characteristics usually requires time-consuming repeated modulation analyses and measurements of the output RF spectrum and power versus time characteristics. However, these software packages perform ten modulation analyses in 1.5 seconds, ten output RF spectrum measurements in about 2 seconds and ten power versus time measurements in about 2.5 seconds. www.mwee.com/208802759 3GPP LTE measurement application enables fast, automated LTE measurements Agilent has introduced a new 3GPP LTE measurement application for its X-Series signal analyzers. Claiming the industry’s most comprehensive embedded solution with hardkey/softkey and SCPI programming user interface, the measurement application brings physical layer testing of uplink (UL) and downlink (DL) LTE signals to the test rack. When coupled with the X-Series analyzers, it offers some of the fastest LTE measurements in the market, making it especially well-suited for use in automated testing during design validation and prototype production. The Agilent N9080A LTE measurement application, along with the X-Series analyzers, provides a more complete picture of LTE signal problems and their causes for better, faster design troubleshooting. It offers the same rich feature set as the LTE option found in the company’s industry-leading 89600 Vector Signal Analysis (VSA) software, but also puts comprehensive LTE signal analysis in the test rack with familiar automation tools like SCPI programming and LAN/ LXI compatible interfaces. As a result, the engineer spends more time validating designs and implementing tests, and less time learning programming tools and instrument interfaces. With its coverage of the latest 3GPP LTE standard, the N9080A enables effective analysis of UL and DL LTE signals, including singlechannel MIMO analysis, in a single option. As a result, engineers can make transmitter measurements on eNB (base station) and user equipment (mobile station) with considerable savings compared to other commercially available LTE software. The N9080A supports all LTE bandwidths and modulation formats per the latest 3GPP TS 36 standards. Specific modulation quality measurements include EVM per OFDM carrier, EVM per OFDM symbol, EVM per slot and EVM per Resource Block — a measurement unique to Agilent. These measurements help identify EVM performance per user, per radio frame, per sub-frame, per slot, per resource block, and per symbol. Selective analysis by channel, subcarrier or symbol help the engineer troubleshoot and uncover previously unseen errors. The LTE measurement application features a welldesigned user interface, including four simultaneous, user-selected displays. www.mwee.com/208802737 Microwave Engineering ● July/August 2008 ● www.mwee.com http://www.mwee.com/208802759 http://www.mwee.com/208802737 http://www.mwee.com

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Microwave Engineering Europe - July/August 2008 Contents News Comment Cover Feature: Effective EM Simulations with Micro−λ Resolution in Macro-λ Objects — General Huygens Box Implementation RF CMOS: Programmable Transceiver IC Minimises OEM Inventory for Femtocells CAD/EDA: Software-Defined Radio Platforms CAD/EDA: Cadence Enhances RF Verification While AWR Delivers an Improved Microwave Office How to Meet the Design Challenges of WiMAX Power Amplifiers Products Calendar

Microwave Engineering Europe - July/August 2008

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