Microwave Engineering Europe - October 2008 - (Page 43)

SYNTHETIC TEST 43 characteristics. If we also take into account the fact that fewer test stations with a smaller footprint and lower power requirement are needed, the economic advantage is undeniable. Future proof as a supporting element An additional item that needs to be carefully examined in the selection process is the degree to which both systems can manage obsolescence, adapt to new requirements, and be reconﬁgured to support multiple products and product lines over extended periods of time. Traditional rack-and-stack systems manage obsolescence with a “fork lift” approach, i.e., they are replaced. However, if one type of instrument is no longer made, even replacement becomes impossible and test procedure and test execution will have to be modiﬁed to accommodate a different instrument. As far as adapting to new requirements and reconﬁguring a traditional solution for different products/product lines, this is certainly possible as long as the new requirements fall within the performance envelope of the associated instruments. As an example, if a higher frequency of operation is needed for some or all measurements, all instruments involved must be able to support the extended frequency. Those instruments that do not will have to be replaced, even if just one measurement is involved at the higher frequency. Synthetic systems, on the other hand, are particularly ﬂexible when it comes to managing obsolescence and changing requirements. Since synthetic test solutions are measurement-based, as opposed to instrument-based, they are impervious to instrument obsolescence. When new measurements are needed, they can simply be coded within the synthetic test environment (as long as the performance envelope of the overall system supports them). If a new requirement translates into a measurement that falls outside of the existing envelope, all that is needed is to replace or add one or more modules whose characteristics — for example, higher frequency of operation — expand the system’s performance envelope to include the new measurement. How synthetic test is implemented for this particular case Once the selection of the optimal test environment type is made, there is still need to implement/customize the environment for the particular application. While it is possible for the end-user to purchase or develop various modules and software, and then attempt to build a synthetic system, there are Figure 4: Batch sequences with pass/ fail criteria. ready-made solutions that greatly simplify this process. One such solution is Aeroﬂex’s SMART^E (Synthetic Multifunction Adaptable Reconﬁgurable Test Environment). In this particular example, the SMART^E 5100 T-R module test environment (with operating frequency up to 40 GHz) was selected as the base environment for this test application (see Figure 1). The criteria that led to this customer selection were based not only on performance and cost of ownership/operation, but also on greatly reduced start-up costs. These included activities associated with the integration (not simple interfacing) of the DUT in the test environment and the conversion of the test plan into a series of executable test programs/ sequences. Typical tests conducted Some of the tests conducted on the T-R modules are: • Pout versus Pin • Total Absorbed Power • Harmonics • Noise Figure • Pulse Measurement • Recovery Time • S-parameters • Spurious • TOI (third order intercept) Figure 2 depicts a pulse-measurement screen capture while Figure 3 depicts a screen capture of the spectral/spurious measurement test. Cumulatively, all the tests listed above were automatically performed in a matter of minutes. Besides test reporting, SMART^E has also extensive test log and debug capabilities. For production test, batch sequences can also be used to speed up test activities, while still providing pass/fail criteria and results. Figure 4 illustrates such capabilities. Conclusions – what are customers saying The SMART^E 5100 T-R Module Test Environment’s ﬁrst large-scale adopters are two major mil-aero companies in Europe. This new test environment is being utilised by these companies for T-R module testing associated with synthetic aperture radars both for air defence and satellite systems. The performance, consistent results, and reliability of the equipment have been instrumental in supporting these companies’ integration and test schedule. The main features of interest for these particular customers have been speed, performance, ﬂexibility, re-conﬁgurability and ease of start-up activities. For these companies another very important selling point is that SMART^E comes as a turnkey system. This guarantees full operation at delivery and resolves all risks associated with equipment-DUT integration and start-up activities well before the test environment is delivered to customers. About the author Dr. Francesco Lupinetti is the CTO for Aeroﬂex Test Solutions and since 2006, the VP & GM of Aeroﬂex’s Synthetic Test Systems Division. In addition to Aeroﬂex, which he joined in 2000, Dr. Lupinetti’s background includes over 25 years of applied research, product and business development, and engineering and general management with companies such as Ericsson, Selex Communications, The MITRE Corporation, and Sandia National Laboratories. Dr. Lupinetti received his Ph.D.E.E, M.S.E.E., and B.S.E.E. while at Mississippi State University. Microwave Engineering ● October 2008 ● www.mwee.com 040-041-042-043_MWEE.indd 43 3/10/08 15:46:13 http://www.mwee.com

Table of Contents Feed for the Digital Edition of Microwave Engineering Europe - October 2008

Microwave Engineering Europe - October 2008 Contents Comment News Cover Feature: AWR's AXIEM Software Brings 3D Planar Electromagnetic (EM) Simulation "Up Front" RFID: Augmented Reality: Beyond RFID and QR Codes for Mobile Phone Platforms Filters & Frequency Synthesis ZigBee Goes Green with Support for Smart Energy Simplify Mobile Data Applications and Services Test Enabling the State-of-the-Art in Automatic Test Equipment National Physical Laboratory Test Facility Aids Development of Next-Generation Antennas Selecting the Synthetic Test Environment for Transmit-Receive (T-R) Modules in a Phased Array Radar System Products Calendar

Microwave Engineering Europe - October 2008

For optimal viewing of this digital publication, please enable JavaScript and then refresh the page. If you would like to try to load the digital publication without using Flash Player detection, please click here.