Microwave Engineering Europe - October 2008 - (Page 54) 54 PRODUCTS Programmable pulse pattern generators offer jitter insertion capabilities 8-channel analog front-end IC ideal for applications such as MIMO radio IQ Analog has claimed an industry first with the introduction of an 8-channel analog front-end IC for multi-channel wireless and communications applications such as MIMO radios. After three years of development, the IQA-F430 octal analog front-end (AFE) is currently fabricated in a 130-nm CMOS process, which will transition to 65-nm before the end of 2008. The IQA F430 AFE provides 8 independent 12-bit, 80-Msps analog-todigital converters (ADCs) and 8 independent 12-bit, 20-MHz bandwidth digitalto-analog converters (DACs) for the main signal paths and 8 auxiliary 12-bit, 300-Ksps ADCs and 8 auxiliary 12-bit, 300-Ksps DACs for ancillary functions. Designed to replace multichip solutions, the F430, for example, can replace a typical MIMO configuration that consists of 4 x 2 channel AFEs with a single 8-channel chip, reducing cost, size and power consumption. www.mwee.com/210700031 Picosecond Pulse Labs (PSPL) has introduced the 12000 series of pulse/ pattern generators, which includes the Model 12000 165-MHz/20-Vpp, the Model 12010 800-MHz/2.5-Vpp, and the Model 12020 1.6-GHz/2.5-Vpp generator. Each of these instruments has fully programmable pulse and pattern capabilities with numerous user selectable modes of operation. In addition, the 12000 series generators share a similar mechanical configuration and include both a front panel GUI interface and GPIB/USB programmability. Applications for the generators include serial data, semiconductor (e.g. pulsed IV device testing), and general purpose high-speed pulse testing. The Model 12000 generator features up to 40 V output with programmable risetime and repetition rates from 1 mHz to 165 MHz (3 ns to 1000 s pulse duration). It offers extensive user programmability with adjustable risetime, amplitude, offset, period, duration, delay, load impedance, and source impedance (50 or 1k). In addition, the 12000 has the ability to perform channel add by summing the output of channels 1 and 2. It is available with either 1 or 2 channels configured for either rear or front panel output. The 12010 and 12020 instruments feature extensive serial data testing capabilities, including an option for builtin jitter insertion, 16 Mbit of memory depth per channel, and spread spectrum clocking. The built-in jitter insertion option is a novel feature for a pattern generator in this price/performance range and it allows the user to test circuit response to intentional timing perturbations. These built-in jitter capabilities include multiunit interval (UI) sinusoidal jitter, random jitter, and deterministic jitter injection. Both instruments are available with either 1 or 2 output channels with or without jitter insertion capability. www.mwee.com/210605487 5 W GaN-on-Si RF power transistor with expanded performance data Nitronex has expanded the performance data of its 28 V, 5 W class high electron mobility transistor (HEMT) to include frequencies between 5.1 to 5.2 GHz and 5.7 to 5.8 GHz. Designated the NPTB00004, it achieves 27 dBm (400 mW) average output power at 2 percent EVM in 5.2 GHz WiMAX systems, and 28 dBm (630 mW) average output power at 2 percent EVM in 5.8 GHz WiMAX systems (single carrier OFDM, 64QAM ¾, 8 burst, 20 ms frame, 15 ms frame data, 3.5 MHz channel bandwidth, peak/avg of 10.3 dB). The NPTB00004 transistors are packaged in a costeffective plastic over-molded PO150S (similar to a SOIC8) package with an exposed thermal pad. The NPTB00004 transistors are lead-free and RoHS compliant. www.mwee.com/210700088 Peak power meters deliver wide bandwidth, high sampling rate Anritsu Company has introduced the ML2480B series of wideband peak power meters that combine a 20-MHz bandwidth and 64 MS/s sampling rate that allow the instruments to conduct highly accurate peak power measurements on next-generation wireless and military communications signals. These power meters are well suited for evaluating chipsets, modules, handsets, customer premise equipment (CPE), and basestations during R&D and manufacturing. The ML2480B consists of two power meters — the ML2487B and ML2488B — that are designed to measure average power, peak power, and crest factor, as well as provide statistical analysis of complex modulated signals. The ML2487B supports single sensor input while the ML2488B supports dual sensor inputs. The dual-channel sensor input and display of the ML2488B allow for the simultaneous monitoring of WLAN and Bluetooth-enabled devices, and provide critical testing for the co-existence of multiple standards. Further simplifying operation is a remote GUI, PowerMax, which provides an enhanced visualization of instrument display and streamlines remote control. It displays measurement results for up to eight gates and up to four marker readings simultaneously. EuMW 2008 Exhibitor: Stand 811 www.mwee.com/210603122 Microwave Engineering Europe ● October 2008 ● www.mwee.com 054_MWEE.indd 54 6/10/08 16:24:05 http://www.mwee.com/210700031 http://www.mwee.com/210700088 http://www.mwee.com/210605487 http://www.mwee.com/210603122 http://www.mwee.com
Table of Contents Feed for the Digital Edition of Microwave Engineering Europe - October 2008 Microwave Engineering Europe - October 2008 Contents Comment News Cover Feature: AWR's AXIEM Software Brings 3D Planar Electromagnetic (EM) Simulation "Up Front" RFID: Augmented Reality: Beyond RFID and QR Codes for Mobile Phone Platforms Filters & Frequency Synthesis ZigBee Goes Green with Support for Smart Energy Simplify Mobile Data Applications and Services Test Enabling the State-of-the-Art in Automatic Test Equipment National Physical Laboratory Test Facility Aids Development of Next-Generation Antennas Selecting the Synthetic Test Environment for Transmit-Receive (T-R) Modules in a Phased Array Radar System Products Calendar Microwave Engineering Europe - October 2008 Microwave Engineering Europe - October 2008 - Microwave Engineering Europe - October 2008 (Page Cover1) Microwave Engineering Europe - October 2008 - Microwave Engineering Europe - October 2008 (Page Cover2) Microwave Engineering Europe - October 2008 - Microwave Engineering Europe - October 2008 (Page 3) Microwave Engineering Europe - October 2008 - Microwave Engineering Europe - October 2008 (Page 4) Microwave Engineering Europe - October 2008 - Microwave Engineering Europe - October 2008 (Page 5) Microwave Engineering Europe - October 2008 - Microwave Engineering Europe - October 2008 (Page 6) Microwave Engineering Europe - October 2008 - Contents (Page 7) Microwave Engineering Europe - October 2008 - Contents (Page 8) Microwave Engineering Europe - October 2008 - Comment (Page 9) Microwave Engineering Europe - October 2008 - News (Page 10) Microwave Engineering Europe - October 2008 - News (Page 11) Microwave Engineering Europe - October 2008 - News (Page 12) Microwave Engineering Europe - October 2008 - News (Page 13) Microwave Engineering Europe - October 2008 - News (Page 14) Microwave Engineering Europe - October 2008 - Cover Feature: AWR's AXIEM Software Brings 3D Planar Electromagnetic (EM) Simulation "Up Front" (Page 15) Microwave Engineering Europe - October 2008 - Cover Feature: AWR's AXIEM Software Brings 3D Planar Electromagnetic (EM) Simulation "Up Front" (Page 16) Microwave Engineering Europe - October 2008 - Cover Feature: AWR's AXIEM Software Brings 3D Planar Electromagnetic (EM) Simulation "Up Front" (Page 17) Microwave Engineering Europe - October 2008 - RFID: Augmented Reality: Beyond RFID and QR Codes for Mobile Phone Platforms (Page 18) Microwave Engineering Europe - October 2008 - RFID: Augmented Reality: Beyond RFID and QR Codes for Mobile Phone Platforms (Page 19) Microwave Engineering Europe - October 2008 - RFID: Augmented Reality: Beyond RFID and QR Codes for Mobile Phone Platforms (Page 20) Microwave Engineering Europe - October 2008 - RFID: Augmented Reality: Beyond RFID and QR Codes for Mobile Phone Platforms (Page 21) Microwave Engineering Europe - October 2008 - Filters & Frequency Synthesis (Page 22) Microwave Engineering Europe - October 2008 - Filters & Frequency Synthesis (Page 23) Microwave Engineering Europe - October 2008 - Filters & Frequency Synthesis (Page 24) Microwave Engineering Europe - October 2008 - Filters & Frequency Synthesis (Page 25) Microwave Engineering Europe - October 2008 - ZigBee Goes Green with Support for Smart Energy (Page 26) Microwave Engineering Europe - October 2008 - ZigBee Goes Green with Support for Smart Energy (Page 27) Microwave Engineering Europe - October 2008 - Simplify Mobile Data Applications and Services Test (Page 28) Microwave Engineering Europe - October 2008 - Simplify Mobile Data Applications and Services Test (Page 29) Microwave Engineering Europe - October 2008 - Simplify Mobile Data Applications and Services Test (Page 30) Microwave Engineering Europe - October 2008 - Simplify Mobile Data Applications and Services Test (Page 31) Microwave Engineering Europe - October 2008 - Enabling the State-of-the-Art in Automatic Test Equipment (Page 32) Microwave Engineering Europe - October 2008 - Enabling the State-of-the-Art in Automatic Test Equipment (Page 33) Microwave Engineering Europe - October 2008 - Enabling the State-of-the-Art in Automatic Test Equipment (Page 34) Microwave Engineering Europe - October 2008 - Enabling the State-of-the-Art in Automatic Test Equipment (Page 35) Microwave Engineering Europe - October 2008 - National Physical Laboratory Test Facility Aids Development of Next-Generation Antennas (Page 36) Microwave Engineering Europe - October 2008 - National Physical Laboratory Test Facility Aids Development of Next-Generation Antennas (Page 37) Microwave Engineering Europe - October 2008 - National Physical Laboratory Test Facility Aids Development of Next-Generation Antennas (Page 38) Microwave Engineering Europe - October 2008 - National Physical Laboratory Test Facility Aids Development of Next-Generation Antennas (Page 39) Microwave Engineering Europe - October 2008 - Selecting the Synthetic Test Environment for Transmit-Receive (T-R) Modules in a Phased Array Radar System (Page 40) Microwave Engineering Europe - October 2008 - Selecting the Synthetic Test Environment for Transmit-Receive (T-R) Modules in a Phased Array Radar System (Page 41) Microwave Engineering Europe - October 2008 - Selecting the Synthetic Test Environment for Transmit-Receive (T-R) Modules in a Phased Array Radar System (Page 42) Microwave Engineering Europe - October 2008 - Selecting the Synthetic Test Environment for Transmit-Receive (T-R) Modules in a Phased Array Radar System (Page 43) Microwave Engineering Europe - October 2008 - Products (Page 44) Microwave Engineering Europe - October 2008 - Products (Page 45) Microwave Engineering Europe - October 2008 - Products (Page 46) Microwave Engineering Europe - October 2008 - Products (Page 47) Microwave Engineering Europe - October 2008 - Products (Page 48) Microwave Engineering Europe - October 2008 - Products (Page 49) Microwave Engineering Europe - October 2008 - Products (Page 50) Microwave Engineering Europe - October 2008 - Products (Page 51) Microwave Engineering Europe - October 2008 - Products (Page 52) Microwave Engineering Europe - October 2008 - Products (Page 53) Microwave Engineering Europe - October 2008 - Products (Page 54) Microwave Engineering Europe - October 2008 - Products (Page 55) Microwave Engineering Europe - October 2008 - Products (Page 56) Microwave Engineering Europe - October 2008 - Products (Page 57) Microwave Engineering Europe - October 2008 - Calendar (Page 58) Microwave Engineering Europe - October 2008 - Calendar (Page Cover3) Microwave Engineering Europe - October 2008 - Calendar (Page Cover4)
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