Conformity Magazine - March 2008 - (Page 39)

While the JEDEC and ESDA standards are similar in many ways there are several features that differ, as illustrated in Table 1. The result is that failure levels measured with the different standards can not be considered equivalent. This is in contrast to HBM and MM where the standards issued by the different organizations are similar enough that test results can be considered directly comparable. One of the main differences is that JEDEC requires a 0.381mm thick insulator on the field plate while ESDA requires either no insulator or a very thin insulator. The capacitance CDUT will therefore be larger for a system built for the ESDA standard. Each standard specifies a pair of calibration modules to be used for waveform verification. The modules and the required waveform parameters are different for the two standards. The JEDEC modules are coin shaped disks while ESDA uses a metal film on top of a 0.8mm thick sheet of an FR-4 circuit board. Summary FCDM is an extremely valuable test method for insuring that integrated circuits can survive in a modern, automated manufacturing environment. The test method creates a capacitance that scales with DUT size and a low impedance discharge path, providing a good simulation of real CDM events. The two leading FDCM standards, JEDEC and ESDA, are very similar but have differences in their details that make their test results somewhat different. While the ESDA stress is often considered more severe, there is no simple correlation factor between the test results. Robert Ashton is a senior protection and compliance specialist at ON Semiconductor, and can be reached at Robert.Ashton@onsemi.com. References 1. JEDEC, “Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components”, JESD22-C101C Dec. 2004, JSSTA. ESDA, “ESD Association Standard Test Method STM5.3.1-1999”, ESD Association, 1999. B.C. Atwood, Y. Zhou , D. Clarke, T Weyl, “Effect of Large Device Capacitance on FICDM Peak Current” EOS/ESD Symposium, 2007. AEC “Charged Device Model (CDM) Electrostatic Discharge (ESD) Test” AEC - Q100-011 Rev-B July 18, 2003. 2. 3. 4. FAST Link www.conformity.com/1550 marCh 2008 Conformity 39 http://www.conformity.com/1550

Table of Contents Feed for the Digital Edition of Conformity Magazine - March 2008

Conformity Magazine - March 2008 NewsBreaks Editor's Note Adelstein Renominated to the FCC Industry Canada Publishes FAQs On RF Fields FDA Gives Its Scientific Capabilities Poor Marks FDA Offers Guidance On its Product Review Process FDA Publishes Updates to List of Recognized Standards FDA Warns of Patient Risk From Electric Dental Handpieces Complying with the EMC Directive, Second Edition ESD Open Forum Emerging Issues in Standards - Korean "RoHS": Not Like RoHS at All The iNARTE Informer Challenges in Testing - Field-Induced Charged Device Model: What Really Happens Design Fundamentals - EMI Shielding Technologies for Consumer Electronics Equipment Focus On...Compliance Software Buyer's Guide Additional Standards Published for the EU's ATEX Directive Additional Standards for the EU's Medical Devices Directive Also Published China to Require Bar Codes to Enhance Product Safety CPSC Releases 2007 Self-Assessment CPSC Actions in News IEC Standards Update UL Standards Update Product Reviews Telcordia Standards Update From Our "You Can't Make This Stuff Up" Department Looking Back: Items from Past Issues of Conformity Advertisers

Conformity Magazine - March 2008

For optimal viewing of this digital publication, please enable JavaScript and then refresh the page. If you would like to try to load the digital publication without using Flash Player detection, please click here.