Conformity Magazine- May 2008 - (Page 20) ESD TR20.20-2000, ESD Handbook This document provides guidance that can be used for developing, implementing, and monitoring an electrostatic discharge control program in accordance with ANSI/ESD S20.20. It also includes ESD ADV1.0-2004, Glossary of Terms. This document was formerly ESD ADV2.0. ESD TR50.0-01-99, Can Static Electricity be Measured? Author: Niels Jonassen, Technical University of Denmark 36 Pages ESD TR50.0-02-99, High Resistance Ohmmeters—Voltage Measurements Authors: Steve Gerken, USAF; Ron Gibson, Celestica International; John Kinnear, IBM 3 Pages ESD TR15.0-01-99, ESD Glove and Finger Cots Author: E.W. Chase, Electro-Tech Systems, Inc. 10 Pages ESD TR13.0-01-99, EOS Safe Soldering Iron Requirements Authors: G. Baumgartner, Lockheed Martin Missiles & Space – Retired, ESD West Consulting; Jack S. Smith, Lockheed Martin Advanced Technology Center 19 Pages ESD TR2.0-01-00, Consideration for Developing ESD Garment Specifications Author: G. Baumgartner, ESD West Consulting 30 Pages ESD TR2.0-02-00, Static Electricity Hazards of Triboelectrically Charged Garments Author: M. Manders, USAF 8 Pages ESD TR14.0-01-00, Calculation of Uncertainty Associated with Measurement of Electrostatic Discharge (ESD) Current Authors: Working Group 14, Simulators; ESD Association 18 Pages ESD TR5.3.2-01-00, Socket Device Model (SDM) Tester Authors: Working Group 5.3.2, Socket Device Model; ESD Association 22 Pages ESD TR5.4-01-00, Transient Induced Latch-Up (TLU) Authors: Working Group 5.4, Transient Latch-Up; ESD Association 27 Pages ESD TR5.2-01-01, Machine Model (MM) Electrostatic Discharge (ESD) Investigation—Reduction in Pulse Number and Delay Time Authors: M. Kelly, Delphi Delco Electronics; J. Mick, Intel Corporation; M. Chaine, Micron Technology; B. Carey, Agere Systems 27 Pages ESD TR55.0-01-04, Electrostatic Guidelines and Considerations for Cleanrooms and Clean Manufacturing Authors: T. Albano, Eastman Kodak; B. Baumgartner; ESD West; D. Bellmore, Universal Instrument; R. Benson, Clarient Technologies; D. Boehm, Novx; E. Davis, Vidaro Corporation; V. Gross, IBM; J. Hamlin, Qualcom; K. Kim, BF Goodrich SCP; W. Metz, Hewlett Packard; C. Newberg, River’s Edge Technical Service; J. Salisbury, Semtronics Corporation; A. Steinman, Ion Systems; G. Williams, Semtronics Corporation 26 Pages ESD TR1.0-01-01, Survey of Constant (Continuous) Monitors for Wrist Straps Authors: B. Beamer, Static Control Components; D. Boehm, Novx Corporation; J. Brodbeck, USAF; L. Burich, Lockheed Martin; C. Checketts, Motorola; S. Koehn, 3M; J. Mann, Protective Solutions; J. Salisbury, Semtronics 11 Pages ESD TR3.0-01-02, Alternate Techniques for Measuring Ionizer Offset Voltage and Discharge Time Authors: Richard Rodrigo, Simco; Arnold Steinman, Ion Systems; Merle Weight, Unisys; Donn Bellmore, Universal Instruments; Tim Jarrett, Guidant (CPI); Carl Newberg, River’s Edge; Dale Parkin, IBM; Donn Pritchard, Trek; Jeff Salisbury, Semtronics; Julius Turangan; Western Digital 11 Pages ESD TR10.0-01-02, Measurement and ESD Control Issues for Automated Equipment Handling of ESD Sensitive Devices Below 100 Volts Authors: Joe Bernier, Intersil; Tom Albano, Eastman Kodak; Don Boehm, Dou Yee Enterprises; John Kinnear, IBM; Donn Pritchard, Trek, Inc.; Craig Zander, Restronics ; Donn Bellmore, Universal Instruments; Brent Howard, Shuttleworth; Charles Perry, Monroe Electronics; Arnold Steinman, ION Systems 11 Pages ESD TR4.0-01-02, Survey of Worksurfaces and Grounding Mechanisms Authors: Dale Parkin, IBM; Ryne Allen, Desco; Brent Beamer, Static Control Components; Julius Brodbeck, USAF; Larry Burich, Lockheed Martin; Tim Jarrett, Guidant Corp.; Steve Koehn, 3M; Mike Manders, USAF; Dennis Rivers, Denclare Technologies; Bill Ricker, Kewaunee Scientific 16 pages ESD TR50.0-03-03, Voltage and Energy Susceptible Device Concepts, Including Latency Considerations Author: Ben Baumgartner, ESD West Consulting 26 Pages ESD TR3.0-02-05, Selection and Acceptance of Air Ionizers Authors: Rick Rodrigo, Simco; Donn Bellmore, Universal Instruments Corp.; Timothy Jarrett, Guidant Corporation, Niels Jonassen, Technical University of Denmark; Carl Newberg, MicroStat Laboratories; Maciej Noras, Trek, Inc.; Dale Parkin, IBM; Jeff Salisbry, Seagate Technology; Arnold Steinman, Ion Systems, Inc; Julius Tureangan, Western Digital 17 pages Table 4: ESD Association Technical Reports 20 Conformity mAy 2008
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