Conformity Magazine - September 2007 - (Page 23)

ESD Open Forum References • EIA/JEDEC, EIA/JESD78A “IC Latch-Up Test,” February 2006 • ANSI/ESD SP5.5.1-2004 Electrostatic Discharge Sensitivity Testing Transmission Line • Pulse (TLP) Component Level; ESD Association, Rome, NY • ESD TR5.4-01-00 Transient-Induced Latch-up Technical Report; ESD Association, Rome, NY • IEC61000: Electromagnetic Compatibility (EMC); Part 4-2: Testing and Measurement Techniques – Electrostatic Discharge Immunity Test; Basic EMC Publication, ESD Association, Rome, NY About the Author Tom Meuse is currently the Product Line Manager at ThermoFisher Scientific, for their ESD/Latch-up simulator product lines. He has worked for ThermoFisher Scientific (formally KeyTek) for over 28 years and has focused on ESD and Latch-up system development and customer technological development. Mr. Meuse is a member of the ESD Association and the chair of Device Level Working Group 5.4 TLU (Transient Latch-up). He became chair of the Working Group, after the departure of Gary Weiss from Lucent, who had championed the development of TLU. He is also a member of JEDEC’s JC-14 device level work groups, where he participates in the development on the device level standards. About the ESD Association Founded in 1982, the ESD Association is a not for profit, professional organization directed by volunteers dedicated to furthering the technology and understanding of electrostatic discharge. The Association sponsors educational programs, develops ESD standards, holds an annual technical symposium, and fosters the exchange of technical information among its members and others. Additional information may be obtained by contacting the ESD Association, 7900 Turin Rd., Bldg. 3, Rome, NY 13440-2069 USA. Phone: 315-339-6937. Fax: 315-339-6793. Email: info@esda.org. Website: http://www.esda.org. Figure 7: Example of Latch-up failure using Combined Bias/Stimulus TLU (Idealized Oscilloscope Graph) Figure 8: Example of Latch-Up failure using Combined Bias/Stimulus TLU (Actual Oscilloscope Plot) September 2007 Conformity 23 http://www.esda.org

Table of Contents Feed for the Digital Edition of Conformity Magazine - September 2007

Contents Editor’s Note FCC Extends Disability Access Requirements to VOIP Commission Fines Importer $3 Million Over Non-Compliant TVs FCC Gets Tough on Retailers Over Analog TV Tuner Labeling Analog Cellular Service Sunset Date Reaffirmed Commission Adopts Recommendations of Katrina Panel Free-Space Antenna Factors Through the Use of Time-Domain Signal Processing Editorial Correction ESD Open Forum An Update on Revisions to IEC 61000-4-2, the Basic Standard on ESD Practical Advice for Meeting the DFS Testing Requirements of the FCC The EMC Impact of Embedded Software ESD Design Buyer's Guide Tate Renominated to the FCC EPA Releases Report on U.S. Electronic Waste Additional Standards For The EU’s Toy Directive Medical Device Manufacturer Enters Consent Order Updated Guidance Document on Laser Products Issued FDA Offers Advice on Defective Heating Pads CPSC Issues China Product Safety Program Report Other CPSC Actions In The News IEC Standards Update Product Reviews Product News UL Standards Update From Our “You Can’t Make This Stuff Up” Department Looking Back: Items from Past Issues of Conformity Advertisers

Conformity Magazine - September 2007

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