Conformity - November 2008 - (Page 26) Challenges in Testing by Cai Qing, Jayong Koo, Argha Nandy, and David Pommerenke, Missouri University of Science and Technology, and Jong Sung Lee and Byong Su Seol, Samsung Electronics Editor’s Note: The paper on which this article is based was originally presented at the 2008 IEEE EMC Society Symposium, where it received recognition as the Best Symposium Paper. It is being reprinted here, with permission, from the proceedings of the 2008 IEEE International Symposium on Electromagnetic Compatibility. Copyright 2008 IEEE. ystem level ESD tests can only be performed after hardware is available. Simulating the ESD coupling into a circuit allows at least parametric and quantitative studies of the expected ESD behavior. A complete simulation requires us to model the ESD generator, the passive elements of the DUT and the response of the ICs to injected noise. Having the ultimate objective of combining IC soft error response models with the DUT structure and the ESD generator, we report on progresses in modeling the ESD generator and its coupling. The model improves the useful frequency range from a few hundred MHz to about 3 GHz. Introduction The prediction of ESD behavior is a complex problem. Its source modeling spans from low frequency charge distribution, over high voltage breakdown physics, to problems that can only be understood by antenna theory. The victim modeling usually requires modeling of passive structures, like cables, PCBs and, for the prediction of IC 2 Conformity november 2008 S response, some level of IC immunity models. IC immunity models are a topic of research and are in general not available. However, one can characterize modules of a system (e.g., an LCD) using direct injection of immunity scanning methods and obtain a sensitivity limit, expressed in injected currents or induced voltages for a module at an interface. Having such data available, the need for detailed (e.g., 8-layer) PCB modeling of a module maybe reduced, such that it is possible to model a complex system as a system of cable connected blocks. This simplifies the simulation of the system. Besides the system, the ESD generator needs to be simulated. A variety approaches are possible, most simply using forced injected currents as provided in the ESD standard [1], over equivalent circuit models [2] to full wave models [2]-[5]. Only the full wave models are able to predict the field coupling. The field coupling is essential, especially for soft-error prediction, as they are often caused by the frequency components of ESD transient fields greater than 1 GHz. © Bobbie Sandlin | Dreamstime.com Advanced Full-Wave ESD Generator Model for System-Level Coupling Simulation http://www.Dreamstime.com
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