Conformity - November 2008 - (Page 53)

Vendor Directory Buyer’s Guide Product Safety Equipment Naptech Test Equipment Inc. (707) 995-7145 www.naptech.com Narda Safety Test Solutions, an L-3 Communications Company (631) 231-1700 www.narda-sts.us National Instruments (800) 258-7022 www.ni.com/rf Noise Laboratory Co., Ltd. 81 042 712 2051 www.noiseken.com Pearson Electronics Inc. (650) 494-6444 www.pearsonelectronics.com Praxsym, Inc. (217) 897-1744 www.praxsym.com Prostat Corporation (630) 238-8883 www.prostatcorp.com QuadTech, Inc. (800) 253-1230 www.quadtech.com R. A. Mayes Company, Inc (303) 761-9447 www.ramayes.com Rohde & Schwarz (410) 910-7800 www.rohde-schwarz.com Ross Engineering Corp. (408) 377-4621 www.rossengineeringcorp.com Saelig Company Inc (585) 385-1750 www.saelig.com Seaward Group USA (813) 886-2775 www.seaward-groupusa.com Slaughter Company, Inc. (847) 932-3662 www.hipot.com Solar Electronics Company (818) 755-1700 www.solar-emc.com Sotcher Measurement Inc. (408) 734-1774 www.sotcher.com Storage Battery Systems, Inc. (262) 703-5800 www.sbsbattery.com Sypris Test and Measurment (978) 663-2137 www.sypris.com Tektronix, Inc. (503) 627-7111 www.tektronix.com Test Equipment Solutions Today (650) 577-8877 www.testsolu.com TUV Rheinland of North America, Inc. (203) 426-0888 www.us.tuv.com TUV SUD America Inc. (978) 573-2500 www.TUVamerica.com Valuetronics International (847) 468-8258 www.valuetronics.com Vican Electronics (416) 412-2111 www.vican.ca Vitrek Corporation (858) 689-2755 www.vitrek.com ETS-Lindgren (512) 531-6400 www.ets-lindgren.com Fischer Custom Communications, Inc. (310) 303-3300 www.fischercc.com GfG Instrumentation, Inc. (734) 769-0573 www.gfg-inc.com Ground Zero Electrostatics (941) 751-7581 www.gndzero.com Haefely EMC (845) 279-3644 X262 www.haefelyemc.com HV TECHNOLOGIES, Inc. (703) 365-2330 www.hvtechnologies.com Interfax Systems Inc. (416) 674-8970 www.interfaxsystems.com Ion Physics Corporation (603) 895-5100 www.ionphysics.com ITC Engineering Services, Inc. (925) 862-2944 www.itcemc.com Kikusui America, Inc. (650) 259-5900 www.kikusui.us LabX (Auctions) (705) 528-6888 test.labx.com Liberty Labs Inc. (712) 773-2199 www.liberty-labs.com MetricTest (510) 264-0887 www.metrictest.com november 2008 Conformity 53 http://www.ets-lindgren.com http://www.naptech.com http://www.hipot.com http://www.solar-emc.com http://www.fischercc.com http://www.narda-sts.us http://www.sotcher.com http://www.gfg-inc.com http://www.ni.com/rf http://www.sbsbattery.com http://www.gndzero.com http://www.noiseken.com http://www.sypris.com http://www.haefelyemc.com http://www.pearsonelectronics.com http://www.tektronix.com http://www.hvtechnologies.com http://www.praxsym.com http://www.testsolu.com http://www.interfaxsystems.com http://www.prostatcorp.com http://www.ionphysics.com http://www.us.tuv.com http://www.quadtech.com http://www.itcemc.com http://www.TUVamerica.com http://www.ramayes.com http://www.kikusui.us http://www.valuetronics.com http://www.rohde-schwarz.com http://test.labx.com http://www.vican.ca http://www.rossengineeringcorp.com http://www.liberty-labs.com http://www.vitrek.com http://www.saelig.com http://www.metrictest.com http://www.seaward-groupusa.com Table of Contents for the Digital Edition of Conformity - November 2008Conformity - November 2008ContentsEditor’s NoteAirwaves Exchange Will Market Unused FrequenciesMortgage Service Company Gets $400,000 Fine for Junk FaxesFCC Releases Report on Numbering Resource UtilizationHeirman Receives Lord Kelvin AwardIET Issues New Guid on EMC for Functional SafetyOSHA Consistently Reduces Fines for Workplace HazardsWhich Cell Phones Are Safest?The State of Antenna Calibration Standards in the United States Using ANSI C63.5ESD Open ForumChallenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling SimulationiNARTE InformerChallenges in Testing: Applying E78 to Semiconductor Wafer ChambersEmerging Issues in Standards:�Alternative Energy Standards and Electrical Safety TestingProduct Safety Test Equipment Buyer's GuideWireless Medical Systems May Pose Patient RiskFDA Increases Medical Device User Fees for FY 2009Updated Standards List for "New" Low Voltage DirectiveNew Standards List Released for the EU's Machinery DirectiveUpdated Standards List for the EU's ATEX Directive ReleasedCPSC Actions in the NewsProduct ReviewsIEC Standards UpdateUL Standards UpdateTelcordia Standards UpdateFrom Our "You Can't Make This Stuff Up"�DepartmentLooking Back:�Items from Past Issues of ConformityAdvertisersConformity - November 2008Conformity - November 2008 - Conformity - November 2008 (Page Cover1)Conformity - November 2008 - Conformity - November 2008 (Page Cover2)Conformity - November 2008 - Conformity - November 2008 (Page 3)Conformity - November 2008 - Contents (Page 4)Conformity - November 2008 - Contents (Page 5)Conformity - November 2008 - Editor’s Note (Page 6)Conformity - November 2008 - Editor’s Note (Page 7)Conformity - November 2008 - Editor’s Note (Page 8)Conformity - November 2008 - Editor’s Note (Page 9)Conformity - November 2008 - FCC Releases Report on Numbering Resource Utilization (Page 10)Conformity - November 2008 - Which Cell Phones Are Safest? (Page 11)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 12)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 13)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 14)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 15)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 16)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 17)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 18)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 19)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 20)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 21)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 22)Conformity - November 2008 - The State of Antenna Calibration Standards in the United States Using ANSI C63.5 (Page 23)Conformity - November 2008 - ESD Open Forum (Page 24)Conformity - November 2008 - ESD Open Forum (Page 25)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 26)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 27)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 28)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 29)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 30)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 31)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 32)Conformity - November 2008 - Challenges in Testing:�Advanced Full-Wave ESD Generator Model for Systems-Level Coupling Simulation (Page 33)Conformity - November 2008 - iNARTE Informer (Page 34)Conformity - November 2008 - iNARTE Informer (Page 35)Conformity - November 2008 - Challenges in Testing: Applying E78 to Semiconductor Wafer Chambers (Page 36)Conformity - November 2008 - Challenges in Testing: Applying E78 to Semiconductor Wafer Chambers (Page 37)Conformity - November 2008 - Challenges in Testing: Applying E78 to Semiconductor Wafer Chambers (Page 38)Conformity - November 2008 - Challenges in Testing: Applying E78 to Semiconductor Wafer Chambers (Page 39)Conformity - November 2008 - Challenges in Testing: Applying E78 to Semiconductor Wafer Chambers (Page 40)Conformity - November 2008 - Challenges in Testing: Applying E78 to Semiconductor Wafer Chambers (Page 41)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 42)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 43)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 44)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 45)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 46)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 47)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 48)Conformity - November 2008 - Emerging Issues in Standards:�Alternative Energy Standards and Electrical Safety Testing (Page 49)Conformity - November 2008 - Product Safety Test Equipment Buyer's Guide (Page 50)Conformity - November 2008 - Product Safety Test Equipment Buyer's Guide (Page 51)Conformity - November 2008 - Product Safety Test Equipment Buyer's Guide (Page 52)Conformity - November 2008 - Product Safety Test Equipment Buyer's Guide (Page 53)Conformity - November 2008 - Updated Standards List for the EU's ATEX Directive Released (Page 54)Conformity - November 2008 - Product Reviews (Page 55)Conformity - November 2008 - UL Standards Update (Page 56)Conformity - November 2008 - Looking Back:�Items from Past Issues of Conformity (Page 57)Conformity - November 2008 - Advertisers (Page 58)Conformity - November 2008 - Advertisers (Page Cover3)Conformity - November 2008 - Advertisers (Page Cover4)http://www.nxtbook.com/nxtbooks/conformity/0309http://www.nxtbook.com/nxtbooks/conformity/0209http://www.nxtbook.com/nxtbooks/conformity/0109http://www.nxtbook.com/nxtbooks/conformity/1208http://www.nxtbook.com/nxtbooks/conformity/1108http://www.nxtbook.com/nxtbooks/conformity/1008http://www.nxtbook.com/nxtbooks/conformity/0908http://www.nxtbook.com/nxtbooks/conformity/0808http://www.nxtbook.com/nxtbooks/conformity/0708http://www.nxtbook.com/nxtbooks/conformity/0608http://www.nxtbook.com/nxtbooks/conformity/0508http://www.nxtbook.com/nxtbooks/conformity/0408http://www.nxtbook.com/nxtbooks/conformity/2008annualguidehttp://www.nxtbook.com/nxtbooks/conformity/0308http://www.nxtbook.com/nxtbooks/conformity/0208http://www.nxtbook.com/nxtbooks/conformity/0108http://www.nxtbook.com/nxtbooks/conformity/1207http://www.nxtbook.com/nxtbooks/conformity/1107http://www.nxtbook.com/nxtbooks/conformity/1007http://www.nxtbook.com/nxtbooks/conformity/0907http://www.nxtbook.com/nxtbooks/conformity/0707http://www.nxtbook.com/nxtbooks/conformity/0607http://www.nxtbook.com/nxtbooks/conformity/0507http://www.nxtbook.com/nxtbooks/conformity/0407http://www.nxtbook.com/nxtbooks/conformity/2007annualguidehttp://www.nxtbook.com/nxtbooks/conformity/0307http://www.nxtbook.com/nxtbooks/conformity/0207http://www.nxtbook.com/nxtbooks/conformity/0107http://www.nxtbook.com/nxtbooks/conformity/1206http://www.nxtbook.com/nxtbooks/conformity/1106http://www.nxtbook.com/nxtbooks/conformity/mediakit07http://www.nxtbook.com/nxtbooks/conformity/1006http://www.nxtbook.com/nxtbooks/conformity/0906http://www.nxtbook.com/nxtbooks/conformity/0806http://www.nxtbook.com/nxtbooks/conformity/0706http://www.nxtbook.com/nxtbooks/conformity/0506http://www.nxtbook.com/nxtbooks/conformity/0306http://www.nxtbook.com/nxtbooks/conformity/0106http://www.nxtbookMEDIA.com

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