EETimes India - November 16, 2008 - (Page 3)

Trends Data acquisition shuns wires continued from page 1 sensor market is fragmented with many small vendors providing niche solutions based on a seemingly endless variety of protocols. For example, a company with expertise in temperature measurements may provide wireless RTD sensors based on the IEEE 802.15.4 standard, while another company with expertise in machine diagnostics may provide wireless vibration sensors based on a proprietary 900 MHz protocol. Further complicating matters is the fact that most of these solutions only provide some fixed-function, data-logging software. When you must have multiple types of measurements in the same application, it can be difficult or even impossible to incorporate data from two vendors. This issue has been addressed by National Insutruments by partnering with several vendors to create a library of wireless sensor instrument drivers for NI LabVIEW. Instrument drivers provide a consistent API and programming experience, regardless of the sensor vendor. Why Wi-Fi? PC-based data acquisition provides a broad range of measurement capabilities for everything from simple thermocouple readings to dynamic accelerometer signals. Recently, measurement needs have included a wireless component in addition to the same breadth of I/O. By taking the same approach to wireless as with ISA, PCI Express, and USB, you can deliver a standardsbased, reliable solution. Wi-Fi is the next bus for data acquisition. Wi-Fi (IEEE 802.11) has become the de-facto standard for wireless infrastructure in the IT sector, because of its reliability and security. In data acquisition, you can leverage IEEE 802.11g for high bandwidth measurements and IEEE 802.11i (WPA2) for the highest commercially available security. With up to 54Mbps bandwidth, for instance, NI WiFi data acquisition devices can stream measurements on each channel at over 50 kS/s with 24 bits of resolution. In addition, the IEEE 802.11i standard provides advanced network authentication methods and 128-bit AES data encryption, so engineers can add Wi-Fi data acquisition devices to existing enterprise networks while maintaining the highest level of security. Hardware, software impact One important consideration for the adoption of Wi-Fi data acquisition is how much it will impact scientists and engineers in terms of having to redesign their existing applications. Any addition to a measurement system typically involves both hardware and software modifications. Such a requirement is minimised by using the IEEE 802.11 wireless standard and repurposing existing IT infrastructure for measurement applications. Wi-Fi data acquisition devices must be compatible with most enterprise network installations, supporting the most common authentication and encryption methods. From a software standpoint, an open platform like LabVIEW is needed for incorporating measurements from any instrumentation bus. Ideally, Wi-Fi data acquisition devices should not require any software change, and should be able to use the same measurement services and driver software as hundreds of other PCI, PXI and USB devices. This combination of wireless standard-based data acquisition and an open software development platform simplifies the addition of wireless measurements to new or existing applications. Online Segmented memory improves DAQ FPGAs, multi-core, PCIe advance virtual test Datasheets Online Looking for parts to specify for your design project? Browse through thousands of datasheets organised by category, by manufacturer, and alphabetically. Search using keywords or part number to quickly access datasheets. Part No. DRV401 LM3824 AD8556 LT5504 NGP8203N LM75 TMS320C32 AC2626 LT6600-5 MGSF1N02L Description Sensor signal conditioning IC for closed-loop magnetic current sensor (Rev. A) Precision current gauge IC with internal zero Ohm sense element, PWM output Digitally programmable sensor signal amplifier with EMI filters 800MHz to 2.7GHz RF measuring receiver Ignition IGBT 20A, 400V, N-channel TO-220 Digital temperature sensor and thermal watchdog with two-wire interface TMS320C32 DSP (Rev. C) General purpose temperature probe Very low noise, differential amplifier and 5MHz low-pass filter Power MOSFET 750mA, 20V Manufacturer Texas Instruments National Semiconductor Analog Devices Linear Technology ON Semiconductor National Semiconductor Texas Instruments Analog Devices Linear Technology ON Semiconductor Get more Datasheets Online… EE Times-India | November 16-30, 2008 | www.eetindia.com http://www.eetindia.co.in/SEARCH/SUMMARY/technical-articles/encryption.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/ART_8800504318_1800003_TA_25be9100.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/ART_8800504346_1800003_TA_77b3642c.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/DRV401-1000045043.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/LM3824-1000025827.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/AD8556-1000039864.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/LT5504-1000042257.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/NGP8203N-1000037582.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/LM75-1000026093.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/TMS320C32-1000048404.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/AC2626-1000039154.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/LT6600-5-1000042345.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/DETAIL/MGSF1N02L-1000026744.HTM?ClickFromNewsletter_081116 http://www.eetindia.co.in/DATASHEET/INDEX.HTM?ClickFromNewsletter_081116 http://www.eetindia.com/STATIC/REDIRECT/Newsletter_081116_EETI02.htm?ClickFromNewsletter_081116

Table of Contents Feed for the Digital Edition of EETimes India - November 16, 2008

EETimes India - November 16, 2008 Contents Farnell Embedded System Eases Rail Maintenance National Semiconductor Working With IT for Networked DAQ Digital Telemetry Advances Torque Measurement Events

EETimes India - November 16, 2008

For optimal viewing of this digital publication, please enable JavaScript and then refresh the page. If you would like to try to load the digital publication without using Flash Player detection, please click here.