<rss version="2.0" xmlns:content="http://purl.org/rss/1.0/modules/content/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>HEARST / PROJECTTEST</title><link>http://www.nxtbook.com</link><pubDate>Wed, 15 Apr 2009 11:50:34 -0700</pubDate><language>en-us</language><description></description><item><title>Project Test - April 2009 - Digital Edition - ONLINE NOW!</title><description>Table of Contents Feed for the Digital Edition of Project Test - April 2009</description><link>http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php</link><pubDate>Wed, 15 Apr 2009 13:21:33 -0700</pubDate><guid isPermaLink="true">http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php</guid><content:encoded><![CDATA[<p><pre>Your digital edition of Project Test - April 2009 is available now. Clicking on the Table of Contents will deliver you directly to that page of your issue. Thank you for reading!</pre><br /><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=Cover1">-&nbsp;Project Test - April 2009</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=2">-&nbsp;Contents</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=3">-&nbsp;Viewpoint</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=4">-&nbsp;About Keithley</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=5">-&nbsp;Fundamentals of Semiconductor C-V Measurements</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=12">-&nbsp;Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure Instrumentation</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=19">-&nbsp;Trends in RF Testing</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=24">-&nbsp;Solutions for Testing MEMS Devices at the Wafer Level</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=29">-&nbsp;Taking the Measure of Pulse Generators</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=32">-&nbsp;TEST News</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=34">-&nbsp;DMM Reference Guide</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=35">-&nbsp;Video—2600 System SourceMeter</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=35">-&nbsp;Resources</a><br />
<a target="_blank" href="http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php?startid=36">-&nbsp;Featured Products</a><br />
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