Evaluation Engineering - December 2008 - (Page 10) PRODUCT BRIEFING Enhanced Test Development Software Creates Libraries ATEasy 7.0, the latest version of the test development software and test executive environment, features a Library Wizard that creates a Library DLL project. Export commands permit generating .vb/.h header files with prototypes of the functions exported by the DLL so they can be called from C or Visual Basic languages. Additional enhancements consist of support for ATML test results and test description, a window for debugging a multithreaded application, a command that displays batch-build dialog for selecting multiple workspace projects for build, and back/forward navigation commands. The 7.0 software supports .NET and all versions of LabView v7.0 to v8.6 and controls USB RAW or TMC devices using IO tables or the internal library. New IDE options include binary and test format default file saving, a set of predefined variables for external tools arguments, and an auto-recover function. The Development Environment Automation Server provides access to some of the IDE functionality. Geotest-Marvin Test Systems, www.rsleads.com/812ee-201 Scope Analysis Tool Extracts Eye Diagram Data The SDA 7 Zi Oscilloscope with SDA II includes IsoBER™, an analysis tool that extrapolates the eye diagram data and displays the lines of bit error rate directly on the eye. This helps to determine the minimum eye opening and is instrumental in detecting crosstalk by analyzing the vertical eye closure. The scope also provides dual methods of decomposing jitter that are presented both numerically and with displays. QuickView has an intuitive eye and jitter breakdown master display, measures at speeds up to 50 times faster than other oscilloscopes, and integrates compliance testing and SDA II debugging tools. The SDA 7 Zi Oscilloscopes, based on the company’s WavePro® 7 Zi Series, feature a 15.3-inch, 16:9 high-definition display with a touch screen. LeCroy, www.rsleads.com/812ee-203 Dual-Channel Supply Developed For Battery-Powered Devices The Model 2308 is a dual-channel battery- and charger-simulating power supply for high-speed testing of battery-power devices. It maintains a stable output voltage in response to pulse loads with a transient voltage drop of <90 mV and a transient recovery time of <35 µs and features functionality for both production test and R&D. The portable battery/charger simulator can change range and make a power line cycle measurement in 27 ms. Four current ranges span 5 A to 5 mA and resolutions are from 100 µA to 0.1 µA. Pulses as narrow as 50 µs are measured with integrating A/D technology. The power supply also has an analog output to enable analysis of load current details including the startup sequence and all operating modes. Keithley Instruments, www.rsleads.com/812ee-202 Unit Combines DSO And DMM Capabilities The Model S2505 integrates a battery-operated, dual-channel, 5-MHz bandwidth DSO with a 50MS/s sampling rate and a 10,000-count true rms DMM with datalogging memory to 17,000 points. The DSO also provides ±3% vertical accuracy, 512-B record length in singleshot/glitch capture and 256 B in other modes, 1.0-µs to 5-s sweep rate, and 16 waveform and setup memory storage. The DMM offers six frequency measurement ranges from 100 Hz to 10 MHz, min/max/avg, trend plotting and go, no-go testing; four ranges from 1,000 mV to 1,000 VDC, five true rms ranges from 1,000 mV to 750 VAC, and four Ohms ranges from 5 kΩ to 5 MΩ. Also included are the rpm, duty-cycle, and pulsewidth functions. The S2505 ships with a USB cable and software. Protek Test and Measurement, www.rsleads.com/812ee-205 Continued on page 12 1 0 • E E • December 2008 www.e v al u a ti o n e n g i n e e r i n g . co m http://www.rsleads.com/812ee-201 http://www.rsleads.com/812ee-203 http://www.rsleads.com/812ee-202 http://www.rsleads.com/812ee-205 http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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