Evaluation Engineering - December 2008 - (Page 12) PRODUCT BRIEFING Switching Module Designed For USB Format The SMU4032 Switching Module is a compact, true instrumentation multiplexer powered by USB. It provides 35 differential inputs that can be configured on the fly into a single 35:1 differential multiplexer, a 16:4-wire multiplexer, four independent 8:1 differential multiplexers, two 16:1 differential multiplexers, or as a 64:1 single-ended switch. Thermal EMF errors are <1 µV; isolated power and relay drive minimize noise. Guarded/shielded construction supports high common-mode rejection, and an on-board microcontroller simplifies the user interface. The SMU4032 features a set of built-in self-test functions that includes the capability to check for relay bounce duration, shorted or open relay contacts, excessive contact resistance, and other critical diagnostics. A contact self-cleaning function also is included. Signametrics, www.rsleads.com/812ee-206 USB 3.0 Test Tools Verify Silicon Compliance A comprehensive test set for the new SuperSpeed pp USB 3.0 specification has been developed to ensure cifi interface IC and consumer prododuct compliance. ce. SuperSpeed USB, which operates at 5 Gb/s, will adopt a new physical layer using two chanannels to separate ate data transmisssions and acknowledgements. knowledgements This test solution for USB 3.0 includes the DSA71254 12-GHz or higher bandwidth oscilloscope for transmitter testing, the DPOJET with USB 3.0 setup files and transmit channel emulation for validation and debug, real-time Serial Data Link Analysis Software for transmitter channel emulation, the AWG7102 with receiver test patterns and receive channel emulation for receiver testing, and the DSA8200 Sampling Scope and iConnect software for interconnect testing. Tektronix, www.rsleads.com/812ee-207 Modules and Chassis Offer Fast Wireless Measurements New to the RF test arena are the PXIe-5663 Vector Signal Analyzer and the PXIe-5673 Vector Signal Generator complemented by the PXIe-1075 Chassis. The PXIe-5663 performs signal analysis from 10 MHz to 6.6 GHz with up to 50 MHz of instantaneous bandwidth. The PXIe-5673 delivers signal generation from 85 MHz to 6.6 GHz and up to 100 MHz of instantaneous bandwidth. The 18-slot, high-bandwidth PXIe-1075 features PCI Express lanes routed to every slot providing 1 GB/s per-slot bandwidth and 4 GB/s total system bandwidth. Wireless protocols can be developed and tested by reconfiguring the software using standard-specific LabVIEW toolkits or custom modulation algorithms. LabVIEW-based toolkits are available for many technologies including WiMAX, GPS, WCDMA, GSM, EDGE, broadcast video, 802.11, Bluetooth, OFDM, and MIMO. National Instruments, www.rsleads.com/812ee-204 Compact DSOs Support 20,000 History Memories The DLM2000 Series of compact mixed-signal oscilloscopes (MSOs) provides up to 500 MHz bandwidth, 2-GS/s sampling speed, and a memory up to 125 Mpoints. Six models make up the series: three with two channels and three with four, each group with 200-, 350-, and 500-MHz bandwidths. MSO operation is enabled on the four-channel models by converting the fourth channel of analog input to 8-bit logic so the instrument functions as a three-channel analog plus 8-bit logic MSO. Logic probes with individual bit threshold setting and 100-kΩ input impedance at 250 MHz complement the capability. Additional features include histogram and trending functions, up to 20,000 history memories, digital filtering, zoom windows, user-defined mathematics, and serial bus analysis. Yokogawa North America, www.rsleads.com/812ee-208 1 2 • E E • December 2008 www.e v al u a ti o n e n g i n e e r i n g . co m http://www.rsleads.com/812ee-206 http://www.rsleads.com/812ee-207 http://www.rsleads.com/812ee-204 http://www.rsleads.com/812ee-208 http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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