Evaluation Engineering - December 2008 - (Page 3) DECEMBER 2008, VOL. 47, NO. 12 CON TENTS I N S T R U M E N TAT I O N 20 C-V Measurements Fundamentals of Semiconductor C-V Measurements by Lee Stauffer, Keithley Instruments 26 Nanoelectronics Test Nano-Measurements Need Mega-Care by Tom Lecklider, Senior Technical Editor SOFTWARE 14 Test Software Emerging Synthetic Instruments and IVI Driver Solutions by Hob Wubbena, Agilent Technologies C O M M U N I C AT I O N S T E S T 32 36 Communications Test Buyers Guide Product Guide Company Guide On Our Cover Designed by Nelson Publishing INSPECTION 38 Machine Vision Vision System Online Help by Tom Lecklider, Senior Technical Editor D E PA R T M E N T S 6 Editorial 8 Product Briefing 52 Index of Advertisers EMC 44 EMC Test The Importance of Antenna Calibration by Ron Bethel, ETS-Lindgren www.evaluationengineering.com EE-EVALUATION ENGINEERING (ISSN 0149-0370). Published monthly by Nelson Publishing, Inc., 2500 Tamiami Trail North, Nokomis, FL 34275-3482. Subscription rates: $152 per year in the United States; $168 per year in Canada/Mexico; International subscriptions are $195 per year (surface) and $315 per year (airmail). Current single copies, (if available) are $12 each (U.S.) and $15 each (international). Back issues, if available, are $15 each (U.S.) and $19 (international). Payment must be made in U.S. funds on a branch of a U.S. bank within the continental United States and accompany request. Subscription inquiries: Betty Johnson at 941-966-9521, Fax 941-918-9359 or subscriptions@nelsonpub.com. Title® registered U.S. Patent Office. Copyright© 2008 by Nelson Publishing, Inc. All rights reserved. No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage-and-retrieval system, without permission in writing from the publisher. Office of publication: Periodicals Postage Paid at Nokomis, FL 34275 and at additional mailing offices. Postmaster: Send address changes to EE-EVALUATION ENGINEERING, 2500 Tamiami Trail North, Nokomis, FL 34275-3482. www. ev alua t ion e n gin e e rin g.com December 2008 • EE • 3 http://www.evaluationengineering.com http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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