Evaluation Engineering - December 2008 - (Page 32) COMMUNICATIONS TEST BUYERS GUIDE Communications Test Buyers Guide EE’s annual Communications Test Buyers Guide is a comprehensive, up-to-date listing of the companies that specialize in communications test, including ATM; audio; CDMA/TDMA; fiberoptics; ISDN; mobile radio; PCS and video test equipment; bus, network, and protocol analyzers; cable and transmission testers; and power meters. The guide is arranged in two sections. First is a product/company cross-reference showing the types of equipment each company offers. The second section is an alphabetical listing of each company, the state or country it’s located in, the telephone number, and the website address. The guide can be accessed at www.evaluationengineering.com. L-com Connectivity Products LeCroy Pentek Spirent Communications Tektronix Yokogawa Corp. of America Agilent Technologies Product Guide Audio Test Equipment Agilent Technologies Audio Precision B+K Precision Boonton Electronics Comarco, Wireless Test Solutions GL Communications Global Specialties Global Test Solutions Harris Hermon Labs IXIA Keithley Instruments KineticSystems National Instruments NTI Americas OPTICOM Pentek Prism Media Products Rohde & Schwarz Stanford Research Systems Tektronix Anritsu Berkeley Varitronics Systems Finisar GL Communications Hermon Labs LeCroy LitePoint Microtronix Systems National Instruments Pentek Rohde & Schwarz Tektronix CDMA/TDMA Test Equipment Aeroflex Aeroflex/Weinschel Agilent Technologies Anritsu AR RF/Microwave Instrumentation Berkeley Varitronics Systems Bird Technologies Boonton Electronics Comarco, Wireless Test Solutions GAO Tek Giga-tronics GL Communications Hermon Labs JDSU Keithley Instruments Micronetics National Instruments Pentek Praxsym Rohde & Schwarz Setcom Wireless Spirent Communications Tektronix ZK Celltest Fiber-Optics Testers Agilent Technologies Berkeley Nucleonics Circadiant Systems dBm Optics Digital Lightwave Extech Instruments, a FLIR Co. Fluke Networks Frederick Engineering GAO Tek GL Communications Harris IXIA JDSU Keithley Instruments L-com Connectivity Products OptiConcepts Yokogawa Corp. of America Bus Analyzers Agilent Technologies Ballard Technology Finisar GL Communications ITCN KineticSystems LeCroy North Hills Signal Processing Total Phase VMETRO Yokogawa Corp. of America Bit Error Rate Testers Aeroflex Agilent Technologies Anritsu Finisar Fluke Networks Frederick Engineering GAO Tek GL Communications JDSU National Instruments SyntheSys Research Yokogawa Corp. of America Cable Testers Aeroflex Aeroflex/Weinschel Agilent Technologies Anritsu Extech Instruments, a FLIR Co. Fluke Networks GAO Tek Global Specialties Global Test Solutions JDSU L-com Connectivity Products North Hills Signal Processing Praxsym Spirent Communications GPS Test Equipment Aeroflex Aeroflex/Weinschel Agilent Technologies GAO Tek GL Communications Keithley Instruments LitePoint National Instruments Praxsym Rohde & Schwarz Spectracom Spirent Communications Ethernet Test Equipment Circadiant Systems Digital Lightwave Finisar Fluke Networks Frederick Engineering GAO Tek GL Communications IXIA JDSU JFW Industries Bluetooth Test Equipment Aeroflex Agilent Technologies Continued on page 34 3 2 • E E • December 2008 www.e v al u a ti o n e n g i n e e r i n g . c o m http://www.evaluationengineering.com http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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