Evaluation Engineering - December 2008 - (Page 33) Overachiever. NEW mixed-signal scope series with advanced features starting at $2580 NEW NEW MSO/DPO2000 Series with serial and mixed-signal debug features MSO4000/DPO4000 Series Bandwidth Analog Channels Digital Channels Record Length Display 350 MHz to 1 GHz 2, 4 16 (MSO4000 Series) 10 M on all channels 10.4 inch DPO3000 Series Bandwidth Analog Channels Digital Channels Record Length Display 100 MHz to 500 MHz 2, 4 — 5 M on all channels 9.0 inch NEW! MSO2000/DPO2000 Series Bandwidth Analog Channels Digital Channels Record Length Display 100 MHz to 200 MHz 2, 4 16 (MSO2000 Series) 1 M on all channels 7.0 inch Serial Bus Trigger I2C, SPI, RS-232/422/485/UART, CAN, LIN, FlexRay and Decode Serial Bus Trigger I2C, SPI, RS-232/422/485/UART, CAN, LIN and Decode Serial Bus Trigger I2C, SPI, RS-232/422/485/UART, CAN, LIN and Decode At that price point, you’d expect the new addition to the MSO/DPO family to have modest goals. Don’t tell that to the MSO/DPO2000 Series. You see, with up to 200-MHz bandwidth, 1 GS/s sample rate, and as many as 4 analog and 16 digital channels, it’s more than ready for mixed-signal debug. It even offers advanced features like Wave Inspector® for navigating long records and automatic decode of serial buses just like the other members of the family, the DPO3000 and MSO/DPO4000 Series. With a heritage like that, the MSO/DPO2000 Series is sure to exceed expectations. See more. Try the virtual product demo at: www.tektronix.com/moreforless Visit www.rsleads.com/812ee-020 © 2008 Tektronix, Inc. All rights reserved. Tektronix products are covered by U.S. and foreign patents, issued and pending. TEKTRONIX and the Tektronix logo are registered trademarks and Wave Inspector is a trademark of Tektronix, Inc. http://www.rsleads.com/812ee-020 http://www.rsleads.com/812ee-020 http://www.rsleads.com/812ee-020
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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