Evaluation Engineering - December 2008 - (Page 34)

COMMUNICATIONS TEST BUYERS GUIDE Mobile Radio Test Equipment Base Stations Aeroﬂex Aeroﬂex/Weinschel Agilent Technologies Anritsu AR Modular RF Bird Technologies Comarco, Wireless Test Solutions GL Communications Keithley Instruments Micronetics National Instruments Pentek Praxsym Rohde & Schwarz Setcom Wireless Spirent Communications Tektronix Setcom Wireless Spirent Communications Network Analyzers Aeroﬂex Agilent Technologies Anritsu Bird Technologies Comarco, Wireless Test Solutions Digital Lightwave Finisar Fluke Networks Frederick Engineering GAO Tek GL Communications ITCN IXIA JDSU Newtons4th North Hills Signal Processing OMICRON Lab Rohde & Schwarz Stanford Research Systems Tektronix Yokogawa Corp. of America Frederick Engineering GAO Tek Harris JDSU OptiConcepts Yokogawa Corp. of America Power Meters Aeroﬂex Agilent Technologies Anritsu AR RF/Microwave Instrumentation Berkeley Varitronics Systems Bird Technologies Boonton Electronics dBm Optics Digital Lightwave Extech Instruments, a FLIR Co. GAO Tek Giga-tronics Global Specialties Global Test Solutions Harris ILX Lightwave JDSU Keithley Instruments Krytar Micronetics National Instruments Newtons4th Praxsym Rohde & Schwarz TEGAM Yokogawa Corp. of America KineticSystems National Instruments Newtons4th North Hills Signal Processing Pentek Praxsym Prism Media Products Rohde & Schwarz Stanford Research Systems SyntheSys Research Tektronix Yokogawa Corp. of America Mobile Radio Test Equipment Handsets Aeroﬂex Aeroﬂex/Weinschel Agilent Technologies AR Modular RF GAO Tek Keithley Instruments National Instruments Rohde & Schwarz Tektronix Signal Sources Aeroﬂex Agilent Technologies Anritsu B+K Precision Boonton Electronics Circadiant Systems Extech Instruments, a FLIR Co. GaGe GAO Tek Giga-tronics Global Specialties Global Test Solutions Gordon Kapes Harris JDSU Keithley Instruments KineticSystems National Instruments Newtons4th North Hills Signal Processing Pentek Praxsym Prism Media Products Programmed Test Sources Rohde & Schwarz Spectracom Stanford Research Systems TEGAM Tektronix Optical Time-Domain Reﬂectometers Agilent Technologies Anritsu Digital Lightwave Fluke Networks Looking For An RF Tight Test Environment? Protocol Analyzers Aeroﬂex Agilent Technologies Ballard Technology Ellisys Finisar Frederick Engineering GAO Tek GL Communications Hermon Labs ITCN IXIA JDSU LeCroy Rohde & Schwarz Setcom Wireless Spirent Communications Tektronix Total Phase TraceSpan Communications VMETRO ✔ Wireless Device Testing! ✔ Perfect for 802.11a,b,g,n! ✔ Cellular, PCS, GSM Testing! ✔ Bluetooth®, RFID, 3G® Testing! ✔ Super Isolation Up To 18 GHZ! ✔ Wide Variety of Interface Options! ✔ Automatic Safety RF Inhibit Models! ✔ Clustered Rack Mounted WAP Testing! ✔ Internal Radiation Test Fixture Models! ✔ Stock Models To Fit Your Custom Applications! Telecom Test Equipment Aeroﬂex Agilent Technologies B+K Precision Bird Technologies Boonton Electronics Comarco, Wireless Test Solutions dBm Optics Digital Lightwave Extech Instruments, a FLIR Co. Fluke Networks Frederick Engineering GAO Tek GL Communications Gordon Kapes Hermon Labs Signal Analyzers Aeroﬂex Agilent Technologies Anritsu B+K Precision Bird Technologies Boonton Electronics GaGe GAO Tek GL Communications Global Specialties Harris JDSU Keithley Instruments RAMSEY ELECTRONICS, LLC 590 Fishers Station Drive Victor, NY 14564 800-446-2295 585-924-4560 Trust YOUR RF Testing To Our Proven Patented Design! www.ramseytest.com Continued on page 36 Visit www.rsleads.com/812ee-015 3 4 • E E • December 2008 www.e v al u a ti o n e n g i n e e r i n g . c o m http://www.rsleads.com/812ee-015 http://www.rsleads.com/812ee-015 http://www.rsleads.com/812ee-015 http://www.evaluationengineering.com

Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008

Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers

Evaluation Engineering - December 2008

For optimal viewing of this digital publication, please enable JavaScript and then refresh the page. If you would like to try to load the digital publication without using Flash Player detection, please click here.