Evaluation Engineering - December 2008 - (Page 39) application stories. Even if the problem addressed isn’t exactly the same as yours, the information still can be useful. Prosilica, PPT Vision, Matrox Imaging, and Cognex are a few of the companies that regularly publish this kind of free material. Training programs are offered by many suppliers, sometimes conducted at your company and sometimes online. A few introductory courses are free, but generally you have to pay for training. Specific questions or problems can be dealt with by technical support engineers. Websites always give an e-mail address and sometimes a phone number for technical support. In addition, many sites list frequently asked questions and answers. Interactive design tools present a vendor’s products from the user’s point of view. Lens selection programs are a good example. In many of these, you are required to enter approximate dimensions for the field of view, working distance, and the smallest dimension that must be imaged. The number of camera pixels and the size of the sensor also affect lens choice. However, it’s very easy to enter values for which no lens is suitable, and selection programs that return “no lens found” are of little help. Instead, a few selection guides return the closest match. This is a great help to the novice machine vision developer who needs to become familiar with the interactions among the many parameters. For example, if you wanted to capture an image of a 1 m x 1 m object but with only a 100-mm working distance, a very large angle of view is implied. The closest match in this case might be a lens that required a 5-m working distance. Immediately, you can see that this is the specification causing a problem. It’s a matter of perspective—no pun intended. A product-specific selection matrix focuses on the available products, and you simply need to choose among them. In contrast, an interactive selection program that shows you the closest match is focused on your application: Tell us what you need to do, and we’ll see how close we can come to satisfying the requirements. In addition, because choices often are not independent, you need to understand the limitations implied by the rest of the vision system. For example, a major benefit of GigE Vision™ cameras is that a separate frame grabber isn’t required. Instead, camera data is transferred via gigabit Ethernet directly to the host PC. While this is an economical approach, it requires host processor bandwidth that may not be available. And, the performance of a real-time vision system can be affected by both the Windows operating system and a standard Ethernet network interface card (NIC). Continued on page 40 since 1996 Visit www.rsleads.com/812ee-022 www. ev alua t ion e n gin e e rin g.com December 2008 • EE • 39 http://www.rsleads.com/812ee-022 http://www.rsleads.com/812ee-022 http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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