Evaluation Engineering - December 2008 - (Page 40) MACHINE VISION Non-Telecentric Region Object Telecentric Region Object Image on Monitor a. Conventional Lens Comparison of Conventional and Telecentric Lenses Courtesy of Edmund Optics Object Image on Monitor a. Conventional Lens Object Software drivers that bypass the host operating system improve performance by directly accessing memory. Also, some special hardware incorporates frame grabber functionality and reduces host overhead, especially for multiple camera systems. Once an image has been transferred to the host, it needs to be analyzed. Vision software toolboxes from several manufacturers allow you to address a wide range of applications without being a programming expert. Often, you can download a demo version for evaluation. A particularly interesting approach is offered by SILICONSOFTWARE, in which users string together VisualApplets® to define a series of image operations. The VisualApplets actually are compiled modules based on lowerlevel operators from the company’s image processing library. You use the company’s synthesis program together with Xilinx place-and-route software to generate an FPGA layout for your custom machine vision system. Noteworthy Online Help Technical Notes The Viewbits Division of Computer Modules lists several cameras and states that CMOS sensors now are at least as good as CCD sensors. The site references an article on CMOS vs. CCD written by Rockwell Scientific. In it, the author explains that the SNR of CCD sensors has an inherent 3-dB/octave decrease as the readout rate is increased. In a CCD, charge is transferred from well to well during the readout process so each well must have a much higher bandwidth than is required to capture the image. According to the paper, the output from high-definition sensors with a high frame rate often is followed by a 30-MHz to 33-MHz filter to reduce noise. The very wide bandwidth of the CCD output amplifier is largely responsible for excessive thermal noise. In contrast, especially with submicron technology, CMOS sensors can separately amplify each pixel and have a much lower bandwidth. “The noise bandwidth [is reduced] from tens of megahertz for CCDs to tens of kilohertz for CMOS [sensors].”1 This means that the SNR associated with CMOS sensors can be much higher than that associated with CCD sensors used at high output data rates. CCD sensors are a mature technology so their production will not stop abruptly. Nevertheless, for many applications and especially where a high pixel rate is needed, CMOS sensors are performing better. Most importantly, CCD sensors require special silicon processing that’s not compatible with usual CMOS fabrication. Nevertheless, large CCD arrays used in lower-speed applications such as astronomy have excellent performance with SNR of approximately 120 dB. On the Melles Griot website, you can find the Machine Vision Lens Fundamentals technical note. It covers important aspects of lens operation and terminology. This is a good reference in general and especially useful for anyone just starting to work with machine vision. After reading this paper, at a minimum, you will know which questions must be answered before you can choose a lens. Because a large number of lens properties are discussed together with their effects, some of the trade-offs within your application should become more apparent. Edmund Optics® provides a great deal of lens-related information on the company’s site. Often, you can learn the basics from a well-illustrated paper written in plain English. For example, at the end of the white paper Will a 4 0 • E E • December 2008 www.e v al u a ti o n e n g i n e e r i n g . c o m http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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