Evaluation Engineering - December 2008 - (Page 51) DAQ, DATALOGGER, AND PAC PRODUCTS United Electronic Industries’ free product catalog describes its unique Ethernet-based I/O chassis, powerful deployment options, and extensive I/O configuration possibilities. The catalog also includes new products and application examples as well as the company’s PCI and PXI bus DAQ boards. United Electronics Industries, 781-821-2890, www. ueidaq.com/catalog Visit www.rsleads.com/812ee-378 SHIELDING CATALOG AND DESIGN GUIDE New catalog and design guide has the latest inspiration in EMI shielding including new EMI/Environmental Connector-Seal with patent-pending design, new shielded honeycomb fan filter providing up to 80-dB shielding at 1 GHz, and RoHS-compliant versions of all our gaskets. Visit www.spira-emi.com/whatsnew for free design guide, educational CD, samples. Spira Manufacturing Corp., 818-764-8222 Visit www.rsleads.com/812ee-376 HORN ANTENNA The AHA-118 Active Horn Antenna has an integrated preamplifier with a 25-dB nominal gain that improves noise performance for EMI emissions testing systems. The preamplifier is connected to antenna using an ng cable. The combination long cable, increasing cable loss, high antenna factors >1 GHz, reduces the signal level before it reaches preamplifier. Com-Power, 714-528-8800, www.com-power.com Visit www.rsleads.com/812ee-362 CONDUCTIVE ADHESIVES Master Bond’s electrically conductive adhesives are the number-one choice for the design of tomorrow’s advanced electrical circuitry. The line includes silver-, nickel-, copper-, and graphite-filled compounds. Both one- and two-component systems are available. The cured products offer high physical strength and superior substrate adhesion. Long-term durability is excellent. Master Bond, 201-343-8983, www.masterbond. com/produse/produse_ec.html Visit www.rsleads.com/812ee-372 MAGNETIC IMMUNITY AMPLIFIER Model 350AH1 (350 W, 10 Hz to1 MHz) Magnetic Immunity Amplifier for susceptibility testing automatically accepts 90 to 260 VAC in 47- to 63-Hz range. The amplifier has very low output impedance; for susceptibility testing for magnetic/audio frequency tests in MIL-STD-461D/E, D0160D/E, various automotive test standards. AR RF/Microwave Instrumentation, 215-723-8181, www.ar-worldwide.com Visit www.rsleads.com/812ee-361 TEST AND MEASUREMENT PRODUCT GUIDE Keithley’s 2009 product guide includes information on the company’s latest hardware and software innovations to address challenging test and measurement applications as well as informative tutorials and selector guides. To request your free copy, Keithley Instruments, 800-5889238, www.keithley.com/at/556 Visit www.rsleads.com/812ee-381 8-BIT DIGITIZERS New BASE-8TM digitizers for OEM customers requiring A/D conversion but need to keep the cost low. BASE-8 features a single digitizing channel with 8-bit resolution, 200MHz bandwidth, and up to 500 MS/s sampling. To off-load CPU intensive processing from the host PC, custom onboard eXpert TM (FPGA) signal processing functionality available. GaGe, 800-567-GAGE, www.gageapplied.com Visit www.rsleads.com/812ee-366 www. ev alua t ion e n gin e e rin g. com December 2008 • EE • 51 http://www.rsleads.com/812ee-378 http://www.rsleads.com/812ee-376 http://www.rsleads.com/812ee-362 http://www.rsleads.com/812ee-372 http://www.rsleads.com/812ee-361 http://www.rsleads.com/812ee-381 http://www.rsleads.com/812ee-366 http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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