Evaluation Engineering - December 2008 - (Page 52) TEST MANAGER SOFTWARE Pacific Power Source’s UPC Manager Software delivers exceptional control of UPC-equipped AC power sources, with its latest version incorporating the UPC Studio Test Manager feature. Test Manager provides operator controlled test routines, test plans, and reports in addition to controlling the AC power source output. Pacific Power Source, Inc., 800-854-2433, www. pacificpower.com Visit www.rsleads.com/812ee-384 COMPACTPCI/PXI SOLUTIONS Building upon more than 30 years of data acquisition experience, KineticSystems has added a complete line of CompactPCI/PXI data acquisition solutions to its data acquisition catalog including analog and digital I/O, relay multiplexers, counters and pulse output modules, mainframes/chassis, and digitizers. For more information, KineticSystems, 800-DATA-NOW, www.kscorp.com/ ee/pxi Visit www.rsleads.com/812ee-386 DYNAMIC SIGNAL ANALYZER 2/4/8/16 inputs and one signal source. Sample all inputs up to 102.4 kHz. 130-dB dynamic range. Continuous recording at full speed. FFT sizes up to 64k. FRF, Tri-Spectra, Octave, Order Tracking. Weighs 6 hours. 5.7" color LCD. Ethernet, USB, SD card, and wireless. Crystal Instruments, 408-986-8880, www.go-ci.com Visit www.rsleads.com/812ee-363 FIBER-OPTIC INFRARED TRANSMITTERS The OS4000 Series Industrial FiberOptic Infrared Transmitters measure 200°C to 1,600°C using three optical fields of view and fiber-optic cable lengths. Response time is 1 ms, emissivity adjustable from 0.05 to 0.99, built-in laser sighting for lens probe positioning, linear analog output, high/low alarm outputs, fiber-optic gain adjust. From $1,495. Omega Engineering, 203-3591660, www.omega.com Visit www.rsleads.com/812ee-385 CONDUCTED IMMUNITY TEST SYSTEM A new RF conducted immunity test system for MIL-STD 461D and E CS114, DO160D and E, EN/IEC 61000-4-6, IEC 60601-1-2, EN 50130-4, EN 61000-6-1/2, EN 55024. The self-contained Model CI00400 (10 kHz to 400 MHz) includes a signal generator, power meter, 100W AR amplifier, directional coupler, control software. AR RF/Microwave Instrumentation, 215-723-8181, www.ar-worldwide.com Visit www.rsleads.com/812ee-382 INDEX OF ADVERTISERS Advertiser Page 2009 IEEE International Symposium on Electromagnetic Compatibility 25 A H Systems Inc 50 Agilent Technologies 1 Agilent Technologies 13 Agilent Technologies 27 American Reliance, Inc 37 AR Worldwide 5 AR Worldwide 51 AR Worldwide 52 CheckSum LLC 6 Com-Power Corp. 51 Crystal Instruments 52 Data Translation 11 Elite Electronic Engineering Co. 49 EPIX Inc 41 ESSC 49 GaGe 52 Hioki USA Corp 50 HV Technologies, Inc. 50 Keithley Instruments 2 Keithley Instruments 49 Keithley Instruments 51 Kepco Inc. 49 Kikusui America 45 Kikusui America 49 Kinetic Systems 51 Master Bond Inc 51 National Instruments BC Noisecom 9 OMEGA Engineering Inc. 49 OMEGA Engineering Inc. 52 OMEGA Engineering Inc IFC Pacific Power Source Corp. 52 Pico Technology Ltd IBC Programmed Test Sources 35 Ramsey Electronics 34 Rohde & Schwarz 15 Saelig Company, Inc. 50 Scientific Test, Inc. 24 Scientific Test, Inc. 49 Spira Manufacturing Corp. 51 Stanford Research Systems, Inc. 7 Tech-Etch, Inc. 50 Tektronix, Inc 33 United Electronic Industries, Inc. 51 Universal Switching Corp 4 Vibration Test Systems 50 Virginia Panel Corp. 50 Vision Components 39 This index is provided as a service. The publisher does not assume liability for errors or omissions. 5 2 • EE • De ce mb e r 2008 www.e v al u a ti o n e n g i n e e r i n g . c o m http://www.rsleads.com/812ee-384 http://www.rsleads.com/812ee-386 http://www.rsleads.com/812ee-363 http://www.rsleads.com/812ee-382 http://www.rsleads.com/812ee-385 http://www.evaluationengineering.com
Table of Contents Feed for the Digital Edition of Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers Evaluation Engineering - December 2008 Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page Cover2) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 1) Evaluation Engineering - December 2008 - Evaluation Engineering - December 2008 (Page 2) Evaluation Engineering - December 2008 - Contents (Page 3) Evaluation Engineering - December 2008 - Contents (Page 4) Evaluation Engineering - December 2008 - Contents (Page 5) Evaluation Engineering - December 2008 - Editorial (Page 6) Evaluation Engineering - December 2008 - Editorial (Page 7) Evaluation Engineering - December 2008 - Product Briefing (Page 8) Evaluation Engineering - December 2008 - Product Briefing (Page 9) Evaluation Engineering - December 2008 - Product Briefing (Page 10) Evaluation Engineering - December 2008 - Product Briefing (Page 11) Evaluation Engineering - December 2008 - Product Briefing (Page 12) Evaluation Engineering - December 2008 - Product Briefing (Page 13) Evaluation Engineering - December 2008 - Test Software (Page 14) Evaluation Engineering - December 2008 - Test Software (Page 15) Evaluation Engineering - December 2008 - Test Software (Page 16) Evaluation Engineering - December 2008 - Test Software (Page 17) Evaluation Engineering - December 2008 - Test Software (Page 18) Evaluation Engineering - December 2008 - Test Software (Page 19) Evaluation Engineering - December 2008 - C-V Measurements (Page 20) Evaluation Engineering - December 2008 - C-V Measurements (Page 21) Evaluation Engineering - December 2008 - C-V Measurements (Page 22) Evaluation Engineering - December 2008 - C-V Measurements (Page 23) Evaluation Engineering - December 2008 - C-V Measurements (Page 24) Evaluation Engineering - December 2008 - C-V Measurements (Page 25) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 26) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 27) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 28) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 29) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 30) Evaluation Engineering - December 2008 - Nanoelectronics Test (Page 31) Evaluation Engineering - December 2008 - Product Guide (Page 32) Evaluation Engineering - December 2008 - Product Guide (Page 33) Evaluation Engineering - December 2008 - Product Guide (Page 34) Evaluation Engineering - December 2008 - Product Guide (Page 35) Evaluation Engineering - December 2008 - Company Guide (Page 36) Evaluation Engineering - December 2008 - Company Guide (Page 37) Evaluation Engineering - December 2008 - Machine Vision (Page 38) Evaluation Engineering - December 2008 - Machine Vision (Page 39) Evaluation Engineering - December 2008 - Machine Vision (Page 40) Evaluation Engineering - December 2008 - Machine Vision (Page 41) Evaluation Engineering - December 2008 - Machine Vision (Page 42) Evaluation Engineering - December 2008 - Machine Vision (Page 43) Evaluation Engineering - December 2008 - EMC Test (Page 44) Evaluation Engineering - December 2008 - EMC Test (Page 45) Evaluation Engineering - December 2008 - EMC Test (Page 46) Evaluation Engineering - December 2008 - EMC Test (Page 47) Evaluation Engineering - December 2008 - EMC Test (Page 48) Evaluation Engineering - December 2008 - EMC Test (Page 49) Evaluation Engineering - December 2008 - EMC Test (Page 50) Evaluation Engineering - December 2008 - EMC Test (Page 51) Evaluation Engineering - December 2008 - Index of Advertisers (Page 52) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover3) Evaluation Engineering - December 2008 - Index of Advertisers (Page Cover4)
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