Evaluation Engineering - December 2008 - (Page 8)

PRODUCT BRIEFING Test Solution Spans Digital and RF Domains The Digital Radio Frequency (DigRF) V4 digital serial bus between mobile baseband and RF chips is promoted by the Mobile Industry Processor Interface (MIPI) Alliance. Agilent’s test solution integrates DigRF V4 stimulus and protocol analysis tools into the company’s digital, RF, and wireless instruments. The Radio Digital CrossDomain Tester consists of the N5343A Exerciser Module and the N5344A Analysis Module, housed in small, modular N2X mainframes. The modular structure can accommodate future MIMO designs. Incorporated are the E5345A and E5346A active probing solutions with capacitive loading <0.15 pF, the N5345A Midbus Probe with Soft Touch technology, and the B5346A Flying Leads Probing Solutions. The test software environment includes protocol generation and analysis and interoperates with Signal Studio Software and 89600 Vector Signal Analysis Software. Agilent Technologies, www.rsleads.com/812ee-197 Power Source Displays Four Readings Simultaneously The 4-kVA 5040 AC Power Source provides a variable output voltage from 0 to 300 V and output frequencies from 40 to 450 Hz. The input voltage is 208 with an input frequency from 47 to 500 Hz. Four digital meters monitor voltage, current, frequency, and power or power factor simultaneously. Each parameter of voltage, current, and frequency is programmable via dedicated function keys. The 5040 has three programmable memories for test setup recall and features such as overcurrent foldback, overload current capacity, and an inrush current rating of four times the maximum current. It also includes a lockout key to disable front-panel operations, a test/reset key to activate and disable output, and programmable power-on settings. Associated Power Technologies, www.rsleads.com/812ee-199 Tool Suite Features JTAG Functional Emulation Test Version 6.6 of the ScanExpress Boundary Scan Tool Suite combines ScanExpress JTAG Emulation Test (JET) with the capabilities of ScanExpress TPG Test Development and ScanExpress Runner Test Execution Software. The JET method extends coverage beyond boundary scan techniques to every UUT signal accessible by onboard CPUs, including most of the remaining nonscanable, analog, and I/O port resources. It also runs fullspeed functional verification without requiring modifications to the circuit or its on-board firmware. The beneﬁts of ScanExpress JET, applicable for both the development and production phases, include improved test coverage and fault diagnostics; only one test station and GUI is required for boundary scan test, functional at-speed test, and in-system programming; fast device programming; and interactive control/visibility of the UUT resources. Corelis, www.rsleads.com/812ee-200 Remote Controller Applies JTAG/Boundary Scan Tests The RIC-1000 is the ﬁrst development in the company’s Remote Instrumentation Controller family that applies JTAG/boundary scan tests directly over the Internet. It connects locally to a circuit board or other UUT and remotely over Ethernet to a ScanWorks® Embedded Instrumentation Platform. The controller incorporates local intelligence and implements a client/server architecture in relation to a remote ScanWorks station. Each RIC can be assigned an IP address. For example, a test engineer at a ScanWorks station in the United States could apply tests via an RIC over the Internet on a circuit board being manufactured in Asia. The ScanWorks platform provides automation, access, and analysis tools to validate and test semiconductors, circuit boards, or entire systems during design, manufacturing/repair, and ﬁeld maintenance. ASSET® InterTech, www.rsleads.com/812ee-198 Continued on page 10 8 • E E • December 2008 www.e v al u a ti o n e n g i n e e r i n g . co m http://www.rsleads.com/812ee-199 http://www.rsleads.com/812ee-197 http://www.rsleads.com/812ee-198 http://www.rsleads.com/812ee-200 http://www.evaluationengineering.com

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Evaluation Engineering - December 2008 Contents Editorial Product Briefing Test Software C-V Measurements Nanoelectronics Test Product Guide Company Guide Machine Vision EMC Test Index of Advertisers

Evaluation Engineering - December 2008

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