NIWeek 2008 Conference Program - (Page 44)

TEST AND DATA ACQUISITION TRACK Identifying the Ideal Digital I/O Hardware for High-Speed Applications Applications requiring high-speed digital signals vary, including the implementation of standard or custom communication protocols, ASIC functional test, or high-speed digital video streaming. Explore some of these applications, identifying the appropriate NI hardware and software combinations. Scott Savage, Product Manager, National Instruments LabVIEW, NI TestStand, and PXI for Optimized Video Test Applications Learn how LabVIEW and NI TestStand, combined with PXI modular instrumentation, are used to build optimized analog and digital video test solutions including composite, component, HDMI, and digital video broadcast. Discuss testing challenges, especially in design validation and manufacturing, and view demonstrations on how to overcome these challenges. Birger Schneider, Director, microLEX Systems Wednesday, August 6 2:15 – 3:15 p.m. Room 17B Thursday, August 7 Integrating Custom I/O with LabVIEW FPGA Discuss the terminal block development kit and how to create custom front ends for LabVIEW FPGA. Example terminal block designs start with digital interfaces with simple I/O buffers and go to more complex analog examples with higher-speed ADCs. Matthew DeVoe, Hardware Engineer, and Kenneth Kelly, Senior Hardware Engineer, National Instruments 1:00 – 2:00 p.m. Room 17B Large-Scale System Deployment – Automating the Organization Examine best practices and the challenges of multisite, multicountry, and multicompany deployment of an automation platform based on LabVIEW and NI TestStand. Topics include customer deployments, enterprise systems interactions, software versions, offshore development, systematic requirements from different organizations, and the platform business case justification. Michael Weir, Test Automation Manager – Silicon Characterization, Texas Instruments Wednesday, August 6 3:30 – 4:30 p.m. Room 17A Introduction to LabVIEW FPGA for Test Applications From design validation to automated test equipment, all test systems benefit from the low-level I/O control and parallelism that FPGA hardware provides. Using FPGA chips as the primary interface to a device under test adds high-speed intelligence to your I/O. Learn how to use LabVIEW FPGA in high-performance test systems. Vineet Aggarwal, Product Manager, National Instruments Tuesday, August 5 1:00 – 2:00 p.m. Room 17B Maximize the Quality of Your Measurements Take a closer look at common misconceptions regarding computer-based test and measurement instrumentation and the need for calibration and traceability. Laura Ramirez, Staff Software Engineer, and Allison Sharp, Product Support Engineer, National Instruments Thursday, August 7 1:00 – 2:00 p.m. Room 17A Thursday, August 7 10:30 –11:30 a.m. Room 17B 44

Table of Contents Feed for the Digital Edition of NI Week 2008 Conference Program

Program Contents CONFERENCE HIGHLIGHTS Letter from Dr. James Truchard Keynote Presentations Conference Information Evening Activities Networking Activities Must-See and Hands-On Sessions TECHNICAL SUMMITS RF and Wireless Communications Summit Robotics Summit Sound and Vibration Summit Vision Summit SEASON GUIDE Embedded Design Track Industrial and Automation Track Software Development Techniques Track Test and Data Acquisition Track SPECIAL EVENTS Medical Device Workshop Training and Certification IEEE Wireless Hive Networks Conference Graphical System Design Achievement Awards EXHIBITION AND SPONSORS Exhibition Hall Floor Map National Instruments Product Showcase Pavilions Technology Theater Exhibitors Sponsors

NI Week 2008 Conference Program

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