NIWeek 2008 Conference Program - (Page 46)

TEST AND DATA ACQUISITION TRACK The Application of LabVIEW in a Large-Scale Physics Project The highest-power pulsed neutron facility, the Spallation Neutron Source, uses LabVIEW to measure beam parameters such as intensity and position. Learn how these instruments – when implemented on a variety of hardware including PCs, PXI, and CompactRIO – are interfaced to the EPICS-based control system and how engineers configure and maintain the hardware. Willem Blokland, Engineer, Oak Ridge National Laboratory Using Advanced Digital Test Capabilities in High-Performance Applications Hot Topic Modern semiconductor technology pushes the boundaries of digital test equipment, not only in clock rates but also voltage levels, communication protocols, and deep vector sizes. Learn the advanced features of NI high-speed digital instruments and how you can use them to perform advanced characterization and validation on complex integrated circuits. Scott Savage, Product Manager, National Instruments Thursday, August 7 Tuesday, August 5 2:15 – 3:15 p.m. Room 17A 2:15 – 3:15 p.m. Room 19A The Future of Wireless Technology for Data Acquisition Wireless technology offers the prospect of new portable and distributed measurement applications where cabling has previously been impractical. Several obstacles have hindered broad adoption of wireless technology in DAQ applications, however, including security, reliability, and integration with existing wired systems. Learn how to overcome these challenges with LabVIEW and technology from National Instruments. Charlie Stiernberg, Product Manager, National Instruments Using LabVIEW FPGA for Flexible Digital Audio Test Solutions Explore several LabVIEW FPGA development techniques using the NI PXI-7811R reconfigurable I/O device, and put the development in perspective of a complete digital audio test solution. Alain Moriat, System Development Engineer, microLEX Systems Tuesday, August 5 4:45 – 5:45 p.m. Room 17A Tuesday, August 5 Wednesday, August 6 4:45 – 5:45 p.m. 4:45 – 5:45 p.m. Room 14 Room 17B Using the PXI Platform for Semiconductor Validation Test ON Semiconductor has chosen the NI PXI platform to reduce the cost and increase the flexibility of its semiconductor validation tests. Learn how its engineers are saving space and lowering the cost of test systems on power management ICs and more. Amiri McCain, Design Evaluation Engineer, ON Semiconductor Wednesday, August 6 10:30 –11:30 a.m. Room 17A 46

Table of Contents Feed for the Digital Edition of NI Week 2008 Conference Program

Program Contents CONFERENCE HIGHLIGHTS Letter from Dr. James Truchard Keynote Presentations Conference Information Evening Activities Networking Activities Must-See and Hands-On Sessions TECHNICAL SUMMITS RF and Wireless Communications Summit Robotics Summit Sound and Vibration Summit Vision Summit SEASON GUIDE Embedded Design Track Industrial and Automation Track Software Development Techniques Track Test and Data Acquisition Track SPECIAL EVENTS Medical Device Workshop Training and Certification IEEE Wireless Hive Networks Conference Graphical System Design Achievement Awards EXHIBITION AND SPONSORS Exhibition Hall Floor Map National Instruments Product Showcase Pavilions Technology Theater Exhibitors Sponsors

NI Week 2008 Conference Program

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