NIWeek Preliminary Conference Program 2008 - (Page 18) TEST AND DATA ACQUISITION TRACK Advanced Data Acquisition Techniques with Intelligent DAQ Have you ever wanted more flexible triggering options, multirate sampling, or other tasks outside the capabilities of typical data acquisition (DAQ) devices? Intelligent DAQ features a user-defined FPGA for onboard processing and custom timing and triggering. Learn to customize your data acquisition device with R Series products and LabVIEW FPGA. Presented by National Instruments C Series Technology under the Hood Meet NI R&D engineers who design and work on the advanced technology behind NI C Series hardware. Learn how the technology allows the same module to go from a bus-powered USB device, to a synchronized desktop platform, to an advanced embedded control system – all with graphical FPGA development. Presented by National Instruments Deploying Real-World Wireless Solutions The field of remote monitoring and services is seeing significant innovation as new wireless technologies mature and come to market. Join a panel of NI and industry experts as they discuss lessons learned from deployed wireless solutions and best practices for developing wireless monitoring applications. Presented by National Instruments All about High-Speed Data Streaming Learn how to architect and program high-speed data streaming applications such as RF record and playback; IF and baseband IQ streaming; and high-speed digital test based on new high-throughput PXI and PXI Express instruments, chassis, and controllers. Discuss topics ranging from system-level considerations to module-specific characteristics. Presented by National Instruments Comprehensively Testing Complex Electronics Systems – Nintendo Wii Teardown Nintendo Wii is a next-generation gaming console competing with Xbox 360 and Sony PlayStation 3. Tear down a Nintendo Wii to explore its inner operations and understand how engineers use PXIbased systems to comprehensively test critical components. Presented by National Instruments Five Techniques for Reducing Measurement Noise Understanding an application within its electrical environment is important for ensuring accurate measurements. Ground loops, high-voltage transients, and electromagnetic radiation are examples of noise that can adversely affect a signal. Learn five techniques for reducing or eliminating the most common types of noise in a measurement system. Presented by National Instruments Head-to-Head High-Speed Bus Comparison: GPIB, PCI, PCI Express, USB, and Ethernet Engineers can choose from a variety of instrumentation buses for test and measurement. Compare the merits and strengths of PCI, PCI Express, GPIB, USB, and Ethernet/LAN in instrumentation. Learn about bandwidth, latency, communication overhead, and other performance measures. Also explore hybrid systems, which incorporate multiple bus technologies for maximum flexibility. Presented by National Instruments Avoiding Common Pitfalls in LXI Test Systems You plug the Ethernet cable into your LXI instrument. Now what? Learn how NI software and hardware reduce the complexity of LXI (LAN eXtensions for Instrumentation) system development. Presented by National Instruments DAQ 101 New data acquisition users can learn the basics of sensors, data acquisition devices, and software. View a step-by-step demonstration of the optimal tools and methods for achieving the most accurate measurements in the least amount of time. Presented by National Instruments Hands-On: Data Logging with LabVIEW SignalExpress and NI CompactDAQ Gain hands-on experience with the latest version of LabVIEW SignalExpress and the USB data acquisition system, NI CompactDAQ. Learn how easy it is to create a custom USB data logger with National Instruments tools. Presented by National Instruments Gain 10X Performance by Customizing LabVIEW Instrument Drivers Want to increase instrument performance? Interested in developing a common API for similar instruments? Learn the tips, tricks, and tactics to develop and customize LabVIEW instrument drivers. Also review an industry case study and view a demonstration. Presented by National Instruments Identifying the Ideal Digital I/O Hardware for High-Speed Applications Applications requiring high-speed digital signals vary, including the implementation of standard or custom communication protocols, ASIC functional test, or high-speed digital video streaming. Explore some of these applications, identifying the appropriate hardware and software combinations from the National Instruments product lines. Presented by National Instruments Introduction to Wireless Technologies Learn about the state of wireless communication and how this technology is changing the measurement and automation world. Explore the basic physics, theory, and practice of wireless communication in addition to an overview of the latest developments in key standards such as ZigBee, IEEE 802.15.4, and ISA SP100. Presented by National Instruments 18
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