NIWeek Preliminary Conference Program 2008 - (Page 19) Hot Topic TEST AND DATA ACQUISITION TRACK Power Monitoring with NI PACs With the growing demand of energy and energy storage needed for manufacturing, households, and even automotive applications, power quality has become a more integral measurement. Learn about power monitoring technology and how to use NI PACs to create a modular, flexible power quality and metering device. Presented by National Instruments LabVIEW, NI TestStand, and PXI for Optimized Video Test Applications Learn how LabVIEW and NI TestStand, combined with PXI modular instrumentation, are used to build optimized analog and digital video test solutions including composite, component, HDMI, and digital video broadcast. Discuss testing challenges, especially in design validation and manufacturing, and view demonstrations on how to overcome these challenges. Presented by National Instruments Presented by National Instruments Presented by Texas Instruments Maximize the Quality of Your Measurements Take a closer look at common misconceptions regarding computer-based test and measurement instrumentation and the need for calibration and traceability. Presented by National Instruments Techniques for Architecting Hybrid Test Systems A common test system management challenge is adding new technologies while balancing longevity and scalability. Learn how to optimize your system by incorporating multiple buses to form a hybrid multiplatform system. See how a well-defined modular hardware and software architecture helps you upgrade your system components as needed while maximizing your investment. Presented by National Instruments Presented by National Instruments Using Advanced Digital Test Capabilities in High-Performance Applications Modern semiconductor technology pushes the boundaries of digital test equipment, not only in clock rates but also voltage levels, communication protocols, and deep vector sizes. Learn the advanced features of NI high-speed digital instruments and how you can use them to perform advanced characterization and validation on complex integrated circuits. Presented by National Instruments 19 TECHNICAL TRACKS Large-Scale System Deployment – Automating the Organization Discuss best practices and the challenges of multisite, multicountry, and multicompany deployment of an automation platform based on LabVIEW and NI TestStand. Topics include customer deployments, enterprise systems interactions, software versions, offshore development, systematic requirements from different organizations, and justifying the platform business case. Synchronizing Measurements – From Across a PXI Backplane to Across the Globe Today you can synchronize modules in a single PXI chassis or across multiple PXI systems. Learn how to synchronize PXI and PXI Express systems by sharing timing information by both signal-based and time-based schemes using GPS, IEEE 1588, and IRIG. Discover the synchronization schemes engineers are developing for future systems. The Application of LabVIEW in a Large-Scale Physics Project The highest-power pulsed neutron facility, the Spallation Neutron Source, uses LabVIEW to measure beam parameters such as intensity and position. Learn how these instruments – when implemented on a variety of hardware including PCs, PXI, and CompactRIO – are interfaced to the EPICS-based control system and how engineers configure and maintain the hardware. Presented by Oak Ridge National Laboratory Using LabVIEW FPGA for Flexible Digital Audio Test Solutions Explore several LabVIEW FPGA development techniques using the NI PXI-7811R, and put the development in perspective of a complete digital audio test solution. Presented by microLEX The Future of Wireless Technology for Data Acquisition Wireless technology offers the prospect of new portable and distributed measurement applications where cabling has been impractical. The adoption of wireless in data acquisition applications is hindered by several obstacles including security, reliability, and integration with existing wired systems. Learn how to overcome these challenges with LabVIEW and new technology from National Instruments. Using the PXI Platform for Semiconductor Validation Test ON Semiconductor has chosen the NI PXI platform as a means of reducing cost and increasing flexibility of its semiconductor validation tests. Learn how its engineers are saving space and lowering the cost of test systems on devices from power management ICs to microprocessors. Presented by National Instruments
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