National Instruments Product Guide - 2008 - (Page 23) NI S Series Simultaneous Sampling Data Acquisition With a dedicated analog-to-digital converter (ADC) per channel, high-performing National Instruments S Series data acquisition (DAQ) devices are ideal for applications such as transient analysis; ultrasonic, radar, and sonar measurements; 42 V automotive applications; and industrial measurement and control. Up to 64 MS onboard memory Channel-to-channel isolation Dynamic signal measurement up to 5 MHz Learn more at ni.com/dataacquisition Benefits Eliminate Crosstalk Obtain higher absolute accuracy by avoiding the channel crosstalk caused by multiplexer charge injection. Preserve Phase Relationship With up to eight ADCs per device, simultaneous sampling DAQ preserves the phase relationship between input channels. Increase Data Throughput Expand your overall device data throughput by sampling at the maximum rate on every channel – stream up to 80 MB/s. NI R Series Intelligent DAQ National Instruments R Series DAQ devices feature user-defined, onboard processing for flexible system timing and triggering. An FPGA-based system timing controller makes all analog and digital I/O configurable for applicationspecific operation with embedded custom logic. Intelligent DAQ offers up to eight analog inputs, up to eight analog outputs, and up to 160 digital I/O lines. LabVIEW FPGA-configured hardware for custom onboard decision making Digital lines individually configurable as inputs, outputs, counter/timers, PWM, flexible encoder inputs, or specialized communication protocols Learn more at ni.com/dataacquisition Applications High-Speed Control Loops With LabVIEW code that executes in silicon, you can implement multiple analog PID control systems at loop rates exceeding 100 kHz and digital decision making at 40 MHz. Custom Digital Protocols Implement both standard and custom digital communication protocols with commercial off-the-shelf (COTS) hardware. Sensor Simulation Simulate complex analog and digital sensors for test system validation and hardware-inthe-loop (HIL) test. ni.com 23 http://ni.com/dataacquisition http://ni.com/dataacquisition http://ni.com
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