National Instruments Product Guide - 2008 - (Page 29) High-Speed Digital I/O With a software-defined platform for generation or acquisition of digital protocols, you can design high-channel-count digital test systems with subnanosecond multimodule synchronization. Use deep onboard memory to create complex digital test vectors for DAC/ADC characterization and functional test and perform complex communications schemes. Data Delay – Shift acquisition or generation data with up to 40 ps resolution Hardware Compare – Compare expected data with acquired information Scripting – Link and loop waveforms from onboard memory to create infinite test vectors DDR – Double instrument data rate by transferring data on both the rising and falling clock edges Product Family 5 V TTL/CMOS, low-cost Selectable voltage, low-cost Selectable voltage, high-speed Programmable voltage, bidirectional Differential voltage, high-speed Maximum Clock Rate 2/20 MHz 25/50 MHz 50/100 MHz 50/100 MHz 100/200 MHz Voltage Levels 5V 2.5, 3.3, 5 V 1.8, 2.5, 3.3, 5 V -2 to 5.5 V (10 mV steps) LVDS, LVTTL DIO Channels 32 32 32 20 16 Direction Control By 8-bit ports Per-channel Per-channel Per-channel, per-cycle (tri-state) Per-channel (SDR), dedicated I/O (DDR) Form Factor PCI/PXI/PCMCIA PCI Express/PXI Express PCI/PXI PCI/PXI PCI/PXI Learn more at ni.com/hsdio NI Digital Waveform Editor Use this interactive software tool to create digital signals/buses as well as import existing test vectors from VCD or ASCII files for interfacing and communications applications. Design digital vectors with six drive and compare states (0, 1, Z, H, L, and X) Use built-in patterns for count up/down, PRBS data, and more Highlight bit errors in designs and “play” signals with LabVIEW SignalExpress ni.com 29 http://ni.com/hsdio http://ni.com
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