Circuits Assembly - April 2008 - (Page 80) Technical Abstracts In Case You Missed It Circuit Design “50 GHz End Launch Connector Test Boards” Author: Bill Rosas Abstract: The methodology for broadband (50 GHz) transitions from coax to GCPWG is explained through following the development of connector test boards. How to create broadband GCPWG lines is explained and verified through 3-D simulation and actual measurements, including an explanation and verification of the purpose of the vias. The difference between microstrip and GCPWG on 0.030" RO4350 material, especially relating to bandwidth and loss, is examined through measurement of boards. The effect of the connectors is removed from all of the measurements by using identical connectors for all measurements. For 0.030" RO4350 substrates used for up to 50 GHz, properly designed GCPWG has been shown to have some advantages. But for loss, there are applications where microstrip would be the better choice. This means the application would determine which structure is best to use. If loss is the only concern, for longer lines microstrip will be the better choice. For bandwidth, isolation and if lines are very short, GCPWG would be the better choice. (DesignCon, February 2008; edn. com/contents/images/12-WA2--Bill_Rosas.pdf) Component Assembly “Process and Assembly Methods for Increased Yield of Package on Package Devices” Authors: Dr. Brian Toleno and Dan Maslyk; brian. toleno@us.henkel.com. Abstract: Package on package (PoP) is subject to known good die issues and other challenges that can drive up cost. In addition, this limits the designer as to what functionality can be “stacked,” as these come packaged in a single unit. Stacking packages offers significant advantages from a design standpoint. As long as the pad designs are compatible, different device types can be stacked, permitting more versatility in the design and assembly. On the other hand, assembling these devices on a standard SMT line can present challenges. Some assemblers purchase or acquire these devices preassembled, but the trend is toward assembling these on the PCB using a standard SMT process. Once solder paste is printed on the PCB and the firstlevel component placed, the attachment methodology of the second-level device is not as clear. Therefore, to reflow all these in one pass, alternative measures need to be investigated. This paper compares the process conditions and yield achieved when assembling package on package devices using different materials and methodologies. In all cases, the devices were Pb-free with solder paste used for the bottom package. The process and materials were varied for the top package. The materials used for the top package assembly included tacky flux, solder paste and an epoxy flux system. Once assembled, the devices were tested for electrical yield, solder joint metallurgy integrity, and standoff height. (SMTA Pan Pac Symposium, January 2008) Supply Chain Management “Corporate Social Responsibility in China’s Information and Communications Technology (ICT) Sector” Author: United Nations Environment Programme Abstract: Corporate social responsibility (CSR) efforts within global supply chains have improved social and environmental conditions around the world. There is growing recognition of a connection between CSR and a company’s ability to attract and retain international customers. FIAS launched a project in October 2006 to develop a capability-building strategy in Shenzhen designed to identify and test strategies and activities that will most likely improve social and environmental conditions, and also provide business benefits to the ICT supply chain. Participants included Celestica, Flextronics and Foxconn, among others. Since employee retention is a major challenge in Shenzhen, factories are extremely concerned with losing workers due to insufficient overtime. Among the suppliers interviewed, turnover ranged from 3% to 20% per month. Many suppliers felt workers demanded at least 60 to 80 hrs. of overtime per month, and that overtime only became unwelcome above 100 hrs. per month. Meanwhile, external audits are uncommon: Only one or two of the suppliers interviewed had been audited for more than three years, and less than half of the suppliers had been audited exclusively for CSR rather than as part of a quality audit. (July 2007; bsr. org/reports/2007_China-ICT-Report_English.pdf) Thermal Interface Materials “Electrical and Thermal Interface Materials” Authors: Rob Emery and Tanawan Chaowasakoo; remy@celestica.com. Abstract: Thermal design is limited by the need for easy assembly, which can result in high resistances between different elements of the thermal management system. TIMs are used to minimize these resistances and a broad range of materials used: greases, gels, putty, phase-change materials (PCMs), pads, tapes, adhesives and solders. A simple setup based on ASTM D5470 for testing TIMs is presented. Performance and tradeoffs (ease of application, pressure effects, reworkability, environmental resistance) between the different material types are shown. (SMTA Pan Pac Symposium, January 2008) CIRCUITS ASSEMBLY provides abstracts of papers from recent industry conferences and company white papers. With the amount of information increasing, our goal is to provide an added opportunity for readers to keep abreast of technology and business trends. 80 Circuits Assembly APRIL 2008 circuitsassembly.com http://edn.com/contents/images/12-WA2--Bill_Rosas.pdf http://edn.com/contents/images/12-WA2--Bill_Rosas.pdf http://bsr.org/reports/2007_China-ICT-Report_English.pdf http://bsr.org/reports/2007_China-ICT-Report_English.pdf http://circuitsassembly.com
Table of Contents Feed for the Digital Edition of Circuits Assembly - April 2008 Circuits Assembly - April 2008 Contents Caveat Lector Industry News Market Watch Talking Heads Screen Printing Better Manufacturing Design and Modeling of High-Speed, High-Density 3-D CSPs and Memory Modules The ‘Big Brush Off’ Revisited Impact of Soldering Atmosphere on Solder Joint Formation Beyond Moore’s Law ESD Control For Class 0 ESDS Devices Growing Your Brand This Year’s Model Tech Tips Reflow Soldering Process Doctor Pb-Free Lessons Learned Getting Lean Equipment Advances Apex Product Preview Ad Index Assembly Insider Technical Abstracts Circuits Assembly - April 2008 Circuits Assembly - April 2008 - Circuits Assembly - April 2008 (Page Cover1) Circuits Assembly - April 2008 - Circuits Assembly - April 2008 (Page Cover2) Circuits Assembly - April 2008 - Circuits Assembly - April 2008 (Page 1) Circuits Assembly - April 2008 - Circuits Assembly - April 2008 (Page 2) Circuits Assembly - April 2008 - Contents (Page 3) Circuits Assembly - April 2008 - Contents (Page 4) Circuits Assembly - April 2008 - Contents (Page 5) Circuits Assembly - April 2008 - Caveat Lector (Page 6) Circuits Assembly - April 2008 - Caveat Lector (Page 7) Circuits Assembly - April 2008 - Industry News (Page 8) Circuits Assembly - April 2008 - Industry News (Page 9) Circuits Assembly - April 2008 - Industry News (Page 10) Circuits Assembly - April 2008 - Industry News (Page 11) Circuits Assembly - April 2008 - Industry News (Page 12) Circuits Assembly - April 2008 - Industry News (Page 13) Circuits Assembly - April 2008 - Industry News (Page 14) Circuits Assembly - April 2008 - Industry News (Page 15) Circuits Assembly - April 2008 - Market Watch (Page 16) Circuits Assembly - April 2008 - Talking Heads (Page 17) Circuits Assembly - April 2008 - Screen Printing (Page 18) Circuits Assembly - April 2008 - Screen Printing (Page 19) Circuits Assembly - April 2008 - Better Manufacturing (Page 20) Circuits Assembly - April 2008 - Better Manufacturing (Page 21) Circuits Assembly - April 2008 - Design and Modeling of High-Speed, High-Density 3-D CSPs and Memory Modules (Page 22) Circuits Assembly - April 2008 - Design and Modeling of High-Speed, High-Density 3-D CSPs and Memory Modules (Page 23) Circuits Assembly - April 2008 - Design and Modeling of High-Speed, High-Density 3-D CSPs and Memory Modules (Page 24) Circuits Assembly - April 2008 - Design and Modeling of High-Speed, High-Density 3-D CSPs and Memory Modules (Page 25) Circuits Assembly - April 2008 - Design and Modeling of High-Speed, High-Density 3-D CSPs and Memory Modules (Page 26) Circuits Assembly - April 2008 - Design and Modeling of High-Speed, High-Density 3-D CSPs and Memory Modules (Page 27) Circuits Assembly - April 2008 - The ‘Big Brush Off’ Revisited (Page 28) Circuits Assembly - April 2008 - The ‘Big Brush Off’ Revisited (Page 29) Circuits Assembly - April 2008 - The ‘Big Brush Off’ Revisited (Page 30) Circuits Assembly - April 2008 - The ‘Big Brush Off’ Revisited (Page 31) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 32) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 33) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 34) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 35) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 36) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 37) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 38) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 39) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 40) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 41) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 42) Circuits Assembly - April 2008 - Impact of Soldering Atmosphere on Solder Joint Formation (Page 43) Circuits Assembly - April 2008 - Beyond Moore’s Law (Page 44) Circuits Assembly - April 2008 - Beyond Moore’s Law (Page 45) Circuits Assembly - April 2008 - Beyond Moore’s Law (Page 46) Circuits Assembly - April 2008 - Beyond Moore’s Law (Page 47) Circuits Assembly - April 2008 - Beyond Moore’s Law (Page 48) Circuits Assembly - April 2008 - Beyond Moore’s Law (Page 49) Circuits Assembly - April 2008 - ESD Control For Class 0 ESDS Devices (Page 50) Circuits Assembly - April 2008 - ESD Control For Class 0 ESDS Devices (Page 51) Circuits Assembly - April 2008 - ESD Control For Class 0 ESDS Devices (Page 52) Circuits Assembly - April 2008 - ESD Control For Class 0 ESDS Devices (Page 53) Circuits Assembly - April 2008 - ESD Control For Class 0 ESDS Devices (Page 54) Circuits Assembly - April 2008 - ESD Control For Class 0 ESDS Devices (Page 55) Circuits Assembly - April 2008 - Growing Your Brand (Page 56) Circuits Assembly - April 2008 - Growing Your Brand (Page 57) Circuits Assembly - April 2008 - Growing Your Brand (Page 58) Circuits Assembly - April 2008 - Growing Your Brand (Page 59) Circuits Assembly - April 2008 - Growing Your Brand (Page 60) Circuits Assembly - April 2008 - Growing Your Brand (Page 61) Circuits Assembly - April 2008 - This Year’s Model (Page 62) Circuits Assembly - April 2008 - This Year’s Model (Page 63) Circuits Assembly - April 2008 - Tech Tips (Page 64) Circuits Assembly - April 2008 - Reflow Soldering (Page 65) Circuits Assembly - April 2008 - Process Doctor (Page 66) Circuits Assembly - April 2008 - Process Doctor (Page 67) Circuits Assembly - April 2008 - Pb-Free Lessons Learned (Page 68) Circuits Assembly - April 2008 - Pb-Free Lessons Learned (Page 69) Circuits Assembly - April 2008 - Getting Lean (Page 70) Circuits Assembly - April 2008 - Getting Lean (Page 71) Circuits Assembly - April 2008 - Getting Lean (Page 72) Circuits Assembly - April 2008 - Getting Lean (Page 73) Circuits Assembly - April 2008 - Equipment Advances (Page 74) Circuits Assembly - April 2008 - Equipment Advances (Page 75) Circuits Assembly - April 2008 - Apex Product Preview (Page 76) Circuits Assembly - April 2008 - Apex Product Preview (Page 77) Circuits Assembly - April 2008 - Ad Index (Page 78) Circuits Assembly - April 2008 - Assembly Insider (Page 79) Circuits Assembly - April 2008 - Technical Abstracts (Page 80) Circuits Assembly - April 2008 - Technical Abstracts (Page Cover3) Circuits Assembly - April 2008 - Technical Abstracts (Page Cover4)
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