Circuits Assembly - June 2008 - (Page 12) NEWS People EMS provider Adeptron Technologies named Mark Kohler chief financial officer. MTA Automation promoted Emilio Stornaiuolo to CEO, Bruno Thomann to authorized representative, and Utz Esser to CEO of MTA Automation Deutschland. Hella Electronics Corp. named Mark Brainard vice president – program management, responsible for business development, program management and customer relationships in North America. Microscan Systems named John Macrina global vice president of sales and service. He was director of Panasonic Factory Solutions’ Electronics Assembly group, and has also held sales management positions at Zevatech, Asymtek, Amistar and Nalco Chemical. Multisorb Technologies appointed Daniel Casacci business development leader, electronics market. Zestron named Tiow Ping Sim South Asia sales manager, based in Singapore. He will manage the company´s local distributor network and customer support. He has a bachelor’s in mechanical engineering from the Queensland University of Technology and 15 years’ experience in SMT and semiconductors. Zestron also named Steven Goh to its Asia/Pacific Application Technology Team. Aim named Michael Burgess strategic account manager, responsible for the full line of solder assembly materials, and for managing and coordinating promotional, sales and support activities. He has a degree in engineering and 17 years’ experience in manufacturing, technical sales, marketing and application support, most recently with Photo Stencil. Industry iNEMI Seeks to Resolve Pb-Free Alloy, Failure Issues HERNDON, VA – iNEMI (inemi.org) is organizing several new efforts to help industry collaboratively address common challenges. Among the new projects scheduled for launch this spring are Pb-Free Alloy Alternatives, Pb-Free Early Failure, Boundary Scan Adoption and Solder Paste Deposition. “iNEMI’s roadmapping and gap analysis activities help us identify those technology and infrastructure gaps where it makes sense for industry to collaboratively develop common solutions,” said Jim McElroy, CEO of iNEMI, in a press release. “The initiatives we are currently organizing address needs identified by the roadmaps and, in all cases, represent activities that would not have as much impact on the supply chain if undertaken by a single company.” Pb-Free Alloy Alternatives. This project is being organized to provide guidelines to help make the growing proliferation of Pb-free alloys easier to manage. Many BGA suppliers are changing the alloys used for Pb-free solder balls to improve mechanical shock performance. Suppliers also are promoting a variety of wave solder alloys to address concerns about copper dissolution, barrel fill, common wave defects, and the high cost of alloys. As a result, the variety of Pb-free alloys is increasing. Several of these alloys have lower levels of silver and, therefore, a higher melting point (up to 10°C higher), which may require a change in assembly processes. The first phase of this project will focus on the analysis of existing knowledge and assessment of critical gaps, and on driving standards to help manage supply chain complexity and risk. Pb-Free Early Failure. This effort will determine whether a large sample size can reveal Pb-free early failures in accelerated thermal fatigue testing of Pb-free solder joints. The physical and metallurgical differences between SnPb and Pb-free solders have a direct effect on thermal cycle performance, and the properties and failure behavior of SAC solders are markedly different. If the outliers identified in Pb-free soldering thermal fatigue studies are a function of the structure/properties, they may not be visible in the relatively small sample size used in thermal cycling tests. If so, the traditional SnPb sample size (32) is inadequate to characterize the reliability of Pb-free solders, and test data using these sample sizes could result in over-estimation of reliability (i.e., small sample size could mask early Pb-free failures). The team plans to develop a unique test vehicle with a large sample size (256 each of three different component types) to test BGA solder joints. Testing will include two components that tend to fail relatively quickly (to encourage early failure) and a third with a slightly longer life, and will cover four conditions: small sphere joints, large sphere joints, low strain rate and high strain rate. Boundary Scan Adoption. This project will promote wider adoption of boundary scan (IEEE 1149.1, 1149.6 and P1581) throughout the industry, encourage semiconductor vendors to include the technology in their products, and promote the development of tools by ATE vendors to support boundary scan-based board test. Increasing circuit densities and speeds are quickly reducing electrical test point access for assembly test. Boundary scan is a technology that permits continued testability of assembly, but its use requires it be designed into semiconductor devices and board assemblies. Wider availability of complying devices is necessary to enable cost-efficient and effective board test for future designs. Design-for-test is currently not accepted in the general area of memory devices (SRAM, DRAM, flash, etc.). In addition, tools to support boundary scan-based test need to be developed and integrated into manufacturing test equipment. This project proposes to bridge the gap between board test and board manufacturing, where this lack of understanding arises in the use of design-for-test. “We feel the standards are not being adopted, and we want to encourage more standardization,” McElroy told CirCuits Assembly. Solder Paste Deposition. iNEMI’s first regional deployment project is currently being organized in China (see "Talking Heads," page 17). The Solder Paste Deposition Project will investigate solutions to depositing different volumes of solder paste on the same board. As board density increases and components become smaller, fine-pitch components (requiring smaller volumes of solder paste) often appear next to larger components (requiring more paste), and a single-thickness stencil cannot satisfy all the components in the same printing process. In these situations, a step stencil is the least expensive and most popular solution. However, the challenge is in determining the proper distance between the various components because the step stencil may affect the thickness of the solder paste deposition, circuitsassembly.com 12 Circuits Assembly JUNE 2008 http://inemi.org http://circuitsassembly.com
Table of Contents Feed for the Digital Edition of Circuits Assembly - June 2008 Circuits Assembly - June 2008 Contents Letters Caveat Lector Industry News Market Watch Talking Heads Screen Printing Better Manufacturing China Goes ‘Upmarket’ Out of the Garage Improving Production Line Performance Manufacturing Steps Onto the Enterprise IT Stage Measuring and Controlling Wave Height and Dwell Time Wave Soldering Tech Tips Test and Inspection Process Doctor Pb-Free Lessons Learned Getting Lean Eastern Advances Semicon West Product Preview Product Spotlight Ad Index Assembly Insider Technical Abstracts Circuits Assembly - June 2008 Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page Cover1) Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page Cover2) Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page 1) Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page 2) Circuits Assembly - June 2008 - Contents (Page 3) Circuits Assembly - June 2008 - Letters (Page 4) Circuits Assembly - June 2008 - Letters (Page 5) Circuits Assembly - June 2008 - Caveat Lector (Page 6) Circuits Assembly - June 2008 - Caveat Lector (Page 7) Circuits Assembly - June 2008 - Industry News (Page 8) Circuits Assembly - June 2008 - Industry News (Page 9) Circuits Assembly - June 2008 - Industry News (Page 10) Circuits Assembly - June 2008 - Industry News (Page 11) Circuits Assembly - June 2008 - Industry News (Page 12) Circuits Assembly - June 2008 - Industry News (Page 13) Circuits Assembly - June 2008 - Industry News (Page 14) Circuits Assembly - June 2008 - Industry News (Page 15) Circuits Assembly - June 2008 - Market Watch (Page 16) Circuits Assembly - June 2008 - Talking Heads (Page 17) Circuits Assembly - June 2008 - Screen Printing (Page 18) Circuits Assembly - June 2008 - Screen Printing (Page 19) Circuits Assembly - June 2008 - Better Manufacturing (Page 20) Circuits Assembly - June 2008 - Better Manufacturing (Page 21) Circuits Assembly - June 2008 - China Goes ‘Upmarket’ (Page 22) Circuits Assembly - June 2008 - China Goes ‘Upmarket’ (Page 23) Circuits Assembly - June 2008 - Out of the Garage (Page 24) Circuits Assembly - June 2008 - Out of the Garage (Page 25) Circuits Assembly - June 2008 - Improving Production Line Performance (Page 26) Circuits Assembly - June 2008 - Improving Production Line Performance (Page 27) Circuits Assembly - June 2008 - Manufacturing Steps Onto the Enterprise IT Stage (Page 28) Circuits Assembly - June 2008 - Manufacturing Steps Onto the Enterprise IT Stage (Page 29) Circuits Assembly - June 2008 - Measuring and Controlling Wave Height and Dwell Time (Page 30) Circuits Assembly - June 2008 - Measuring and Controlling Wave Height and Dwell Time (Page 31) Circuits Assembly - June 2008 - Measuring and Controlling Wave Height and Dwell Time (Page 32) Circuits Assembly - June 2008 - Wave Soldering (Page 33) Circuits Assembly - June 2008 - Tech Tips (Page 34) Circuits Assembly - June 2008 - Tech Tips (Page 35) Circuits Assembly - June 2008 - Test and Inspection (Page 36) Circuits Assembly - June 2008 - Process Doctor (Page 37) Circuits Assembly - June 2008 - Process Doctor (Page 38) Circuits Assembly - June 2008 - Pb-Free Lessons Learned (Page 39) Circuits Assembly - June 2008 - Getting Lean (Page 40) Circuits Assembly - June 2008 - Eastern Advances (Page 41) Circuits Assembly - June 2008 - Eastern Advances (Page 42) Circuits Assembly - June 2008 - Semicon West Product Preview (Page 43) Circuits Assembly - June 2008 - Semicon West Product Preview (Page 44) Circuits Assembly - June 2008 - Product Spotlight (Page 45) Circuits Assembly - June 2008 - Ad Index (Page 46) Circuits Assembly - June 2008 - Assembly Insider (Page 47) Circuits Assembly - June 2008 - Technical Abstracts (Page 48) Circuits Assembly - June 2008 - Technical Abstracts (Page Cover3) Circuits Assembly - June 2008 - Technical Abstracts (Page Cover4)
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