Circuits Assembly - June 2008 - (Page 38) Process Doctor Figure 2. Positive color reaction through the flux test method. Figure 3. Conductive residues between two solder joints. is the amount of resin residues on the assembly. If a protective coating is applied on top of the resin residues, for example, wettability is impaired and adhesion becomes insufficient because of the different temperature-dependent expansion coefficients. The residual amount of resin is specified by J-STD-001D, section 8.3.6.1. For Class 3 assemblies, a level <257.95 µg/sq. in. (<40 µg/cm²) is required, which corresponds to the typical amount of resin left around a single solder joint. IPC-TM-650, section 2.3.27.1, calls for an extraction method followed by HPLC (High Performance Liquid Chromatography) to determine the resin amount. Depending on the coating system, organic tin salts, which manifest themselves through a chemical reaction of metallic solder and fluxes (i.e., tin organic salts), can act as polymerization inhibitors. These impurities are generally identified by EDX using a SEM. A more suitable alternative to an actual lifecycle test (IEC-68-2, up to six months), which can be used at any stage during product development, is the so-called Coating Reliability (CoRe) test, described in guidelines for conformal coating use and processing. Through complete immersion of the coated assembly in DI water, the mechanism of electrochemical migration is strongly accelerated. Therefore, conclusions can be drawn within a few hours regarding the reliability of the coating. To prevent leakage currents (Figure 3), the assembly should be inspected visually and checked for hygroscopic residues. Another important criterion for leakage current protection is surface insulation resistance. SIR is usually measured according to IPCTM-650, using specified comb structures. The threshold limit is 108 Ω. Resin films and oxides primarily impair the bonding process. For example, resin can splash 38 Circuits Assembly JUNE 2008 Figure 4. Residues invisible (left) and visualized by the resin test (right). onto pads during soldering and result in insufficient bonding. These impurities can reduce molding materials adhesion. Extraction methods and HPLC analyses or analytical tests can be used to detect resin residues (Figure 4). Although surface activation is not a criterion specified in the standards, it represents an important variable for reliable bonding. To evaluate the oxidation status for metallically pure surfaces, the “interference contrast” is used. Metallically pure surfaces appear black and impurities can be identified by any other color but black. Maintaining the described thresholds in the aforementioned standards will eliminate typical failure patterns. To evaluate assembly cleanliness, expensive and time-consuming test methods are not always necessary. By using quick alternative analytical tests, reliable conclusions regarding surface cleanliness can be drawn. n circuitsassembly.com http://circuitsassembly.com
Table of Contents Feed for the Digital Edition of Circuits Assembly - June 2008 Circuits Assembly - June 2008 Contents Letters Caveat Lector Industry News Market Watch Talking Heads Screen Printing Better Manufacturing China Goes ‘Upmarket’ Out of the Garage Improving Production Line Performance Manufacturing Steps Onto the Enterprise IT Stage Measuring and Controlling Wave Height and Dwell Time Wave Soldering Tech Tips Test and Inspection Process Doctor Pb-Free Lessons Learned Getting Lean Eastern Advances Semicon West Product Preview Product Spotlight Ad Index Assembly Insider Technical Abstracts Circuits Assembly - June 2008 Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page Cover1) Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page Cover2) Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page 1) Circuits Assembly - June 2008 - Circuits Assembly - June 2008 (Page 2) Circuits Assembly - June 2008 - Contents (Page 3) Circuits Assembly - June 2008 - Letters (Page 4) Circuits Assembly - June 2008 - Letters (Page 5) Circuits Assembly - June 2008 - Caveat Lector (Page 6) Circuits Assembly - June 2008 - Caveat Lector (Page 7) Circuits Assembly - June 2008 - Industry News (Page 8) Circuits Assembly - June 2008 - Industry News (Page 9) Circuits Assembly - June 2008 - Industry News (Page 10) Circuits Assembly - June 2008 - Industry News (Page 11) Circuits Assembly - June 2008 - Industry News (Page 12) Circuits Assembly - June 2008 - Industry News (Page 13) Circuits Assembly - June 2008 - Industry News (Page 14) Circuits Assembly - June 2008 - Industry News (Page 15) Circuits Assembly - June 2008 - Market Watch (Page 16) Circuits Assembly - June 2008 - Talking Heads (Page 17) Circuits Assembly - June 2008 - Screen Printing (Page 18) Circuits Assembly - June 2008 - Screen Printing (Page 19) Circuits Assembly - June 2008 - Better Manufacturing (Page 20) Circuits Assembly - June 2008 - Better Manufacturing (Page 21) Circuits Assembly - June 2008 - China Goes ‘Upmarket’ (Page 22) Circuits Assembly - June 2008 - China Goes ‘Upmarket’ (Page 23) Circuits Assembly - June 2008 - Out of the Garage (Page 24) Circuits Assembly - June 2008 - Out of the Garage (Page 25) Circuits Assembly - June 2008 - Improving Production Line Performance (Page 26) Circuits Assembly - June 2008 - Improving Production Line Performance (Page 27) Circuits Assembly - June 2008 - Manufacturing Steps Onto the Enterprise IT Stage (Page 28) Circuits Assembly - June 2008 - Manufacturing Steps Onto the Enterprise IT Stage (Page 29) Circuits Assembly - June 2008 - Measuring and Controlling Wave Height and Dwell Time (Page 30) Circuits Assembly - June 2008 - Measuring and Controlling Wave Height and Dwell Time (Page 31) Circuits Assembly - June 2008 - Measuring and Controlling Wave Height and Dwell Time (Page 32) Circuits Assembly - June 2008 - Wave Soldering (Page 33) Circuits Assembly - June 2008 - Tech Tips (Page 34) Circuits Assembly - June 2008 - Tech Tips (Page 35) Circuits Assembly - June 2008 - Test and Inspection (Page 36) Circuits Assembly - June 2008 - Process Doctor (Page 37) Circuits Assembly - June 2008 - Process Doctor (Page 38) Circuits Assembly - June 2008 - Pb-Free Lessons Learned (Page 39) Circuits Assembly - June 2008 - Getting Lean (Page 40) Circuits Assembly - June 2008 - Eastern Advances (Page 41) Circuits Assembly - June 2008 - Eastern Advances (Page 42) Circuits Assembly - June 2008 - Semicon West Product Preview (Page 43) Circuits Assembly - June 2008 - Semicon West Product Preview (Page 44) Circuits Assembly - June 2008 - Product Spotlight (Page 45) Circuits Assembly - June 2008 - Ad Index (Page 46) Circuits Assembly - June 2008 - Assembly Insider (Page 47) Circuits Assembly - June 2008 - Technical Abstracts (Page 48) Circuits Assembly - June 2008 - Technical Abstracts (Page Cover3) Circuits Assembly - June 2008 - Technical Abstracts (Page Cover4)
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