Circuits Assembly - August 2008 - (Page 41) Cracks, head-on-pillow (HOP) and knuckling are gross yet common defects that cause intermittent failures and are impossible to catch with AOI and difficult to detect with 3-D x-ray. Failure analysis can support process modification to prevent this. NPI. The reliability analysis lab also supports NPI by providing data that can be used in product qualification. Typically customers provide two assemblies for this part of the qualification process. One area of focus is BGAs, as solder joints aren’t visible without destructive testing. The lab cross-sections and verifies the BGA center and outside perimeters reflowed adequately. Failure analysis also helps processes evolve to support emerging customer requirements. For instance, continued miniaturization is driving highly complex assembly such as package on package. In this situation, a BGA is placed and a second BGA is flux-dipped and placed on top of the first BGA. There is now a triple stack BGA, adding to the already challenging component Δ T. Vapor phase works well with those technologies because it reflows evenly at 230 oC using SAC 305; however, other SAC formulations require higher temperatures. The lab is currently analyzing a specially formulated 235°C boiling point fluid in order to provide the best options to support these future customer needs. Quality issues. Perhaps one of the areas in which laboratory service is most effective in contributing to enhanced throughput is its ability to help engineering determine the root cause of quality issues through failure analysis. The product and process validation techniques discussed earlier help optimize processes from the start, but even with a robust process, additional defects may occur. Often these circuitsassembly.com Getting Lean Figure 1. Cross-section analysis showed that a customer’s final assembly process was placing unacceptable levels of strain on the solder joints. defects arise not from the EMS process, but from issues in a supplier’s process or in handling at the customer. Failure analysis resources can help quickly identify the issue. The following examples illustrate how these defects can arise: In one case, analysis indicated field failures were the result of the customer’s final assembly process (Figure 1). The analysis monitored the strain in each of the processes through ICT and functional test at the contractor, and strain in each of the customer’s processes. The result showed the root cause of the failures was a screw mounted next to the BGA during the customer’s final assembly process. Strain gauge analysis showed excessive and constant strain was applied to the BGA in question once the final assembly housing was fully installed, resulting in fractured solder joints and open circuit connections. The problem was quickly resolved, and it helped solidify the customer relationship because the recommended process modifications were based on quantitative analysis. Supplier-related issues also can cause hard-to-identify defects. Some issues occur when suppliers are out of spec. For instance, in one case a customer’s product was leaking lithium fluid in the field. The problem was an issue in the battery supplier’s assembly process. Production opera- Figure 2. Analysis of this leaking battery determined the supplier’s production operators were crimping and pinching the battery seal in final assembly. tors were actually crimping and pinching the battery seal in final assembly (Figure 2). Once the failure analysis data were presented, the supplier took responsibility, and modified the batter assembly process, improving yield and reliability. What started as an assembly workmanship concern in the eyes of the customer resulted in a supply base issue; an issue where root cause was identified and permanent corrective action was taken. This type of customer/supplier/ manufacturer problem-solving partnership would never have been possible without the use of undisputable quantitative analysis provided through reliability laboratory services. While reliability analysis isn’t traditionally thought of in terms of Lean manufacturing, these examples demonstrate how its use helps minimize process variability, development and speed manufacturing and quality issue resolution. The net effect is improved customer quality, enhanced manufacturing and resource efficiency, leading to improved throughput. n References 1. Chris Munroe, “The Advantages of Vapor Phase Processing in RoHS-Compliant Assembly,” SMTA International Proceedings, August 2008. Circuits Assembly AUGUST 2008 41 http://circuitsassembly.com
Table of Contents Feed for the Digital Edition of Circuits Assembly - August 2008 Circuits Assembly - August 2008 Contents Caveat Lector Industry News Market Watch Talking Heads Screen Printing Better Manufacturing Auditing a Fabricatior Cutting Machine Programming Time Simultaneous Acoustic Imaging and Surface Mapping Tech Tips Soldering Test and Inspection Process Doctor Pb-Free Lessons Learned Getting Lean Component Advances Product Spotlight Ad Index Assembly Insider Techincal Abstracts Circuits Assembly - August 2008 Circuits Assembly - August 2008 - Circuits Assembly - August 2008 (Page Cover1) Circuits Assembly - August 2008 - Circuits Assembly - August 2008 (Page Cover2) Circuits Assembly - August 2008 - Circuits Assembly - August 2008 (Page 1) Circuits Assembly - August 2008 - Circuits Assembly - August 2008 (Page 2) Circuits Assembly - August 2008 - Contents (Page 3) Circuits Assembly - August 2008 - Contents (Page 4) Circuits Assembly - August 2008 - Contents (Page 5) Circuits Assembly - August 2008 - Caveat Lector (Page 6) Circuits Assembly - August 2008 - Caveat Lector (Page 7) Circuits Assembly - August 2008 - Industry News (Page 8) Circuits Assembly - August 2008 - Industry News (Page 9) Circuits Assembly - August 2008 - Industry News (Page 10) Circuits Assembly - August 2008 - Industry News (Page 11) Circuits Assembly - August 2008 - Industry News (Page 12) Circuits Assembly - August 2008 - Industry News (Page 13) Circuits Assembly - August 2008 - Market Watch (Page 14) Circuits Assembly - August 2008 - Market Watch (Page 15) Circuits Assembly - August 2008 - Talking Heads (Page 16) Circuits Assembly - August 2008 - Talking Heads (Page 17) Circuits Assembly - August 2008 - Screen Printing (Page 18) Circuits Assembly - August 2008 - Screen Printing (Page 19) Circuits Assembly - August 2008 - Better Manufacturing (Page 20) Circuits Assembly - August 2008 - Better Manufacturing (Page 21) Circuits Assembly - August 2008 - Auditing a Fabricatior (Page 22) Circuits Assembly - August 2008 - Auditing a Fabricatior (Page 23) Circuits Assembly - August 2008 - Auditing a Fabricatior (Page 24) Circuits Assembly - August 2008 - Auditing a Fabricatior (Page 25) Circuits Assembly - August 2008 - Cutting Machine Programming Time (Page 26) Circuits Assembly - August 2008 - Cutting Machine Programming Time (Page 27) Circuits Assembly - August 2008 - Cutting Machine Programming Time (Page 28) Circuits Assembly - August 2008 - Cutting Machine Programming Time (Page 29) Circuits Assembly - August 2008 - Simultaneous Acoustic Imaging and Surface Mapping (Page 30) Circuits Assembly - August 2008 - Simultaneous Acoustic Imaging and Surface Mapping (Page 31) Circuits Assembly - August 2008 - Simultaneous Acoustic Imaging and Surface Mapping (Page 32) Circuits Assembly - August 2008 - Tech Tips (Page 33) Circuits Assembly - August 2008 - Soldering (Page 34) Circuits Assembly - August 2008 - Soldering (Page 35) Circuits Assembly - August 2008 - Test and Inspection (Page 36) Circuits Assembly - August 2008 - Process Doctor (Page 37) Circuits Assembly - August 2008 - Pb-Free Lessons Learned (Page 38) Circuits Assembly - August 2008 - Pb-Free Lessons Learned (Page 39) Circuits Assembly - August 2008 - Getting Lean (Page 40) Circuits Assembly - August 2008 - Getting Lean (Page 41) Circuits Assembly - August 2008 - Component Advances (Page 42) Circuits Assembly - August 2008 - Component Advances (Page 43) Circuits Assembly - August 2008 - Product Spotlight (Page 44) Circuits Assembly - August 2008 - Product Spotlight (Page 45) Circuits Assembly - August 2008 - Ad Index (Page 46) Circuits Assembly - August 2008 - Assembly Insider (Page 47) Circuits Assembly - August 2008 - Techincal Abstracts (Page 48) Circuits Assembly - August 2008 - Techincal Abstracts (Page Cover3) Circuits Assembly - August 2008 - Techincal Abstracts (Page Cover4)
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