Circuits Assembly - September 2008 - (Page 48) Pb-Free Rework Table 2. Component Descriptions Comp. Type CBGA PBGA PBGA PBGA CSP I/O 937 676 256 196 64 Pitch, mm 1 1 1.27 1 0.8 Ball Composition (wt. %) SnAg3.8%Cu0.5% SnAg3.8%Cu0.5% SnAg3.8%Cu0.5% SnAg3.8%Cu0.5% SnAg3.8%Cu0.5% Table 3. Rework Matrix Cell 6-1 6-2 6-3 6-4 Thickness 0.093” 0.093” 0.125” 0.125” Surface Finish ImAg ENIG ImAg ENIG Rework N2 N2 N2 N2 ATC Profile 0-100°C 0-100°C 0-100°C 0-100°C Environ. much below 217°C, the melting temperature of SAC solder balls. Reworked PBGA 196 solder joints finish melting at an even lower temperature (209°C), confirming SAC 385 solder balls are completely consumed, Figure 6b. Melting begins at 178°C. The final composition of CBGA joints after rework using Incontaining alloy A is 3.7-3.8 % Ag, 3.8-4.0 % In, and 0.4-1.0 % Cu, depending on the board surface finish. The microstructures of these joints are very similar to those of pure Sn-Ag-Cu alloys. CBGA reworked solder joints have Ag3Sn plates, Sn dendrites, and eutectic in inter-dendritic spaces. The number of Ag3Sn plates is small, and they are not large in size, (Figure 7a, online). The EDX analysis revealed indium in the Ag3Sn particles and the Sn matrix. These data are consistent with the literature on SnAgIn alloy microstructure formation.8 The ternary liquidus projection phase diagram9 (Figure 8, online) may be used to interpret the microstructures. It shows that for low In-content (0 to approximately 4 atom %), the compound phase is the Ag3Sn type, with some indium substituted for tin. The matrix phase is the tin type. PBGA 196 joints after rework contain 3.6-3.7 % Ag, 6.0-6.2 % In, and 0.4-1.0 % Cu. Tin dendrites and eutectic are present in the microstructure. Large primary intermetallic particles that have a specific flower shape, shown in Figure 7b, are detected in the PBGA 196 reworked solder joints. This compound contains a significant amount of indium and is more likely the Ag2.7 (In,Sn) type. It was found9 that for intermediate In content in alloys (approximately 4 to 6 at %), the compound phase has the approximate composition of Ag2.7 (In,Sn), where the indium and tin contents are approximately equal. It also may be the Ag2In type that forms in alloys with a high In-content (greater than approximately 6 at %). The occurrence and size of the particles depend on the rework parameters, and may be significantly reduced by optimizing the profile. The reworked CSP46 microstructure is similar to PBGA 196. There are no significant differences between 1X and 2X reworks on ImAg and ENIG finishes. The influence of rework of the adjacent PBGA 196 was negligible. The reaction intermetallic layer at the board side is (Cu,Ni)6Sn5 with 3-5 % Ni. The intermetallic on the component side is a ternary compound, SnCuNi, with a nickel content in the range of 48 Circuits Assembly SEPTEMBER 2008 Figure 6. DSC heating curve for reworked CBGA (a, top) and PBGA 196 (b) using In-containing alloy A. 10-15%. For the OSP and ImAg finished boards, the thickness of the intermetallic layer on the board side is about 5 µm in CBGA joints and 6 µm in PBGA 196 joints, in both cases after 1X and 2X rework. The intermetallic layers on the board side of the ENIG boards is much thinner, about 1.8 µm and 2.5 µm in CBGA and PBGA 196 joints, respectively. Both CBGA and PBGA 196 solder joint compositions after rework with In-containing alloy A provided an excellent balance of the desirable properties: strength, plasticity, fatigue life and superb fatigue resistance. The described microstructures are also favorable for high reliability of the reworked solder joints. There were no differences found between the microstructures of components reworked in air and nitrogen. Accelerated Thermal Cycling The ATC results reported below are based on 2500 cycles completed to date. The test is currently ongoing to a target of 6000 cycles. Weibull plots were generated for CBGA and PBGA 196 components reworked using the low melt In-containing alloy A, as well as for primary attached components and components reworked using conventional rework process (SAC 385 alloy). These are the only two components that have failed up to this cycle count. Continued on pg. 62 circuitsassembly.com http://circuitsassembly.com
Table of Contents Feed for the Digital Edition of Circuits Assembly - September 2008 Circuits Assembly - September 2008 Contents Caveat Lector Industry News Market Watch Talking Heads Focus on Business Global Sourcing On the Forefront Screen Printing Better Manufacturing Reflow Soldering with a SnCu Eutectic Pb-Free Alloy Improving OEE in High Mix Facilities Effectively Managing RF Design in Utility Metering Applications Solder Joint Reliability of Different BGAs Reworked Using Low Melting Point Pb-Free Alloys Tech Tips Wave Soldering Pb-Free Lessons Learned Materials World Process Doctor Equipment Advances Product Spotlight Ad Index Assembly Insider Technical Abstracts Circuits Assembly - September 2008 Circuits Assembly - September 2008 - Circuits Assembly - September 2008 (Page Cover1) Circuits Assembly - September 2008 - Circuits Assembly - September 2008 (Page Cover2) Circuits Assembly - September 2008 - Circuits Assembly - September 2008 (Page 1) Circuits Assembly - September 2008 - Circuits Assembly - September 2008 (Page 2) Circuits Assembly - September 2008 - Contents (Page 3) Circuits Assembly - September 2008 - Contents (Page 4) Circuits Assembly - September 2008 - Contents (Page 5) Circuits Assembly - September 2008 - Caveat Lector (Page 6) Circuits Assembly - September 2008 - Caveat Lector (Page 7) Circuits Assembly - September 2008 - Industry News (Page 8) Circuits Assembly - September 2008 - Industry News (Page 9) Circuits Assembly - September 2008 - Industry News (Page 10) Circuits Assembly - September 2008 - Industry News (Page 11) Circuits Assembly - September 2008 - Industry News (Page 12) Circuits Assembly - September 2008 - Industry News (Page 13) Circuits Assembly - September 2008 - Industry News (Page 14) Circuits Assembly - September 2008 - Industry News (Page 15) Circuits Assembly - September 2008 - Industry News (Page 16) Circuits Assembly - September 2008 - Industry News (Page 17) Circuits Assembly - September 2008 - Market Watch (Page 18) Circuits Assembly - September 2008 - Market Watch (Page 19) Circuits Assembly - September 2008 - Talking Heads (Page 20) Circuits Assembly - September 2008 - Talking Heads (Page 21) Circuits Assembly - September 2008 - Talking Heads (Page 22) Circuits Assembly - September 2008 - Talking Heads (Page 23) Circuits Assembly - September 2008 - Focus on Business (Page 24) Circuits Assembly - September 2008 - Focus on Business (Page best1) Circuits Assembly - September 2008 - Focus on Business (Page best2) Circuits Assembly - September 2008 - Global Sourcing (Page 25) Circuits Assembly - September 2008 - On the Forefront (Page 26) Circuits Assembly - September 2008 - On the Forefront (Page 27) Circuits Assembly - September 2008 - On the Forefront (Page 28) Circuits Assembly - September 2008 - On the Forefront (Page 29) Circuits Assembly - September 2008 - Screen Printing (Page 30) Circuits Assembly - September 2008 - Screen Printing (Page 31) Circuits Assembly - September 2008 - Better Manufacturing (Page 32) Circuits Assembly - September 2008 - Better Manufacturing (Page 33) Circuits Assembly - September 2008 - Reflow Soldering with a SnCu Eutectic Pb-Free Alloy (Page 34) Circuits Assembly - September 2008 - Reflow Soldering with a SnCu Eutectic Pb-Free Alloy (Page 35) Circuits Assembly - September 2008 - Reflow Soldering with a SnCu Eutectic Pb-Free Alloy (Page 36) Circuits Assembly - September 2008 - Reflow Soldering with a SnCu Eutectic Pb-Free Alloy (Page 37) Circuits Assembly - September 2008 - Improving OEE in High Mix Facilities (Page 38) Circuits Assembly - September 2008 - Improving OEE in High Mix Facilities (Page 39) Circuits Assembly - September 2008 - Improving OEE in High Mix Facilities (Page 40) Circuits Assembly - September 2008 - Improving OEE in High Mix Facilities (Page 41) Circuits Assembly - September 2008 - Effectively Managing RF Design in Utility Metering Applications (Page 42) Circuits Assembly - September 2008 - Effectively Managing RF Design in Utility Metering Applications (Page 43) Circuits Assembly - September 2008 - Effectively Managing RF Design in Utility Metering Applications (Page 44) Circuits Assembly - September 2008 - Effectively Managing RF Design in Utility Metering Applications (Page 45) Circuits Assembly - September 2008 - Solder Joint Reliability of Different BGAs Reworked Using Low Melting Point Pb-Free Alloys (Page 46) Circuits Assembly - September 2008 - Solder Joint Reliability of Different BGAs Reworked Using Low Melting Point Pb-Free Alloys (Page 47) Circuits Assembly - September 2008 - Solder Joint Reliability of Different BGAs Reworked Using Low Melting Point Pb-Free Alloys (Page 48) Circuits Assembly - September 2008 - Tech Tips (Page 49) Circuits Assembly - September 2008 - Tech Tips (Page 50) Circuits Assembly - September 2008 - Wave Soldering (Page 51) Circuits Assembly - September 2008 - Pb-Free Lessons Learned (Page 52) Circuits Assembly - September 2008 - Pb-Free Lessons Learned (Page 53) Circuits Assembly - September 2008 - Materials World (Page 54) Circuits Assembly - September 2008 - Process Doctor (Page 55) Circuits Assembly - September 2008 - Equipment Advances (Page 56) Circuits Assembly - September 2008 - Product Spotlight (Page 57) Circuits Assembly - September 2008 - Product Spotlight (Page 58) Circuits Assembly - September 2008 - Product Spotlight (Page 59) Circuits Assembly - September 2008 - Product Spotlight (Page 60) Circuits Assembly - September 2008 - Ad Index (Page 61) Circuits Assembly - September 2008 - Assembly Insider (Page 62) Circuits Assembly - September 2008 - Assembly Insider (Page 63) Circuits Assembly - September 2008 - Technical Abstracts (Page 64) Circuits Assembly - September 2008 - Technical Abstracts (Page Cover3) Circuits Assembly - September 2008 - Technical Abstracts (Page Cover4)
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